The Bruker diffractometer (USA) was used to do XRD using Cu Ka radiation at 40 kV and 130 mA at Coupled 2θ/Theta scanning angle and a speed of 0.5°/minute.
Diffractometer
Manufactured by Bruker
Sourced in Germany
The Bruker Diffractometer is an analytical instrument used for the determination of the crystalline structure and chemical composition of solid materials. It operates by directing a beam of X-rays at a sample and measuring the diffraction patterns produced, which are then analyzed to provide information about the sample's atomic and molecular structure.
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Lab products found in correlation
S 4800, by Hitachi (3 mentions)
Tristar 2 3020, by Micrometrics (2 mentions)
Jem 2100f, by JEOL (2 mentions)
Jem 2100 plus, by JEOL (2 mentions)
Ifs 66v s spectrometer, by Bruker (2 mentions)
Differential scanning calorimeter, by PerkinElmer (1 mentions)
Vibrating sample magnetometer, by Lake Shore Cryotronics (1 mentions)
Zetasizer nano, by Malvern Panalytical (1 mentions)
Themis z microscope, by Thermo Fisher Scientific (1 mentions)
Lambda 365 spectrophotometer, by PerkinElmer (1 mentions)
Jem 2100f microscope, by JEOL (1 mentions)
Asap 2020, by Micromeritics (1 mentions)
Ftir 8400 spectrometer, by Shimadzu (1 mentions)
X pert highscore software, by Malvern Panalytical (1 mentions)
Sigma 300 microscope, by Zeiss (1 mentions)
Nicolet 370, by Thermo Fisher Scientific (1 mentions)
Fls920p, by Edinburgh Instruments (1 mentions)
Spectrometer, by PerkinElmer (1 mentions)
Jem 2100 microscope, by JEOL (1 mentions)
Uv 1800 spectrophotometer, by Shimadzu (1 mentions)
28 protocols using diffractometer
1
XRD Characterization with Bruker Diffractometer
2
Characterization of Coated TiO2 Films
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The crystallinity of the coated TiO2 was characterized by X-ray diffraction using a Bruker diffractometer using CuKα radiation (λ = 0.154056 nm) over the range 20 < 2θ < 60°, with a secondary graphite monochromator. The surface topology of TiO2 film was determined by atomic force microscopy (AFM) (Nanoscope®III, Digital instrument), operating in the contact mode with a scan size of 1.00 µm for a 1 × 1 cm glass slide.
3
Single Crystal Structure Determination
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Single crystals were picked up from mother solutions and mounted on the goniometer head. The temperature of the crystals during measurement was 293 K (compound 1 ) and 100 K (compound 2 ). X-ray data were collected on a κ-CCD Bruker–Nonius diffractometer. The multi-scan procedure was performed by diffractometer software for absorption correction. The SHELXS and SHELXL-97 programs [11 ] were used to solve and refine the structures. All non-hydrogen atoms were refined anisotropically and hydrogen atoms were located from difference Fourier maps. The figures were drawn using the DIAMOND package [12 ].
CCDC 780058 and 780060 contain the supplementary crystallographic data for1 and 2 . These data can be obtained free of charge via http://www.ccdc.cam.ac.uk/conts/retrieving.html (or from the Cambridge Crystallographic Data Centre, 12 Union Road, Cambridge CB2 1EZ, UK; fax: +44 1223 336033) email: deposit@ccdc.cam.ac.uk].
CCDC 780058 and 780060 contain the supplementary crystallographic data for
4
Chitosan X-ray Diffraction Analysis
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X-ray diffraction data were collected on a Bruker diffractometer with 2θ and a scan angle from 5 to 50. Chitosan was prepared by compressing it in the cassette sample holder without any adhesive substances.
5
Synthesis and Structural Analysis of A10 Crystal
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A colorless single crystal of A10 suitable for X-ray analysis was cultured from a mixture of N-hexane and ethyl acetate at room temperature. Single-crystal X-ray diffraction data were obtained on a Bruker Corporation diffractometer at 273.15 K using graphite monochromatic Cu Kα radiation (λ = 1.54178 Å). The structure was solved with the SHELXT structure solution program with intrinsic phasing and refined with the SHELXL refinement package by least squares minimization.
6
Amorphous Nd-Fe-B Alloy Synthesis
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Example 1
Iron rich Nd—Fe—B alloys with nominal Nd contents (between 8.2 at. % and 5.9 at. %) were melt-spun to a partially amorphous state in the form of flakes. The flakes were ball milled to a fine powder form using a SPEX high energy ball mill (“HEBM”), resulting in an amorphization of Nd and B, leaving only a portion of the α-Fe in a crystalline state. A ball-to-powder weight ratio (“BPR”) of 5 was employed for the milling studies. Crystallization temperatures were determined by a Differential Scanning Calorimeter (“DSC”) (Perkin Elmer, Inc., Waltham, Mass.). High pressure crystallization studies were carried out using an inductively heated hot press under pressures as high as 1 GPa. Thermomagnetic, M(T), measurements were carried out using a Vibrating Sample Magnetometer (“VSM”) (Lake Shore Cryotronics, Inc., Westerville, Ohio) equipped with a high temperature furnace. A diffractometer (Bruker Corp., Billerica, Mass.) was used for structural characterizations. The compacted samples were examined in a CM200 Transmission Electron Microscope (“TEM”) (Koninklijke Philips N.V., Amsterdam).
7
Comprehensive Materials Characterization Protocol
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The powder XRD patterns were obtained using a Bruker diffractometer at 40 kV, 40 mA, with Cu Kα1 radiation. The morphology of all the products was revealed using field emission scanning electron microscopy (FESEM, Hitachi S-4800). Transmission electron microscopy (TEM) was performed on a JEOL JEM-2100F with an acceleration voltage of 200 kV. The The N2 adsorption-desorption isotherms were measured at 77 K using a Micrometrics Tri Star II 3020 apparatus. Thermogravimetric (TG) analysis was performed using a simultaneous thermal analysis instrument (Setaram Labsys Evo S60/58458) at a temperature ramping rate of 5 °C min−1 in air. The surface electronic states of Mn were analyzed by X-ray photoelectron spectroscopy (XPS, VG Multilab 2000).
8
Nanomaterial Characterization by SEM, TEM, XRD, UV-Vis, DLS
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Scanning electron microscopy (SEM) images and EDX analyses were performed on a FEI Themis Z microscope operated at 5 kV and 10 kV, respectively. Transmission electron microscopy (TEM) and HRTEM analyses were performed on a FEI Themis Z microscope operated at 200 kV. X-ray diffraction (XRD) were recorded with a Bruker diffractometer in the 25–80° 2θ range using Cu Kα radiation. The ultraviolet-visible (UV-Vis) absorbance spectra were measured on a PerkinElmer LAMBDA 365 spectrophotometer. Dynamic light scattering (DLS) was performed on a Malvern Zetasizer Nano.
9
Comprehensive Physicochemical Characterization of Materials
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Powder X-ray diffraction (XRD) patterns were recorded on a Bruker diffractometer with Cu Kα radiation (λ = 1.54056 Å) at 40 kV/mA. The morphology and particle size of the samples were observed by field-emission scanning electron microscope (SEM, Hitachi S-4800) at an acceleration voltage of 5 kV. Energy-dispersive X-ray spectroscopy (EDX) was performed using an EDAX Genesis instrument attached to SEM with an acceleration voltage of 30 kV. Transmission electron microscopy (TEM) and high-resolution TEM (HRTEM) were performed on a JEOL JEM-2100F microscope with an acceleration voltage of 200 kV. Nitrogen adsorption/desorption isotherms were acquired using a Micrometrics, TriStar II 3020 system operated at 77 K. Prior to the adsorption experiments, the samples were degassed at 100 °C for 12 h. Thermogravimetric analysis (TGA) and differential scanning calorimetry (DSC) curves of the as-fabricated materials were performed using a Labsys EvoS60/58458 thermal analysis instrument at a temperature ramping rate of 5 °C min-1 in air.
10
Comprehensive Characterization of Carbon-based Material
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The CP was characterized by textural analysis through N2 physisorption at 77 K, using Micromeritics, model: ASAP 2020. X-ray diffraction was performed on a Bruker diffractometer, with CuKa radiation, 40 kV, 30 mA; a step size of 0.01° 2θ; and a scanning speed of 2.0° 2θ/min, in the range 5–65°. Infrared spectroscopy (FTIR) analysis was performed in a Bruker–Vertex 70 spectrophotometer in the range of 4000 to 400 cm−1 with 100 scans and 4 cm−1 resolution with KBr as reference. CP morphology was observed using a Shimadzu SS-550, Superscan, Superscan SS-550 software scanning electron microscope. The pHpzc was determined by the potentiometric method in which 0.20 g of material is added in solutions with pH ranging from 2 to 12 and kept under stirring for 24 h at 25 °C. After 24 h, the samples were filtered and their final pH was analyzed with a pHmeter. The initial versus final pH is plotted and pHpzc corresponds to the range in which the final pH remains constant.
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