Fei tecnai g2 spirit microscope
The FEI Tecnai G2 Spirit is a high-resolution transmission electron microscope (TEM) designed for advanced imaging and analysis applications. It features a LaB6 electron source and provides a maximum accelerating voltage of 120 kV. The microscope is capable of point-to-point resolution up to 0.24 nm and line resolution up to 0.14 nm, enabling detailed examination of nanoscale structures and materials.
5 protocols using fei tecnai g2 spirit microscope
Electrochemical Characterization of Materials
Phage Morphology Characterization Protocol
Characterization of Doped Cells by TEM
Negative-Stain Electron Microscopy of α-Synuclein Aggregates
TEM and AFM Characterization of Nanostructures
For diffraction, a selective area aperture of 685 nm diameter and an instrument camera length of 2.75 m was used. Diffraction patterns were calibrated using an evaporated Al standard and distances were compared to literature known values40 (link) of Al. Observed values for the aluminum standard were found to correspond to the literature value of 4.0494 Å when a calibration factor of 1.055 was applied and such a factor was applied to all measurements.
AFM was performed using an Asylum Research atomic force microscope (MFP-3D), which was used to measure the surface morphology in tapping mode. The probe used for the measurement was a HQ:NSC15/Al BS from MikroMasch. The Asylum Research built in software and Gwyddion (64 bit) were used to further analyze the AFM images.
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