UV irradiation was performed using a 6 W-UV lamp with irradiation of 1.01 mW/cm2 (Vilber Lourmat, France) kept in an air-ventilated chamber. Agilent (1260 Infinity) HPLC system controlled with Chemstation software (Agilent Technologies, Germany) was used for chromatographic separations. HPLC analysis was performed using Xbridge Shield RP18 5 µm, 4.6 × 250 mm (Waters, Ireland). Fourier transform infrared (FTIR) spectroscopy was carried out using Shimadzu IRAffinity-1. TEM images of SnO2/GA NP were collected using a high-resolution transmission electron microscope (TEM 2100; JEOL, Japan). Zeta potential was measured using Zetasizer Nano ZS-ZEN 3600 (Malvern Instruments Ltd, UK). The statistical analysis and experimental design of the results were performed using Minitab, ver. 16.1.1 (Minitab Inc., USA). UV–Vis absorption spectrum was observed using Shimadzu 1650 spectrophotometer (Japan). X-ray diffraction (XRD) graph was recorded on a Bruker D8-Advance diffractometer (Bruker AXS Inc., USA). The surface area and pore size of NP were obtained from Brunauer–Emmett–Teller (BET) measurements using NOVA touch 4LX analyzer (Quantachrome, USA).
1650 spectrophotometer
Manufactured by Shimadzu
Sourced in Japan
The Shimadzu 1650 spectrophotometer is a compact and reliable instrument designed for general-purpose UV-visible absorption measurements. It features a wavelength range from 190 to 1100 nm and can be used for a variety of applications in various fields, including biochemistry, analytical chemistry, and materials science. The 1650 spectrophotometer provides accurate and reproducible results, making it a versatile tool for a wide range of laboratory tasks.
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Lab products found in correlation
Tem 2100, by JEOL (1 mentions)
Agilent 1260 infinity, by Agilent Technologies (1 mentions)
6 w uv lamp, by Vilber (1 mentions)
Zetasizer nano zs zen3600, by Malvern Panalytical (1 mentions)
Iraffinity 1, by Shimadzu (1 mentions)
D8 advance diffractometer, by Bruker (1 mentions)
Chemstation software, by Agilent Technologies (1 mentions)
8400s spectrometer, by Shimadzu (1 mentions)
2 protocols using 1650 spectrophotometer
1
Characterization of SnO2/Graphene Nanocomposite
2
Nanomaterials Characterization Protocol
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FT-IR spectra were registered on a Shimadzu 8400S spectrometer using KBr disc. The UV-Vis spectra were recorded with a Shimadzu 1650 spectrophotometer. Patterns of X-ray diffraction of the materials were recorded by a Halland Philips X-ray Powder Diffraction (XRD) diffractometer at a scanning speed of 2° min−1 from 10° to 100° (CuK, radiation, λ = 0.154056 nm). Structure and morphology of the nanomaterials were identified using an LEO 440i Field Emission Scanning Electron Microscope (FE-SEM) under vacuum at an operating voltage of 10 kV. Energy-dispersive X-ray microanalysis (EDX) system was used to discover corresponding elements atomic numbers. Zeta potential measurements were carried out using a Nanotrac wave II Q Particle Size Analyzer equipped with a diode laser operating at 780.0 nm.
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