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Jsm 6010la scanning electron microscope

Manufactured by JEOL
Sourced in United States

The JSM 6010LA is a scanning electron microscope (SEM) manufactured by JEOL. It is designed to provide high-resolution images of a wide range of samples. The JSM 6010LA uses an electron beam to scan the surface of a sample, and the resulting signals are converted into an image that can be displayed on a computer monitor.

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2 protocols using jsm 6010la scanning electron microscope

1

Scanning Electron Microscopy of HepG2 Cells

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HepG2 cells were cultured on poly-D-lysine-coated glass coverslips and treated as described previously. At the end of treatment, cells were washed in Sorensen’s phosphate buffer (pH 7.4) and fixed in 3.0% Sorensen’s phosphate buffered (pH 7.4) glutaraldehyde for one hour at room temperature. Cells were again washed with Sorensen’s phosphate buffer and dehydrated in a series of 30%, 60%, 90%, 100% acetone. After dehydration, cover slips were dried using the critical point method with the Electron Microscopy Sciences EMS850 Critical Point Drier and subsequently sputter coated with platinum-palladium using the Cressington 108 auto Sputter Coater. Samples were observed using a JEOL JSM 6010LA Scanning Electron Microscope (JEOL USA, Inc., Peabody, USA) at 15 kV.
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2

Substrate Surface Morphology Characterization

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SEM was used to characterize the changes in surface morphology of treated and untreated substrate (wheat straw). Samples were prepared by drying the treated and untreated substrate in hot air oven at 50°C until constant weight 15 (link) . After drying the samples, scanning electron micrographs were taken on Jeol JSM-6010LA Scanning Electron Microscope.
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