The surface topology
of the solid layers prepared by RTE was studied using an EnviroScope
atomic force microscope with a Nanoscope-V controller (Veeco). The
elastic constants of standard cantilevers were in the range of 5–40
N/m and the resonance frequencies were in the range of 150–350
kHz. The samples were scanned at small cantilever vibration amplitudes
in the range of 2–10 nm. Small scanning amplitudes and the
radius of curvature of the probes provided a small effect on the surface
from the side of the probe, which is necessary for high-precision
AFM measurements of heights. For AFM measurements of limiting resolution,
ultrasharp cantilevers from Nanotuning (Russia) with carbon whiskers
with a radius of curvature of several nanometers, grown on the tip
of standard probes, were used.
of the solid layers prepared by RTE was studied using an EnviroScope
atomic force microscope with a Nanoscope-V controller (Veeco). The
elastic constants of standard cantilevers were in the range of 5–40
N/m and the resonance frequencies were in the range of 150–350
kHz. The samples were scanned at small cantilever vibration amplitudes
in the range of 2–10 nm. Small scanning amplitudes and the
radius of curvature of the probes provided a small effect on the surface
from the side of the probe, which is necessary for high-precision
AFM measurements of heights. For AFM measurements of limiting resolution,
ultrasharp cantilevers from Nanotuning (Russia) with carbon whiskers
with a radius of curvature of several nanometers, grown on the tip
of standard probes, were used.