Deltavision omx v3
The DeltaVision OMX V3 is a high-resolution, 3D imaging system designed for advanced live-cell and fixed-sample imaging. It employs structured illumination microscopy (SIM) to achieve super-resolution imaging with up to 3.5x improved resolution over traditional widefield microscopy.
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8 protocols using deltavision omx v3
High-Resolution 3D-SIM Imaging of Cells
Structured Illumination Microscopy Imaging
3D Superresolution Imaging with SIM
Immunofluorescence Staining of CRC Tissues
For evaluating lipid droplet‐mediated Numb degradation, the cells were plated on a culture slide (BD Biosciences). After being fixed in 4% PFA and permeabilized in 0.5% Triton X‐100/PBS, the cells were blocked in 5% normal goat serum for 1 h at room temperature and incubated with primary antibodies overnight at 4 °C. The cells were then stained with 488‐labeled secondary antibody (Life Technologies) for 1 h at room temperature. For lipids or lipid droplets staining, the cells were incubated with Nile red (1 µ
3D Structured Illumination Microscopy of Caenorhabditis elegans
3D-SIM Imaging of Caenorhabditis elegans
Visualizing IniA Localization in M. smegmatis
Multimodal Microscopy Imaging Protocol
Super-resolution microscopy images were acquired using a 3D structured illumination microscope (DeltaVision OMX V3, GE Healthcare) and a 2C STED 775 QUAD Scan microscope (Abberior Instruments). 3D-SIM was performed with a × 100 NA 1.4 objective lens with a pixel size of 39 nm and a z-spacing of 125 nm (ref. 18 (link)). STED was performed with a × 100 NA 1.4 Olympus UPlanSApo objective lens with a pixel size of 20 nm and excitation lasers of 488, 594 or 640 nm, and a 775 nm depletion laser.
High-content imaging was performed using the Operetta system (Perkin Elmer). Samples were imaged using a × 20 NA 0.45 air objective with three planes of 1 μm spacing, using the following filters: DAPI: excitation wavelength (ex): 360–400 nm, emission wavelength (em): 420–480 nm; Alexa488: ex: 460–490 nm, em: 500–550 nm; Alexa594: ex: 560–580 nm, em: 590–640 nm.
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