To investigate the surface morphology of the sample the atomic force microscopy (NanoWizard®, JPK Instruments, Berlin, Germany) was used and the machine integrated JPJSPM software was used to attain a 3D image of the sample surface. The sample with a size of 1 × 1 cm2 was cut from the fabricated membrane to evaluate the surface roughness of fabricated samples and placed on the AFM equipment (NanoWizard, JPK instruments, Berlin, Germany). The AFM analysis was performed in the normal atmosphere at room temperature in the event of measuring surface roughness. The images with the scanning size of 20 μm × 20 μm were captured and recorded in the medium mode with 256 × 256 pixels. Three measurements were carried at various positions to measure the average surface roughness (Ra).
Nanowizard
Manufactured by Bruker
Sourced in Germany
The NanoWizard is an atomic force microscope (AFM) system designed for high-resolution imaging and analysis of surfaces at the nanoscale. It provides precise control and positioning of the probe, enabling detailed examination of sample topography and properties.
Automatically generated - may contain errors
Lab products found in correlation
Cp pnp bsg, by Olympus (2 mentions)
Csc38 no al probe, by MikroMasch (2 mentions)
Lsm 510 meta, by Zeiss (2 mentions)
Ppp nchaud, by Nanosensors (1 mentions)
Nicolet in10, by Thermo Fisher Scientific (1 mentions)
Tm4000plus, by Hitachi (1 mentions)
Nanowizard 2, by Bruker (1 mentions)
Nanowizard 2, by Brucker (1 mentions)
Lambda 1050 uv vis nir, by PerkinElmer (1 mentions)
Crossbeam 1540 esb, by Zeiss (1 mentions)
D2 phaser system, by Bruker (1 mentions)
Supra 55, by Zeiss (1 mentions)
Ve 8800, by Keyence (1 mentions)
Matlab, by MathWorks (1 mentions)
Cellhesion 200 module, by Bruker (1 mentions)
35 mm glass bottom culture dish, by Ibidi (1 mentions)
Arrow tl1, by NanoWorld (1 mentions)
Petri dish heater, by Bruker (1 mentions)
Lambda 365, by PerkinElmer (1 mentions)
Jpk software, by Bruker (1 mentions)
40 protocols using nanowizard
1
AFM Surface Morphology Analysis
2
Characterizing Polymer Molding Composition and Structure
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The contaminants in the RPE moldings were identified using EDS (scanning control unit (SCU), Bruker Corporation, Billerica, MA, USA) in conjunction with SEM (accelerating voltage: 15 eV, backscattered electron scanning mode, TM 4000 Plus-Hitachi, Ltd., Tokyo, Japan).
The crystallinity of the RPE and VPE pellet moldings was evaluated by X-ray diffraction (XRD, XRD-6100X, Shimadzu Corporation, Kyoto, Japan), whereas the secondary structure was analyzed using FT-IR spectroscopy (Nicolet iN10, Thermo Fisher Scientific, Waltham, USA) using a specular reflectance method with a gold reflection plate (wavenumber range: 600–4000 cm−1, number of scans = 32, scanning time = 60 s, and imaging area = 200 × 20 µm).
The higher-order structure of the RPE moldings was determined using AFM (Nanowizard, Bruker Corporation, Billerica, MA, USA). Before analysis, the specimens were etched for 2 h in an etching liquid that was prepared by dissolving a 1% w/v solution of potassium permanganate in a 2:1 mixture of sulfuric and dry ortho-phosphoric acids [15 (link),16 (link)]. The etched specimens were directly observed in tapping mode using a silicon pyramidal cantilever (PPP-NCHAuD, Nanosensors, Neuchatel, Switzerland). Phase images were obtained to distinguish between the crystalline lamellae and amorphous regions in the etched specimens [15 (link),16 (link)].
The crystallinity of the RPE and VPE pellet moldings was evaluated by X-ray diffraction (XRD, XRD-6100X, Shimadzu Corporation, Kyoto, Japan), whereas the secondary structure was analyzed using FT-IR spectroscopy (Nicolet iN10, Thermo Fisher Scientific, Waltham, USA) using a specular reflectance method with a gold reflection plate (wavenumber range: 600–4000 cm−1, number of scans = 32, scanning time = 60 s, and imaging area = 200 × 20 µm).
The higher-order structure of the RPE moldings was determined using AFM (Nanowizard, Bruker Corporation, Billerica, MA, USA). Before analysis, the specimens were etched for 2 h in an etching liquid that was prepared by dissolving a 1% w/v solution of potassium permanganate in a 2:1 mixture of sulfuric and dry ortho-phosphoric acids [15 (link),16 (link)]. The etched specimens were directly observed in tapping mode using a silicon pyramidal cantilever (PPP-NCHAuD, Nanosensors, Neuchatel, Switzerland). Phase images were obtained to distinguish between the crystalline lamellae and amorphous regions in the etched specimens [15 (link),16 (link)].
3
Surface Roughness Analysis of PANI Nanocomposites
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The surface roughness of the PANI nanocomposite films was investigated using two- and three-dimensional (2D and 3D) topographic images obtained using noncontact mode atomic force microscopy (AFM) (Bruker, NanoWizard II, Ettlingen, Germany) at the Korea Basic Science Institute (KBSI; Busan, Korea). AFM images were generated with 256 × 256 pixels covering an area of 50 × 50 μm, and the scan rate was 1 Hz. All the measurements were obtained under controlled room temperature, and the data were acquired and interpreted with NanoWizard software provided by Bruker.
4
Analyzing Surface Roughness of TAC Films
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The surface roughness of TAC films was performed on a non-contact mode by Atomic Force Microscopy (AFM: NanoWizard II, Brucker, Berlin, Germany) at the Korea Basic Science Institute (KBSI; Busan, Korea). All measurements were obtained under controlled room temperature. Moreover, the scanning area was 20 μm × 20 μm and scan rate was set at 1 Hz. The Bruker NanoWizard software was used for image processing and interpretation.
5
Comprehensive Characterization of Nanoparticle Phases
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The phase components of the nanoparticles were characterized by X-ray diffraction (XRD). It was performed by a Bruker D2Phaser system with Cu-Kα radiation (λ = 1.5405 Å) in Bragg–Brentano configuration using a LynxEye detector. Refractive indices and extinction coefficients of the materials were measured by ellipsometry (VASE ellipsometer, J.A. Woollam). Scanning electron microscope cross-section images were obtained by SUPRA 55 (Carl Zeiss) at 2 kV. Focused ion beam (Zeiss Crossbeam 1540 EsB) was used for milling the sample to enable SEM image acquirement. Transmittance and reflectance were measured with a spectrophotometer (Lambda 1050 UV–vis–NIR, PerkinElmer) equipped with an integrating sphere. The transmittance was obtained with the normal incident angle, and the reflectance was obtained with an 8° incident angle. The surface morphology was measured by atomic force microscope (AFM) (NanoWizard, Bruker Nano), and the surface RMS roughness was analyzed with the software Gwyddion.
6
Atomic Force Microscopy of Drug-Loaded Albumin Nanoparticles
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The morphology of HSA-MPs and DOX-HSA-MPs were investigated using AFM (Nano Wizard®4 Bruker, Berlin, Germany). The samples were diluted in water and spread on a clean coverslip. The drop was completely dried after incubation at 30 °C for 1 h and thereafter the cover slide was stored in dry conditions (air) for 4 days at 24 °C. The images of the particles were then taken (dry state). For the wet stage images the clean cover slip was covered with poly-l -ornithine, rinsed with water and dried by nitrogen flow. The samples were dropped on the coverslip and incubated for 30 min. Afterwards the samples were thoroughly washed and imaged in water. The JPK Data Processing software (version 6.1, Bruker Nano GmbH, Berlin, Germany) was used to analyze the obtained images.
7
Quantitative Nanofibrous Surface Analysis
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Quantitative surface roughness analysis of the electrospun nanofibrous membrane was investigated by atomic force microscopy (AFM) unit (Nanowizard; JPK Instruments). To begin, the samples are fixed on a specimen holder and the scanning is performed at room temperature in a normal atmosphere. The scanning was performed in a 20 µm × 20 µm area by tapping mode and the 3D image was obtained with 256 * 256 pixels using JPKSPM data processing software.
8
Multimodal Nanostructure Imaging Techniques
9
Temperature-Controlled Nanomechanical Analysis
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The mechanical analysis was performed by an atomic force microscope (NanoWizard, JPK Instruments). The included heater was used to change and control the temperature during the experiments. To avoid strong perturbations due to the bimetallic bending of the cantilever, we used uncoated MLCT cantilevers (MLCT-UC, Bruker). For the experiment shown in this work, the cantilever had a nominal spring constant of 0.03 N/m.
To analyze the response of the samples to changes in temperature we employed a confocal laser scanning fluorescent microscope (LSM 510 Meta, Zeiss), typically equipped with a 40×, NA = 0.75 air objective. To mount our coverslip, a chamber with a built-in Peltier element which is driven by an external controller was constructed. This allowed to actively heat and cool the sample while imaging the microstructures in an aqueous environment at the desired temperatures. The light activation via two-photon photo-conversion was performed in the same setup from Nanoscribe used for the fabrication.
To analyze the response of the samples to changes in temperature we employed a confocal laser scanning fluorescent microscope (LSM 510 Meta, Zeiss), typically equipped with a 40×, NA = 0.75 air objective. To mount our coverslip, a chamber with a built-in Peltier element which is driven by an external controller was constructed. This allowed to actively heat and cool the sample while imaging the microstructures in an aqueous environment at the desired temperatures. The light activation via two-photon photo-conversion was performed in the same setup from Nanoscribe used for the fabrication.
10
Measuring Hydrogel Elasticity via Nanoindentation
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The Young’s modulus E of the hydrogels was measured by nanoindentation using an atomic force microscope (NanoWizard, JPK Instruments, Berlin, Germany). The hydrogels were indented by a spherical colloidal probe that was attached to a silicon–nitride cantilever with a nominal spring constant of 0.08 N/m (CP-PNP-BSG; R = 5 m, Olympus Optical) and an approach speed of 1 m/s. Each cantilever was calibrated, and the spring constant was determined by thermal noise measurement [25 (link)]. The measured force–indentation curves were analyzed by nonlinear least-squares fitting to the Hertz model [22 ,26 (link),27 (link)] using a customized MATLAB (Mathworks) routine. The modified Hertz model equation for spherical indenter shapes to determine E was fitted as
where F is the force applied to the indenter, is Poisson’s ratio, and is the indentation depth [3 (link),28 (link)]. The average Young’s modulus of 50 independent indentation sites at two
m areas was quantified for each hydrogel to ensure statistical significance.
where F is the force applied to the indenter, is Poisson’s ratio, and is the indentation depth [3 (link),28 (link)]. The average Young’s modulus of 50 independent indentation sites at two
m areas was quantified for each hydrogel to ensure statistical significance.
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