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Jpk nanowizard 1

Manufactured by Bruker
Sourced in Germany

The JPK Nanowizard-1 is an atomic force microscope (AFM) designed for high-resolution imaging and nanoscale analysis. It offers precise control and measurement capabilities for studying surface topography and properties at the nanoscale. The core function of the JPK Nanowizard-1 is to provide researchers and scientists with a versatile tool for advanced surface characterization and exploration at the nanometer scale.

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6 protocols using jpk nanowizard 1

1

Nanomechanical Characterization of Tissue Slices and Scaffolds

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Measurements of the tissue slices and scaffold cubes have been conducted on a JPK Nanowizard-1 (JPK Instruments) operating in force spectroscopy mode, mounted on an inverted optical microscope (IX-81, Olympus). AFM pyramidal cantilevers (MLCT, Bruker) with a spring constant of 0.07 N/m were used with a 35 μm glass bead attached to cantilever tip. Prior to measurements with the adapted cantilevers, their sensitivity was calculated by measuring the slope of the force-distance curve in the AFM software on an empty region of the petri dish. For indentation tests on the sample, the cantilever was aligned over regions in the middle of the samples using the optical microscope. For each sample 30–50 force curves were acquired in 6–10 different 100 μm regions, this arrangement allowed force-curves to be acquired in locations at least 50–100 μm apart. Force-curve acquisition was carried out with an approach speed of 5 μm/s and a maximum set force of 1.5 nN. Elastic moduli were calculated from the force-distance curves by fitting the contact region of the approach curve with the Hertz contact model, using the AFM software.
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2

Nanomechanical Measurements of Unmineralized Samples

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Unmineralized samples were attached to a petri dish using a drop of cyanoacrylate adhesive, and left for a minute for the adhesive to dry. Samples were then immersed in distilled water. Young’s modulus measurements were taken with a JPK Nanowizard-1 (JPK Instruments, Germany) in force spectroscopy mode, mounted on an inverted optical microscope (IX-81; Olympus, Japan). Quadratic pyramidal cantilevers (MLCT; Bruker, MA, USA) with a spring constant of 0.07 N/m and half-angle to face of 17.5° were used for indentation. The sensitivity of cantilevers was determined before measurements by measuring the slope of the force-distance curve in the atomic force microscopy (AFM) software on an empty region of a petri dish. Indentation was carried out with an approach speed of 5 µm/s and a maximum set force of 1 nN. Measurements were taken multiple times per region and in multiple regions per sample. The Young’s modulus was calculated by fitting the contact region of the approach curve with the Hertz Contact model66 (link) using the JPK software, using the above constants and calibrated cantilever sensitivity. Graphs were plotted with GraphPad Prism software, using a P-value of 0.05.
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3

AFM Indentation of Mammalian Cells

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AFM indentation was conducted on a JPK NanoWizard-1 (JPK Instruments) operating in force spectroscopy mode, mounted on an inverted optical microscope (IX-81; Olympus). AFM pyramidal cantilevers (MLCT; Bruker) with a spring constant of 0.07 N/m were used with a 35 μm glass bead attached to the cantilever tip. Before measurements with the adapted cantilevers, their sensitivity was calculated by measuring the slope of the force–distance curve in the AFM software on an empty region of the Petri dish. For cell indentation tests, the cantilever was aligned over regions in the middle of the cells using an IX-81 inverted optical microscope. For each group, 30 individual cells were tested. Force–curve acquisition was performed with an approach speed of 5 μm/s and a maximum set force of 1.5 nN. Elastic moduli were calculated from the force–distance curves by fitting the contact region of the approach curve with the Hertz contact model using the AFM software (JPK Instruments).
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4

Quantifying Cell Compliance via AFM

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Cells were seeded and treated on fluorodishes. Cell compliance measurements were conducted on a JPK Nanowizard-1 (JPK Instruments, Berlin, Germany) operating in force spectroscopy mode, mounted on an inverted optical microscope (IX-81; Olympus, Shinjuku-ku, Japan). AFM pyramidal cantilevers (MLC-2T; Bruker, Billerica, MA, USA) with a spring constant of 0.03 N/m were used with a 15 μm diameter glass bead attached to cantilever tip. Prior to measurements with the adapted cantilevers, their sensitivity was calculated by measuring the slope of force-distance curve in the AFM software on an empty region of the petri dish. For indentation tests, the cantilever was aligned over the cell away from the nucleus, and for each dish, 30 force curves were acquired across 30 cells. Force-curve acquisition was carried out with an approach speed of 5 μm/s and a maximum set force of 1 nN. Elastic moduli were calculated from the force-distance curves by fitting the contact region of the approach curve with the Hertz contact model [70 (link)] using the AFM software (JPK).
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5

AFM Measurement of Cell Elasticity on Polyacrylamide

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For AFM study, cell seeded
polyacrylamide gels on coverslips were lifted from 24-well plates
prior to measurement and immediately attached to a Petri dish with
a droplet of cyanoacrylate adhesive, applied with a 10 μL pipet
tip. After coverslip attachment (∼1 min), 100 μL of culture
medium (DMEM 10% FBS) was applied to the coverslip in order for the
AFM measurements of cells to be conducted as soon as possible (<1
h). Measurements of HSCs on polyacrylamide gels were conducted on
a JPK Nanowizard-1 (JPK instruments) AFM operating in force spectroscopy
mode, mounted upon an inverted optical microscope (IX-81, Olympus).
AFM pyramidal cantilevers (MLCT, Bruker) with a spring constant of
0.03 N/m were used. Before conducting measurements, cantilever sensitivity
was calculated by measuring the force–distance slope in the
AFM software on an empty Petri dish region. For cell indentation measurements
the cantilever was aligned over a central region of a cell using a
20× objective and the optical microscope. For each cell 3–5
force curves were acquired at an approach speed of 2 μm/s and
a maximum set point of 0.1 V to ensure that the cantilever only probed
the cell membrane. The force–distance curves were used to calculate
elastic moduli in the AFM software through the application of the
Hertz contact model.93 (link)
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6

Measuring Mechanical Properties of Biological Samples

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Samples were attached to a petri dish using a drop of cyanoacrylate adhesive, and left for a minute for the adhesive to dry. Samples were then immersed in distilled water. Young's Modulus measurements were taken with a JPK Nanowizard-1 (JPK Instruments, Germany) in force spectroscopy mode, mounted on an inverted optical microscope (IX-81; Olympus, Japan). Quadratic pyramidal cantilevers (MLCT; Bruker, MA, USA) with a spring constant of 0.07 N/m and half-angle to face of 17.5°were used for indentation. The sensitivity of cantilevers was determined before measurements by measuring the slope of the force-distance curve in the AFM software on an empty region of a petri dish. Indentation was carried out with an approach speed of 5 mm/s and a maximum set force of 1 nN. Measurements were taken multiple times per region and in multiple regions per sample. The Young's Modulus was calculated by fitting the contact region of the approach curve with the Hertz Contact model [25] using the JPK software, using the above constants and calibrated cantilever sensitivity.
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