The morphologies of the prepared materials were observed by scanning electron microscopy (SEM; Zeiss, EVO MA 25/LS 25) and TEM (JEOL 2011F). The crystal structure was confirmed by powder XRD (Rigaku DMAX2000). DLS (Malvern Nano-ZS90) was used to identify the diameters of the obtained nanoparticles. A Beckman Coulter DU 730 UV–VIS-NIR spectrophotometer was used to measure the absorptions of obtained nanoparticles.
D max2000
Manufactured by Rigaku
Sourced in Japan
The D/MAX2000 is a versatile powder X-ray diffractometer designed for phase identification and quantitative analysis. It features a high-intensity copper X-ray source and a sensitive, high-resolution detector. The D/MAX2000 is capable of performing a wide range of X-ray diffraction measurements on solid samples.
Automatically generated - may contain errors
Lab products found in correlation
Escalab 250xi, by Thermo Fisher Scientific (4 mentions)
Verios 460, by Thermo Fisher Scientific (3 mentions)
Spectrum 100, by PerkinElmer (3 mentions)
Nano zs90, by Malvern Panalytical (2 mentions)
S 4800, by Hitachi (2 mentions)
Jem 2100f, by Thermo Fisher Scientific (2 mentions)
Jem 2010, by JEOL (2 mentions)
Jsm 7500f, by JEOL (1 mentions)
Oleic acid, by Merck Group (1 mentions)
Oleylamine, by Merck Group (1 mentions)
1 octadecene, by Merck Group (1 mentions)
N hydroxysuccinimide, by Merck Group (1 mentions)
Jem 2010 microscope, by JEOL (1 mentions)
Jem 2100f, by JEOL (1 mentions)
Lambda 35, by PerkinElmer (1 mentions)
Fls920, by PerkinElmer (1 mentions)
Uh4150, by Hitachi (1 mentions)
Fluoromax 4, by Horiba (1 mentions)
Escalab 250xi x ray photoelectron spectrometer, by Thermo Fisher Scientific (1 mentions)
Vega3, by TESCAN (1 mentions)
34 protocols using d max2000
1
Characterization of Synthesized Nanoparticles
2
Electrochemical Characterization of Doped SnO2 Films
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All the PEC measurements were carried on a RST5200F electrochemical workstation (Zhengzhou Shi Ruisi Instrument Technology Co., Ltd.). Xenon lamp (λ > 420 nm) was used as the irradiation source. The fluorine-doped SnO2 conductive glass (FTO) (15 × 50 mm, resistance = 10 Ω) was purchased from Wuhan Crystal Solar Energy Technology Co. Ltd. The UV spectrum was measured on the TU-1950 spectrophotometer (Beijing, China). Electron spectrometer (Shimadzu, Japan) was used to obtain X-ray photoelectron spectroscopy (XPS) data. The Transmission electron microscopy (TEM) image was obtained from JSM-7900F (Japan). A Rigaku Dmax 2000 X-ray diffractometer containing graphite monochromatic CuKα radiation (λ = 0.154 nm) was used to obtain the X-ray diffraction pattern (XRD). Fourier transform infrared spectroscopy (FTIR) was recorded on a Bruker IR spectrometer.
3
Characterization of Crystalline Phases
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The crystalline phases of the samples were characterized by X-ray diffraction (Rigaku DMAX2000) with Cu kα radiation. Data for crystalline phase identification were collected by continuous scanning at 2θ = 10°–90°. Data for phase structure refinement were collected by step scanning at 2θ = 15°–70° with a step of 0.03° and a counting time of 2 s per step. Rietveld refinements were performed using the GSAS program with the EXPGUI interface. During the entire process, background parameters, zero, polar, lattice parameters, atomic fractional coordinates, atomic isotropic displacement parameters, phase fractions, profile parameters, and SH Pref Orient parameters were fitted using the shifted Chebyshev function as the background function and the Pearson VII function as the profile function.
4
X-ray Diffraction Analysis of Coal Ash and Lightweight Aggregate
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In order to determine the mineral phase of coal ash and the artificial lightweight aggregate and the bonding state of minerals, the samples pulverized to 8 μm or less in size were examined by X-ray diffraction using Rigaku DMAX2000. This method involves analyzing the diffraction image obtained when the X-ray is incident on the crystal surface at a specific angle and scattered by the atomic layer in the crystal surface which satisfies Bragg’s law.
5
Characterization of ReXOy Thin Films
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To elucidate the surface morphology of RexOy film, FESEM images were obtained by a JEOL JSM 7500F (Japan) with a 5 kV operating voltage. The surface roughness of the films was investigated by a Veeco D5000 AFM (United States) instrument using a tapping method with a Si cantilever probe. The crystalline properties and phases were interpreted by XRD characterization using Rigaku D/MAX2000 (Japan) with a Cu Kα (1.54176 Å). The XPS analysis for compositional investigation was obtained by a PHI 5800 ESCA (Japan) XPS system where monochromated Al Kα X-ray (1486.6 eV) with a spot diameter of 100 μm was used. The binding energies of all XPS spectra were calibrated with respect to carbon (C) 1s peak at 284.8 eV. The Gaussian–Lorentzian function was used for line contour fitting, and Shirley background subtraction was used for peak fitting due to its ease of use.
The C–V characterization of the RexOy based sensor in the electrolytes was obtained by an HP 4284A LCR meter (United States) at the operating frequency of 500 Hz. A silver/silver chloride (Ag/AgCl) was used as a reference electrode. All the measurements were conducted inside a black box to avoid the undesired interference of light.
The C–V characterization of the RexOy based sensor in the electrolytes was obtained by an HP 4284A LCR meter (United States) at the operating frequency of 500 Hz. A silver/silver chloride (Ag/AgCl) was used as a reference electrode. All the measurements were conducted inside a black box to avoid the undesired interference of light.
6
Synthesis and Characterization of Fe@Fe3O4 Nanoparticles
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Oleic acid, 1-octadecene, oleylamine, 3-(3-dimethylaminopropyl)-1-ethylcarbodiimide hydrochloride (EDC) and N-hydroxysuccinimide (NHS) were supplied from Sigma-Aldrich. GdCl3·6H2O, alendronate sodium (ALA) and DOTA were provided from Adamas-beta. Fe(CO)5 was supplied from Development of Beijing Chemical Technology Co., Ltd. Branch. All the chemicals were used without further purify.
XRD of the Fe@Fe3O4 was obtained on a Rigaku DMAX 2000 diffractometer (Cu/Kα radiation, 40 kV, 40 mA, scan range 20–80°). TEM images were measured on a JEOL JEM-2010 microscope with the accelerating voltage in 200 kV. The dynamic light scattering (DLS) and surface potential were collected utilizing a Malvern Zetasizer Nano ZS model ZEN3600 (Worcestershire, U.K.). FTIR spectra were captured by a Nicolet Avatar 370 FTIR spectrometer. The concentration of the metal in the samples was collected by inductively coupled plasma atomic emission spectroscopy (ICP-AES). The hysteresis loops were performed in a superconducting quantum interference device (SQUID) from Lake Shore.
XRD of the Fe@Fe3O4 was obtained on a Rigaku DMAX 2000 diffractometer (Cu/Kα radiation, 40 kV, 40 mA, scan range 20–80°). TEM images were measured on a JEOL JEM-2010 microscope with the accelerating voltage in 200 kV. The dynamic light scattering (DLS) and surface potential were collected utilizing a Malvern Zetasizer Nano ZS model ZEN3600 (Worcestershire, U.K.). FTIR spectra were captured by a Nicolet Avatar 370 FTIR spectrometer. The concentration of the metal in the samples was collected by inductively coupled plasma atomic emission spectroscopy (ICP-AES). The hysteresis loops were performed in a superconducting quantum interference device (SQUID) from Lake Shore.
7
Multimodal Characterization of Specimens
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X-ray power diffraction (XRD, Rigaku D/max-2000, Tokyo, Japan) was employed to characterize the structure of the specimens using Cu Kα (λ = 1.5406 Å) radiation at 40 KV and 200 mA in a 2θ range of 20°–70°. Scanning electron microscopy (SEM, Hitachi S-4800, Tokyo, Japan) was performed to examine the morphology and transmission electron microscopy (TEM) and high-resolution transmission electron microscopy (HR-TEM) were investigated (JEOL JEM-2100F, Tokyo, Japan). The surface chemical composition was investigated using X-ray photoelectron spectra (XPS) (PHI 5000C ESCA System, Tokyo, Japan). Raman scattering was conducted (Jobin Yvon XploRA, Paris, France). UV-vis spectrophotometry (UV-Vis; PerkinElmer Lambda 35, Waltham, MA, USA) was used to test the optical absorption under room temperature and the photoluminescence (PL) characteristics were conducted on fluorescence spectrophotometry (FLS-920, Livingston, Scotland, UK). The Brunauer-Emmett-Teller (BET) specific surface areas were measured (Tristar 3000 nitrogen adsorption apparatus, Norcross, GA, USA).
8
Structural and Optical Characterization of Materials
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The crystalline structures of the as-fabricated samples were analyzed using X-ray diffraction (XRD) on a Rigaku D/max-2000 diffractometer with Cu Kα radiation (λ = 1.5406 Å) in the range of 2ϑ = 20–90° at a scanning rate of 4 °C min−1 with a scan width of 0.02°. The morphology of the samples was observed using field emission scanning electron microscopy (FE-SEM, HELIOS NanoLab 600i) at an accelerating voltage of 20 kV. The transmission electron microscopy (TEM) and high-resolution TEM (HRTEM) analyses were carried out on a JEM-2100 transmission electron microscope at an accelerating voltage of 200 kV. The X-ray photoelectron spectroscopy (XPS) was conducted on a Thermo Scientific ESCALAB 250Xi X-ray photoelectron spectrometer coupled with a pass energy of 20.00 eV and an Al Kα excitation source (1486.6 eV). The UV-vis diffuse reflectance spectra (DRS) were obtained on a spectrophotometer (HITACHI UH-4150) using BaSO4 as the reflectance standard. Photoluminescence (PL) analysis was accomplished on a HORIBA FluoroMax-4.
9
Superhydrophobic Carbon Steel Surface Characterization
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A field-emission scanning electron microscope (FE-SEM, VEGA 3, TESCAN, Brno-Kohoutovice, Czech) was utilized to observe the morphology of superhydrophobic surface. Element constitution and element valence were measured by energy-dispersive X-ray spectroscopy (EDS, EX-250, Horiba Ltd, Kyoto, Japan) and X-ray diffraction (XRD, D/MAX-2000, Rigaku, Tokyo, Japan) patterns. Contact angles (CAs) of 5 μL water droplets on the superhydrophobic carbon steel sheet under the same treatment process were tested by an optical contact-angle meter system (JC2000D, POWEREACH, Shanghai, China). The drag reduction effect was valued by the static driving angle (the angle of stator magnetic potential behind rotor magnetic potential) to rotors with and without superhydrophobic surfaces under the same driving condition, the sine of which is proportional to the friction torque.
10
Comprehensive Materials Characterization
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The morphology of the synthesized materials was examined using scanning electron microscopy (SEM, VERIOS 460, FEI) operating at 10 kV and high-resolution transmission electron microscope (HR-TEM, ARM300, JEOL) operating at 300 kV. Elemental mapping was attained using energy-dispersive X-ray spectroscopy (EDX) equipped with the SEM and TEM. The crystal structure analysis was performed using an X-ray diffractometer (XRD, D/Max2000, Rigaku) with Cu-Ka radiation. Surface chemistry was analyzed using X-ray photoelectron spectroscopy (XPS, Thermo Scientific Kα spectrometer, 1486.6 eV)
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