SEM (GeminiSEM 500, China) and TEM (JEOL JEM2100, Japan) were used to characterize the samples’ morphology. X-ray diffraction (XRD) patterns were acquired on a PANalytical X’pert MPDPro (The Netherlands) using a Cu Kα radiation source (40 kV, 40 mA). The AXIS ULtrabld (UK) instrument was used to obtain X-ray photoelectron spectroscopy (XPS) using a monochromatic Al Kα radiation source (15 kV, 1486.6 eV). Fourier-transform infrared spectroscopy (Bruker Tensor 37 spectrometer, China) was used to determine surface functional groups and chemical bonds of samples. An HR800 Raman spectrometer (France) was used for Raman scattering, and excitation was carried out with 532 nm laser light. The specific surface area and pore sizes of the samples were detected with N2 adsorption/desorption using an SSA-4300 (China) instrument. Sessile drops were measured using the optical contact angle meter (OCA25HTV, DataPhysics, China), where distilled water drops were placed on solid surfaces using a dispenser.
Tensor 37 spectrometer
Manufactured by Bruker
Sourced in Germany, United States
The Tensor 37 is a Fourier Transform Infrared (FTIR) spectrometer manufactured by Bruker. It is designed to perform high-quality infrared spectroscopy measurements. The Tensor 37 utilizes a Michelson interferometer to generate and analyze infrared light, enabling the identification and quantification of various chemical compounds and materials.
Automatically generated - may contain errors
Lab products found in correlation
Escalab xi spectrometer, by Thermo Fisher Scientific (2 mentions)
X pert pro mpd, by Malvern Panalytical (1 mentions)
Jem 2100, by JEOL (1 mentions)
Oca25htv, by Dataphysics (1 mentions)
Thiourea, by Thermo Fisher Scientific (1 mentions)
Lc msd sl 1100 instrument, by Agilent Technologies (1 mentions)
N bromosuccinimide, by Thermo Fisher Scientific (1 mentions)
Wp 250 sy spectrometer, by Bruker (1 mentions)
2 chloroacetamide, by Thermo Fisher Scientific (1 mentions)
Opus software, by Bruker (1 mentions)
V 570, by Jasco (1 mentions)
Eca 500 2 spectrometer, by JEOL (1 mentions)
Dpx 400 spectrometer, by Bruker (1 mentions)
Ttriii x ray diffractometer, by Rigaku (1 mentions)
Multimode 8 system, by Bruker (1 mentions)
Tem 2010 electron microscope, by JEOL (1 mentions)
Uv 550 spectrophotometer, by Jasco (1 mentions)
Jem 2100f, by JEOL (1 mentions)
Nova 2200e, by Anton Paar (1 mentions)
Axis supra spectrometer, by Shimadzu (1 mentions)
20 protocols using tensor 37 spectrometer
1
Comprehensive Characterization of Material Samples
2
Synthesis of Benzyl Substituted Heterocycles
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All solvents were purified before use. N-bromosuccinimide, thiourea, 2-methylbenzyl chloride, 3-fluorobenzyl chloride, 2-chlorobenzyl chloride, 2,4-dichlorobenzyl chloride, 3,4-dichlorobenzyl chloride, 4-bromobenzyl chloride, 2-chloroacetamide, and ethyl chloroacetate were purchased from Acros Organics and used without purification. Compounds 2 , 3 , 4b , and 4h were prepared using methods described previously [10 ]. The reactions were monitored by thin-layer chromatography (TLC) using Fluka silica gel (60 F 254) plates (0.25 mm). Visualization was made with UV light. The melting points of the synthesized compounds were taken on a melting point tube. Infrared spectra were recorded on a Bruker Tensor 37 spectrometer (Germany). The 1H-NMR spectra were recorded on a Bruker WP 250 SY spectrometer (250.13 MHz) (Germany). Chemical shifts are reported relative to chloroform (δ=7.25 ppm) for 1H-NMR. The mass spectra were recorded on an Agilent LC/MSD SL 1100 instrument (USA).
3
FTIR Analysis of Lyophilized Samples
4
FTIR Analysis of SEBS Composites
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The FTIR spectra of SEBS and SEBS-MA composites were recorded with a Tensor 37 spectrometer from Bruker Optics (Ettlingen, Germany) in the attenuated total reflectance (ATR) mode. The spectra were collected from 400 to 4000 cm−1, with 16 scans and a resolution of 4 cm−1.
5
Structural Characterization of BOA
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Fourier-transform infrared (FTIR) spectra
were recorded on a Bruker Tensor 37 spectrometer (Central Laboratory,
Faculty of Science, Alexandria University) to characterize theBOA structure, and 1HNMR spectra were recorded
on a Jeol-500 MHz, ECA-500 II spectrometer (field strength of 11.74
T, Japan, in DMSO–d6; Faculty of
Science, Mansoura university). Elemental analyses were examined at
the Microanalytical Unit, Faculty of Science, Cairo University. The
degree of brightness of the samples examined was acquired with the
aid of measuring the gloss value by using a Gloss meter, spectrophotometer,
Jasco-V-570 with a UV–vis–NIR range of 200–700
nm.
were recorded on a Bruker Tensor 37 spectrometer (Central Laboratory,
Faculty of Science, Alexandria University) to characterize the
on a Jeol-500 MHz, ECA-500 II spectrometer (field strength of 11.74
T, Japan, in DMSO–d6; Faculty of
Science, Mansoura university). Elemental analyses were examined at
the Microanalytical Unit, Faculty of Science, Cairo University. The
degree of brightness of the samples examined was acquired with the
aid of measuring the gloss value by using a Gloss meter, spectrophotometer,
Jasco-V-570 with a UV–vis–NIR range of 200–700
nm.
6
FTIR Spectral Characterization Procedure
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Fourier-transform infrared spectra (FTIR) were recorded using a Tensor 37 spectrometer (Bruker Optik GmbH, Germany). The parameters were as follows: ambient temperature 21 ± 1.0 °C, frequency range 4000–600 cm−1, and spectral resolution 2 cm−1.
7
Spectroscopy and Microscopy Characterization
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A JASCO UV-550 spectrophotometer was used
for the measurements of UV–vis spectra. 1H NMR spectra
(1H-400 MHz) were recorded on a Bruker DPX 400 spectrometer.
Elemental analyses were carried out with an Elementary Vario El. IR
spectra were recorded using a Bruker Tensor 37 spectrometer. The TEM
measurements were achieved by using a JEOL TEM-2010 electron microscope
(Japan) equipped with a charge-coupled device camera, operated at
200 kV. SEM images were obtained using a JEOL JEM-6510A scanning electron
microscope at 10 kV. The AFM images were recorded from a Bruker Multimode
8 system with a silicon cantilever by using tapping mode. XRD was
measured on a Rigaku TTRIII X-ray diffractometer (Japan) with Cu Kα
radiation (λ = 1.54 Å), which was operated at 45 kV, 100
mA. F-4500 FL spectrophotometer and JASCO J-815 CD spectropolarimeter
were used for fluorescence spectral measurements and CD spectral measurements,
respectively. For photodegradation measurements, a 500 W xenon arc
lamp (CEL-LAX-500 W, Beijing Aulighttech Co. Ltd, China) served as
the light source. In addition, the photodegradation experiment was
performed on a photocatalytic reactor which came from Beijing Aulighttech
Co. Ltd, China.
for the measurements of UV–vis spectra. 1H NMR spectra
(1H-400 MHz) were recorded on a Bruker DPX 400 spectrometer.
Elemental analyses were carried out with an Elementary Vario El. IR
spectra were recorded using a Bruker Tensor 37 spectrometer. The TEM
measurements were achieved by using a JEOL TEM-2010 electron microscope
(Japan) equipped with a charge-coupled device camera, operated at
200 kV. SEM images were obtained using a JEOL JEM-6510A scanning electron
microscope at 10 kV. The AFM images were recorded from a Bruker Multimode
8 system with a silicon cantilever by using tapping mode. XRD was
measured on a Rigaku TTRIII X-ray diffractometer (Japan) with Cu Kα
radiation (λ = 1.54 Å), which was operated at 45 kV, 100
mA. F-4500 FL spectrophotometer and JASCO J-815 CD spectropolarimeter
were used for fluorescence spectral measurements and CD spectral measurements,
respectively. For photodegradation measurements, a 500 W xenon arc
lamp (CEL-LAX-500 W, Beijing Aulighttech Co. Ltd, China) served as
the light source. In addition, the photodegradation experiment was
performed on a photocatalytic reactor which came from Beijing Aulighttech
Co. Ltd, China.
8
Comprehensive Catalyst Characterization
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The
XRD measurements of the developed catalysts were investigated by A
Philips 1700 version diffractometer with Cu Kα radiation. The
morphology and crystallinity of the developed catalyst were examined
by TEM (JEOL, JEM-2100F, Japan), where an accelerating voltage of
200 kV was applied. Also, the element mapping was investigated by
applying energy-dispersive X-ray spectroscopy (EDX). The XPS analysis
was performed using a Kratos Axis Supra spectrometer with a monochromatic
Al Kα radiation (1486.7 eV) at low pressure (<10–6 Pa). The collected spectra were analyzed by CasaXPS software. The
BET method was applied to estimate the surface area and average pore
size of Ag@TiO2 samples using NOVA 2200e (Quantachrome
Instruments). The degasification was performed prior to the measurements
under vacuum at 100 °C for 12 h. Fourier transform infrared (FTIR)
spectra of the developed catalysts were collected using a Bruker Tensor
37 spectrometer, where an ATR accessory was used with 4 cm–1 resolution. NMR spectra were collected using an INOVA-500 MHz instrument
(Varian, Palo Alto, CA, USA), and trimethylsilyl propanoic acid (TSP)
was used as an internal standard.
XRD measurements of the developed catalysts were investigated by A
Philips 1700 version diffractometer with Cu Kα radiation. The
morphology and crystallinity of the developed catalyst were examined
by TEM (JEOL, JEM-2100F, Japan), where an accelerating voltage of
200 kV was applied. Also, the element mapping was investigated by
applying energy-dispersive X-ray spectroscopy (EDX). The XPS analysis
was performed using a Kratos Axis Supra spectrometer with a monochromatic
Al Kα radiation (1486.7 eV) at low pressure (<10–6 Pa). The collected spectra were analyzed by CasaXPS software. The
BET method was applied to estimate the surface area and average pore
size of Ag@TiO2 samples using NOVA 2200e (Quantachrome
Instruments). The degasification was performed prior to the measurements
under vacuum at 100 °C for 12 h. Fourier transform infrared (FTIR)
spectra of the developed catalysts were collected using a Bruker Tensor
37 spectrometer, where an ATR accessory was used with 4 cm–1 resolution. NMR spectra were collected using an INOVA-500 MHz instrument
(Varian, Palo Alto, CA, USA), and trimethylsilyl propanoic acid (TSP)
was used as an internal standard.
9
Characterization of Synthesized Gold Nanowires
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The obtained AuNW have been characterized by using various characterization techniques. UV-Visible analysis was performed using Jasco V-570 spectrometer. The AuNW solution was placed in a quartz cuvette and the optical spectrum was then recorded in the 400 to 800 nm range.
The morphology of the AuNW sample was investigated using a Field Emission scanning electron microscope (FESEM) JEOL-Hitachi S-4800F. The sample was prepared as follows; a drop of AuNW solution was placed on the Si substrate and dried. The substrate was inserted in the vacuum chamber of the FESEM held at ∼10−8 mbar vacuum.
The structural analysis was performed using X-ray diffraction analysis. Rigaku Miniflex X-ray diffractometer equipped with copper target (CuKα1, λ = 1.5406 Å) using nickel filter was used for the analysis. Few drops of AuNW liquid sample were allowed to dry on the glass substrate used for the XRD analysis. The diffraction pattern was recorded from 2θ – 20° to 60° angular range.
FTIR analysis of AuNW liquid sample in the spectral range from 400 to 4000 cm−1 was carried out using a Bruker TENSOR37 spectrometer.
The morphology of the AuNW sample was investigated using a Field Emission scanning electron microscope (FESEM) JEOL-Hitachi S-4800F. The sample was prepared as follows; a drop of AuNW solution was placed on the Si substrate and dried. The substrate was inserted in the vacuum chamber of the FESEM held at ∼10−8 mbar vacuum.
The structural analysis was performed using X-ray diffraction analysis. Rigaku Miniflex X-ray diffractometer equipped with copper target (CuKα1, λ = 1.5406 Å) using nickel filter was used for the analysis. Few drops of AuNW liquid sample were allowed to dry on the glass substrate used for the XRD analysis. The diffraction pattern was recorded from 2θ – 20° to 60° angular range.
FTIR analysis of AuNW liquid sample in the spectral range from 400 to 4000 cm−1 was carried out using a Bruker TENSOR37 spectrometer.
10
Infrared Spectroscopy of Hydrogels
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The infrared spectra of the hydrogels were recorded on a Bruker Tensor 37 spectrometer (Bruker Optics Inc, Billerica, MA, USA) using a diamond attenuated total reflection system. All spectra were recorded from 400 to 4000 cm−1 with over 128 scans at 2 cm−1 resolution.
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