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Quanta 450 field

Manufactured by Thermo Fisher Scientific
Sourced in United States

The Quanta 450 field is a scanning electron microscope (SEM) designed for high-resolution imaging and analysis of a wide range of materials. It features a field emission electron source, providing high-brightness and high-resolution imaging capabilities. The instrument is equipped with advanced detectors and analytical tools to enable comprehensive sample characterization.

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3 protocols using quanta 450 field

1

Structural and Mechanical Characterization of Scaffolds

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Wide-angle X-ray diffraction (XRD) patterns were recorded with a Bruker D8 ADVANCE X-ray powder diffractometer (Bruker Corp., Billerica, MA, USA). Scanning electron microscopy (SEM) was performed with a FEI Quanta 450 field emission scanning electron microscope. The compressive strength of the scaffolds was tested using a static materials testing machine (2.5 kN) (Zwick Roell, Ulm, Germany) at a crosshead speed of 0.5 mm/min. The porosity and density of the scaffolds was measured using Archimedes’ principle and water was used as liquid medium. The porosity (P) was calculated according to the following formulation: P = (Wsat − Wdry)/(Wsat − Wsus) × 100%, and the density was counted according to the formula: ρ = Wdry × (ρwater − ρair)/(Wdry − Wsat) + ρair, where Wdry is the dry weight of the scaffolds, Wsus is the weight of the scaffolds suspended in water, Wsat is the weight of the scaffolds saturated with water, ρwater is the density of water (1.0 g/cm3), and ρair is the density of air (0.0012 g/cm3).
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2

Characterization of Cef-Loaded Mesoporous Silica Nanofibers

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The structure of Cef*DSH-MSNs, DSH-MSNs, Cef, Cef*DSH-MSNs/PCL, Cef*PCL, and PCL were evaluated with an FT-IR spectrometer (IR prestige-21, Shimadzu Co., Japan) in the spectral range of 400-4000 cm-1 using a potassium bromide disk (resolution of 4 cm-1). Next, 5-6 mg of samples were mixed, triturated with 100 mg potassium bromide, and placed in a sample holder for the potassium bromide disk. The surface morphologies of the DSH-MSNs and nanofibers were observed by SEM (FEI Quanta 450 Field Emission Scanning Electron Microscope, USA). The particle size of DSH-MSNs was characterized by a Transmission Electron Microscope Test Instrument (Carl Zeiss-EM10C-100 kV, Germany).
The particle size distribution of DSH-MSNs dispersed in water was determined by DLS (Brookhaven, USA). A Zeta sizer Nano apparatus (Brookhaven, USA) was applied to measure the surface charge of the DSH-MSNs and Cef.
The water contact angle (WCA) of nanofibers was measured by a WCA analyzer (Veho discovery VMS-004 Deluxe, England). Moreover, water droplets (1 μL) were pipetted onto the surface of PCL nanofibers before and after loading of DSH-MSNs.
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3

Comprehensive Characterization of Nanomaterials

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Transmission electron microscopy (TEM) imaging was performed using a Tecnai T12 microscope (FEI Company, Hillsboro, OR, USA). Scanning electron microscopy (SEM) was carried out using an FEI Quanta 450 field emission scanning electron microscope. The X-ray diffraction (XRD) pattern was characterized on a D8 Advance powder X-ray diffractometer (Bruker, Karlsruhe, Germany). N2 sorption isotherms was measured on a Micromeritics ASAP 2020 M apparatus (Micromeritics Instrument Corp., Norcross, GA, USA). Brunauer–Emmett–Teller and Barrett–Joyner–Halenda methods were used to determine the surface area, pore size distribution, and the pore volume. UV-vis spectra was taken using a Genesys 10S UV-vis spectrophotometer (Thermo Fisher Scientific Inc., Madison, WI, USA). The zeta potential and dynamic light scattering (DLS) were measured on a Malvern Zetasizer Nano-ZS90 (Malvern, UK). The photothermal conversion efficiency was analyzed using a laser device (Shanghai Xilong Optoelectronics Technology Co. Ltd., Shanghai, People’s Republic of China) with a wavelength of 808 nm, and the temperature of the solution was tracked using a DT-8891E thermocouple linked to a digital thermometer (Shenzhen Everbest Machinery Industry, Shenzhen, People’s Republic of China).
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