Monoatomic cluster ion gun

X-ray photoelectron spectroscopy (XPS) C1 core-level signals were analyzed to identify the proportion of carbon bonds in the samples. XPS measurements were performed on an X-ray photoelectron spectrometer with a focused, monochromatic K-alpha X-ray source and a monoatomic/cluster ion gun (Thermo Scientific). The spectra were Gaussian fitted and the proportion of each bond was determined from the peak area ratios.

Fourier transform infrared (FTIR) spectra were recorded in transmittance mode to verify the modifications using a Bruker Tensor 27 spectrometer in the range of 4000–600 cm⁻¹, with a resolution of 4 cm⁻¹. X-ray photoelectron spectroscopy (XPS) measurements of different modified PTFE samples were performed on an X-ray photoelectron spectrometer with a focused, monochromatic K-alpha X-ray source and a monoatomic/cluster ion gun (Thermo Scientific). The C1s core-level signal spectra were Gaussian fitted and the proportion of each bond was determined from the peak area ratios. Scanning electron microscopy (SEM) was used to characterize the morphological properties. Samples were first coated with a thin layer of gold and then imaged using a fully digital LEO GEMINI 1530 SEM (Zeiss, Germany) at a voltage of 3 kV. The surface topography of different modified PTFE samples was analyzed using a Bruker BioScope Catalyst atomic force microscope (AFM) in tapping mold. The wettability of the modified PTFE samples was measured by a video contact angle instrument (Dataphysics, OCA 15) using 7 μL of DI water droplets with the sessile drop method.