Geminisem 560

The electrochemical techniques such as differential pulse voltammetry (DPV), cyclic voltammetry (CV) and chronoamperometry (CA) were conducted using a Metrohm-Autolab potentiostat/galvanostat system (PGSTAT128N, Metrohm, Herisau, Sweden). Electrochemical impedance spectroscopy was performed under a 0.1 Hz to 100 kHz frequency using an IVIUM Compactstat (Eindhoven, The Netherlands) device. The employed screen-printed electrode had a Ag/AgCl paste and Pt electrodes on their own surface, as a reference and a counter electrode, respectively. UV–Vis was recorded using a double beam spectrophotometer (Shimadzu, Kyoto, Japan) model UV-1800 and quartz cells (Hellma, Müllheim, Germany). SEM and EDX were observed micrographs of the materials by ZEISS GeminiSEM 560 at 3.00 kV. The X-ray diffraction pattern was recorded using a Rigaku smart laboratory diffractometer (operated at 40 kV and 20 mA) with a Cu Kα source at a wavelength of 1.540 Å. TEM images were performed using an FEI Tecnai G2 Spirit microscope (Thermo Fisher Scientific, Waltham, MA, USA) at 120 kV. All electrochemical measurements were performed at 27.5 °C unless otherwise specified.

VRC HPβCD-based polymeric nanobeads’ surface morphology was studied using a scanning electron microscope (GeminiSEM 560, ZEISS, Jena, Germany). The samples were placed on an aluminum pan coated with gold.

All of the samples were
prepared for TEM and SEM analyses by drying a drop of the diluted
particle suspension on 200 mesh ultrathin carbon-coated TEM copper
grids. The shape and size of the bare and silica-coated samples were
analyzed by conventional TEM in bright-field mode. All of the images
were acquired using a JEOL JEM-1400Plus microscope operating at 120
kV. The size distribution of the nanoparticles was evaluated through
the measurement of at least 200 nanocrystals. Coalescence and surface
morphology of the silica-coated nanoparticles after multiple injections
were studied through scanning electron microscopy using a Zeiss Gemini
SEM 560, operating at 1 kV and equipped with a field-emission gun
and an In-Lens detector for secondary electron detection.