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Model su 8010 sem

Manufactured by Hitachi
Sourced in Japan

The Hitachi Model SU-8010 is a Scanning Electron Microscope (SEM) designed for high-resolution imaging and analysis of a wide range of materials. It features a field emission electron gun, advanced electron optics, and a high-performance detection system to provide detailed topographical and compositional information about sample surfaces.

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3 protocols using model su 8010 sem

1

Biofilm Fixation and SEM Imaging

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After biofilm formation on a sterile slide after 24 h of culturing in TSB, the sample was fixed with 2.5% glutaraldehyde overnight, washed three times in phosphate buffer (0.1 M, pH 7.0) for 15 min prior to postfixing with 1% OsO4 for approximately 1–2 h, and then washed again. Subsequently, the sample was dehydrated using gradient ethanol, dried in a Hitachi Model HCP-2 critical point dryer, coated with gold-palladium, and observed using a Hitachi Model SU-8010 SEM at 30 kV.
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2

Comparative Electron Microscopy of Plant Calli

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To further compare the cytological differences between the calli and different structures, transmission and scanning electron microscopy were performed. The calli of different structures were selected and divided into sections of 3 mm × 3 mm. The samples were fixed with 2.5% glutaraldehyde for longer than 4 h in PBS (0.1 M, pH 7.0), washed with the same buffer, post-fixed with 1% OsO4 in phosphate buffer (0.1 M, pH 7.0) for 1–2 h, dehydrated for 15–20 min for each step in a graded series of ethanol (30, 50, 70, 80, 90, 95, and 100%), and transferred to a 1:1 mixture of alcohol and iso-amyl acetate for 0.5 h, before being transferred to pure iso-amyl acetate for 1 h. The samples were also dehydrated in an HCP-2 critical point dryer (HCP-2, Hitachi, Japan) with liquid carbon dioxide (CO2). Further, gold–palladium was utilized to coat the dehydrated samples in an E-1010 Ion Sputter (E-1010, Hitachi, Japan) for 4–5 min, which we observed using a Model SU-8010 SEM (SU-8010, Hitachi, Japan).
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3

Fungal Morphology Analysis by SEM

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Fungal morphology was assayed with SEM following the method of Oliveira, et al. [36] (link). The mycelia were harvested, washed, resuspended, and then treat by US + SAEW at different conditions mentioned above for 10 min as described in section 2.8. Then, the treated mycelia were fixed with 2.5% glutaraldehyde, washed three times (10 min each time) with 0.1 M phosphate buffer, post-fixed in 1% osmium tetroxide at 4 °C for 2 h, rinsed again with distilled water for three times with 3 min each, and then dehydrated with graded ethanol (30, 50, 60, 70, 80, 90, 95 and 100%) series using Critical point dryer (Leica CPD 030, Germany). The dehydrated mycelia were coated with gold–palladium, and observed with a Hitachi Model SU8010 SEM (Japan).
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