Jsm 6010la scanning electron microscope
The JSM 6010LA is a scanning electron microscope (SEM) manufactured by JEOL. It is designed to provide high-resolution images of a wide range of samples. The JSM 6010LA uses an electron beam to scan the surface of a sample, and the resulting signals are converted into an image that can be displayed on a computer monitor.
Lab products found in correlation
2 protocols using jsm 6010la scanning electron microscope
Scanning Electron Microscopy of HepG2 Cells
Substrate Surface Morphology Characterization
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