Scanning electron microscopy (SEM) images were taken using a field-emission scanning electron microscope (JSM-6701 F, JEOL Ltd., Akishima-shi, Japan) and equipped with an energy-dispersive (ED) detector with this field-emission scanning electron microscope (FE-SEM) operated at 15 kV. Energy-dispersive X-Ray (EDX) analysis was also performed on the JSM-6701 F instrument during SEM. Transmission electron microscopy (TEM) images were obtained on a JEM-2100 electron microscope (JEOL Ltd., Akishima-shi, Japan) at an accelerating voltage of 200 kV. X-ray diffraction (XRD) data for the finely ground samples were collected at 298 K using a Bruker D8 X-ray diffractometer (Bruker AXS, Inc., Madison, WI, USA) with Cu-Kα radiation source (λ = 1.5406 Å). It was operated at 40 kV in the 2θ range of 10° to 80° in the continuous scan mode with the step size of 0.01°. The changes in the oxidation state of Ag were recorded though an AXIS-ULTRA DLD-600 W photoelectron spectrometer (Shimadzu Corporation, Kyoto, Japan) (XPS) with Al K1 radiation. Nitrogen adsorption-desorption isotherms were collected on an Autosorb-iQ sorption analyzer (Quantachrome Instruments, Boynton Beach, FL, USA) and analyzed followed by the Brunauer-Emmett-Teller (BET) equation. The pore size distribution plots were obtained by using the Barret-Joyner-Halenda (BJH) model.
Axis ultra dld 600 w photoelectron spectrometer
Manufactured by Shimadzu
Sourced in Japan
The AXIS-ULTRA DLD-600 W is a photoelectron spectrometer manufactured by Shimadzu. It is designed to analyze the chemical composition and electronic structure of solid surfaces and thin films. The instrument uses X-ray photoelectron spectroscopy (XPS) to detect and measure the kinetic energies of photoelectrons emitted from a sample surface when irradiated with X-rays.
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Lab products found in correlation
2 protocols using axis ultra dld 600 w photoelectron spectrometer
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Comprehensive Nanomaterial Characterization Techniques
2
Synthesis and Characterization of Selenium Nanoparticles
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Preparation and characterization of SeNPs were carried out according to the method described in our previous work. 34 Briefly, SeNPs were synthesized using a simple chemical reduction approach employing Na 2 SeO 3 as a precursor, GSH as a reducing agent and BSA as a stabilizer. The morphology of these nanoparticles was observed by means of transmission electron microscope (TEM) (Tecnai G2 20, FEI Co., Netherlands). The hydrodynamic size of the particles was measured using a dynamic light scattering (DLS) instrument (LB-550, Horiba, Ltd Japan). X-ray diffraction (XRD) patterns were recorded on an X-ray diffractometer (X'Pert PRO, PANalytical B.V., Netherlands) using Cu Ka radiation with 40 kV and 55 mA in the 2y range 101-801. The X-ray photoelectron spectra (XPS) were gained by an AXIS-ULTRA DLD-600W photoelectron spectrometer (Shimadzu-Kratos, Japan).
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