Jsm 6500f

Metallographic analyses FE-SEM/EDS were performed using a scanning electron microscope JEOL JSM-6500F (JEOL Ltd., Tokyo, Japan). FE-SEM/EDS analyses of the powder particles were performed at an accelerating voltage of 15 kV.
Optical imaging was performed using a ZEISS Axio Imager Z2M (Carl Zeiss AG, Oberkochen, Germany) optical microscope.
Samples under investigation were randomly selected powder particles and metallographic cross-sections of the DSC-remelted bulk samples of Fe-6.5wt%Si.

UiO68CCG and IR15CCG were synthesized via a previously published process [28 (link)]. Other reagents and solvents were purchased from commercial sources and used without further purification. All experiments were carried out in the ambient atmosphere, unless otherwise mentioned. Powder X-ray diffraction (XRD) patterns were obtained using a Bruker AXS D8 ADVANCE (Bruker Corporation, Billerica, MA, USA). Field emission scanning electron microscope (FE-SEM) observations and energy dispersive X-ray spectrometry (EDX) analyses were carried out via a JEOL JSM-6500F (JEOL Ltd., Akishima, Japan). Transmission electron microscope (TEM) observations and selected area electron diffraction (SAED) analyses were carried out on a JEOL JEM-2010 (JEOL Ltd., Akishima, Japan). Fourier transform infrared (FT-IR) spectra were recorded on a JASCO FT/IR-4100 spectrometer (JASCO Corporation, Hachioji, Japan). Inductively coupled plasma atomic emission spectroscopy (ICP-AES) was carried out by a Shimadzu ICPE-9000 instrument (Shimadzu Corporation, Kyoto, Japan).

The morphology of the as-received starting powders, PMMA particles, the elemental powder mixture and the final powder mixture was observed using scanning electron microscope (SEM, Jeol JSM6500F, JEOL Ltd., Tokyo, Japan). For the microscopic examination of the sintered porous Al, the cross-section of the specimen was prepared. The microstructure and pore morphology of the specimen cross-section were then viewed by SEM.

The chemical compositions were characterized by X-ray photoelectron spectroscopy (XPS) (ESCALAB 250). The crystal structure of phases of each sample was determined by using the X-ray diffraction instrument (XRD) (XRD-7000S Shimadzu). The field-emission scanning electron microscopy (FE-SEM, JSM 6500F, JEOL) and transmitted electron microscopy (TEM) (FEG TEM technai G2 F30) instruments were used for morphology characterizations. The Shimadzu 3600 Plus UV-vis spectrophotometer was used to check absorption properties of the catalysts and the concentration of the pollutant.