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D8 advance

Manufactured by Renishaw
Sourced in Germany

The D8 Advance is a versatile X-ray diffractometer designed for a wide range of applications in materials science and solid-state research. It is capable of performing high-resolution X-ray diffraction analyses on a variety of sample types, including powders, thin films, and single crystals. The core function of the D8 Advance is to provide accurate and reliable data on the atomic-scale structures of materials.

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5 protocols using d8 advance

1

Comprehensive Characterization of N/S-GA-2

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The morphologies of the N/S-GA-2 were analyzed using transmission electron microscopy (TEM, JEOL JEM-2100) and field-emission scanning electron microscopy (FESEM, Zeiss Supra 40). The structures were characterized by X-ray diffraction (XRD, Bruker D8 Advance) and Renishaw Raman spectrometer. And X-ray photoelectron spectroscopy (XPS, ESCALab220i-XL) spectra were recorded to analyze the chemical composition of the materials. N2 adsorption/desorption isotherms were measured on a Micromeritics ASAP 2020. The Brunauer–Emmett–Teller (BET) method was used to obtain the specific surface area. The pore size distribution was obtained using the Barrett–Joyner–Halenda (BJH) model.
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2

Comprehensive Characterization of Carbonized Materials

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The raw material and as-prepared samples were subjected to various forms of characterization. The distribution of the major elements in the raw material and carbonized product was determined by elemental analysis (VARIO ELIII, Germany) and X-ray photoelectron spectroscopy (XPS, SCALAB 250Xi, Thermo Fisher Scientific, America). Thermogravimetric analysis of the impregnated sample was carried out with a Netzsch STA 409PC thermal analyzer at a heating rate of 5 °C min−1 from room temperature to 1000 °C under N2 atmosphere. The morphology of the synthesized carbon materials was observed using scanning electron microscopy (SEM, Hitachi, S-4800), transmission electron microscopy (TEM, FEI Tecnai G20) operating at 200 kV and high-resolution transmission electron microscopy (HRTEM). X-ray diffraction patterns (XRD, Bruker D8 Advance), Raman spectroscopy (Renishaw Invia-reflex, 532 nm laser) and Fourier transform infrared spectroscopy (FT-IR, IR Affinity) were used to examine the degree of graphitization, crystallinity, and functional groups. The surface area was characterized by nitrogen adsorption at 200 °C with a Quantachrome NOVA1000e apparatus, and the pore size distributions were analyzed via the Barrett–Joyner–Halenda (BJH) method.
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3

Characterization of P-GF Eco-Mimetic Nanoarchitecture

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The P-GF eco-mimetic nanoarchitecture was imaged by transmission electron microscopy (TEM) and energy-dispersive x-ray spectroscopy (EDX). The cross section was characterized by atomic force microscopy (AFM) (Bruker, Dimension FastScan). XRD and Raman spectra were recorded by x-ray powder diffractometer (Brucker, D8 Advance) and Raman spectrometer (Renishaw, inVia, 514 nm), respectively. The electrochemical performance was investigated by CHI1660E electrochemical workstation. The complex permittivity and complex permeability (2–18 GHz) were measured by vector network analyzer (Anritsu, 37269D). The RL was calculated based on the measured electromagnetic parameters (Eqs. 1 and 2): Zin=Z0μrεrtanhj2πfdcεrμr RLdB=20lgZin-Z0Zin+Z0 where c is the light velocity, f is the frequency of electromagnetic wave, and d is the thickness of absorber.
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4

Structural Characterization of Co3O4/AG Nanocomposite

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The X-ray diffraction (XRD, Bruker, Karlsruhe, Germany) patterns of Co3O4, AG, and the Co3O4/AG nanocomposite were recorded by a D8 Advance instrument (Cu Kα radiation, λ = 0.15418 nm) at the range of 10–80°, and the Raman spectra were acquired on an inVia Raman spectroscope (Renishaw, London, UK, Ar ion laser, λ = 514 nm) from 2400 to 200 cm−1. A Quanta FEG 250 scanning electron microscopy (SEM, FEI, Hillsboro, Oregon, USA) and one JEM-2100 transmission electron microscope (TEM, JEOL, Tokyo, Japan) were employed to observe the morphological structure. The N2 adsorption measurement was conducted on an Autosorb-iQ-MP instrument (Quantachrome, Norcross, GA, USA) at −196 °C. Meanwhile, the Brunauer–Emmett–Teller (BET) model was applied to evaluate the specific surface area of AG and the Co3O4/AG nanocomposite. The X-ray photoelectron spectroscopy (XPS, Thermo Fisher Scientific, Waltham, MA, USA) analyses were measured by an Escalab 250Xi instrument (Al Kα radiation, 1486.6 eV) to confirm the chemical composition of samples. Lastly, the thermogravimetric (TG, Netzsch, Bavaria, Germany) analysis of the nanocomposite was studied on a STA409 PC thermogravimetric analyzer under air flow (30–700 °C, 10 °C min−1).
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5

Comprehensive Characterization of In2Se3 Samples

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The phase composition and crystallinity of the prepared samples were determined by powder X‐ray diffraction diffractometer (XRD, Bruker D8 Advance) and a Raman spectroscopy (Renishaw RM2000 confocal) with an excitation line of 514 nm. The morphology and texture of the samples were observed by scanning electron microscopy (SEM, JIOL, JSM‐7001F) and high‐resolution transmission electron microscopy (HRTEM, JIOL, JIM 2010) with an energy dispersive X‐ray (EDX) spectroscopy. The surface elemental composition and bonding state were explored by X‐ray photoelectron spectroscopy (XPS, Thermo ESCALAB 250). The BET (Brunauer‐Emmet‐Teller) specific surface area and pore information were characterized by N2 adsorption/desorption tests at 77 K (Micrometritics ASAP 2020). The content of In2Se3 in the samples was estimated by thermogravimetric (TG) analysis (NETZSCH, STA449F3) in air atmosphere. The electric conductivity of the samples was measured through four‐probe method on a powder resistance meter (ROOKO, FT‐100E).
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