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Fei tecnai g2 spirit microscope

Manufactured by Thermo Fisher Scientific
Sourced in United States

The FEI Tecnai G2 Spirit is a high-resolution transmission electron microscope (TEM) designed for advanced imaging and analysis applications. It features a LaB6 electron source and provides a maximum accelerating voltage of 120 kV. The microscope is capable of point-to-point resolution up to 0.24 nm and line resolution up to 0.14 nm, enabling detailed examination of nanoscale structures and materials.

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5 protocols using fei tecnai g2 spirit microscope

1

Electrochemical Characterization of Materials

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The electrochemical techniques such as differential pulse voltammetry (DPV), cyclic voltammetry (CV) and chronoamperometry (CA) were conducted using a Metrohm-Autolab potentiostat/galvanostat system (PGSTAT128N, Metrohm, Herisau, Sweden). Electrochemical impedance spectroscopy was performed under a 0.1 Hz to 100 kHz frequency using an IVIUM Compactstat (Eindhoven, The Netherlands) device. The employed screen-printed electrode had a Ag/AgCl paste and Pt electrodes on their own surface, as a reference and a counter electrode, respectively. UV–Vis was recorded using a double beam spectrophotometer (Shimadzu, Kyoto, Japan) model UV-1800 and quartz cells (Hellma, Müllheim, Germany). SEM and EDX were observed micrographs of the materials by ZEISS GeminiSEM 560 at 3.00 kV. The X-ray diffraction pattern was recorded using a Rigaku smart laboratory diffractometer (operated at 40 kV and 20 mA) with a Cu Kα source at a wavelength of 1.540 Å. TEM images were performed using an FEI Tecnai G2 Spirit microscope (Thermo Fisher Scientific, Waltham, MA, USA) at 120 kV. All electrochemical measurements were performed at 27.5 °C unless otherwise specified.
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2

Phage Morphology Characterization Protocol

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To determine phage morphology, purified high-titer phages in SM buffer were analyzed. Briefly, the glow discharge technique (30 s at 7.2 V using a Bal-Tec MED 020 coating system) was applied over carbon-coated copper grids, and grids were immediately placed on top of sample drops for 10 min. After two brief washes in distilled water, samples were contrasted with 2% uranyl acetate for 5 min. Excess fluid was removed and allowed to dry before examination with a transmission electron FEI Tecnai G2 Spirit microscope (Thermo Fisher Scientific, OR, USA). All images were acquired using Radius software (version 2.1) with a digital camera Xarosa (EMSIS, Münster, Germany).
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3

Characterization of Doped Cells by TEM

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TEM images were recorded with an FEI Tecnai G2 spirit microscope (Thermo Fisher Scientific, USA) operating at an accelerating voltage of 120 kV. For the characterization of the doped cells, after incubation with Zn0.5Fe2.5O4/SiO2 NPs, the human osteosarcoma MG-63 cells (1 × 106) were washed three times with PBS and fixed with 1.5% glutaraldehyde in PBS at 4°C for 30 min. The fixed cells were washed three times with PBS and 1% osmium tetroxide in PBS was added for 1 h at room temperature. After another three washing steps in PBS, the cells were dehydrated with 30, 50, 75, 85, 95 and 100% (three times) absolute ethanol. Thereafter, the cells were infiltrated with Epon resin (two steps: 50 and 66% for resin in absolute ethanol, 30 min each) and embedded in 100% resin at 60°C for 2 days. Ultrathin sections (70 nm thick) were cut on an Ultramicrotome (Leika), stained with lead citrate and observed by TEM.
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4

Negative-Stain Electron Microscopy of α-Synuclein Aggregates

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Carbon films on 200-mesh copper grids (Ted Pella) were loaded with 10 μL of aS aggregation products for 30 s, followed by two rounds of washing with 10 μL deionized H2O for 30 s. A volume of 10 μL of uranyl acetate stain was loaded onto the film for 30 s. Excess liquid was wicked off using a Chem Wipe, the grids were air-dried, and viewed using a FEI Tecnai G2 Spirit microscope (Thermo Fisher Scientific, Hillsboro, Oregon).
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5

TEM and AFM Characterization of Nanostructures

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TEM diffraction and imaging was performed using an FEI Tecnai G2 Spirit microscope (Thermo Fisher Scientific, Eindhoven, The Netherlands) equipped with a LaB6 cathode operated at 120 kV acceleration voltage and by using a side-mounted digital camera Gatan Orius 1000 (4k × 2.6k pixels, Gatan GmbH, Munich, Germany).
For diffraction, a selective area aperture of 685 nm diameter and an instrument camera length of 2.75 m was used. Diffraction patterns were calibrated using an evaporated Al standard and distances were compared to literature known values40 (link) of Al. Observed values for the aluminum standard were found to correspond to the literature value of 4.0494 Å when a calibration factor of 1.055 was applied and such a factor was applied to all measurements.
AFM was performed using an Asylum Research atomic force microscope (MFP-3D), which was used to measure the surface morphology in tapping mode. The probe used for the measurement was a HQ:NSC15/Al BS from MikroMasch. The Asylum Research built in software and Gwyddion (64 bit) were used to further analyze the AFM images.
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