The morphologies and structures of the particle samples were investigated using a JEOL JSM−7401F field emission scanning electron microscope (SEM) and a JEM−2100F transmission electron microscopy (TEM). Zeta potential of the particle samples was measured using a Malvern Zetasizer Nano ZS90. The weight loss of the particle samples was determined by a TGA instrument (SDTQ 600, Shimadzu, Tokyo, Japan) at a scan rate of 10 °C·min−1 and in the temperature range of 20–800 °C. Nitrogen adsorption-desorption isotherms of the particle samples were measured at 77 K on a Micrometitics Tristar 3000 system. The chemical properties of the particle samples were characterized by Fourier transform infrared spectroscopy (FTIR) (Fivector, Bruker, Karlsruhe, Germay) and Raman spectroscopy (Renishaw inVia, London, England). Interactions between particles and GSH were monitored by a Fluorescence spectrometer (RF−6000, Shimadzu, Tokyo, Japan).
Jem 2100f transmission electron
Manufactured by JEOL
Sourced in Japan
The JEM-2100F is a transmission electron microscope (TEM) manufactured by JEOL. It is designed for high-resolution imaging and analysis of a wide range of materials at the nanoscale. The JEM-2100F utilizes a field emission gun (FEG) electron source and advanced optics to provide high-resolution imaging capabilities. It is capable of resolving features at the atomic level and can be used for a variety of applications, including materials science, nanotechnology, and life sciences research.
Automatically generated - may contain errors
Lab products found in correlation
Sdtq 600, by Shimadzu (1 mentions)
Rf 6000, by Shimadzu (1 mentions)
Zetasizer nano zs90, by Malvern Panalytical (1 mentions)
Jsm 7401f, by JEOL (1 mentions)
Jsm 7001f scanning electron microscope, by JEOL (1 mentions)
Axio observer 5m, by Zeiss (1 mentions)
S 4800 scanning electron microscope, by Hitachi (1 mentions)
4 protocols using jem 2100f transmission electron
1
Comprehensive Physicochemical Characterization of Particle Samples
2
Morphological Analysis of Nanomaterials
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The morphology was examined using a JSM-7001F scanning electron microscope (SEM, JEOL, Tokyo, Japan), a JEM-2100F transmission electron microscope (TEM, JEOL, Tokyo, Japan), and a SPA-400/SPI3800N scanning probe microscope (SPM, Hitachi High-Technologies, Tokyo, Japan).
3
Comprehensive Characterization of Nanostructured Materials
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All digital photos were taken by using iPhone mobile phone. A JEM‐2100F transmission electron microscope (TEM) instrument (JEOL, Japan) was used to capture TEM images with an acceleration voltage of 200 kV. The field‐emission scanning electron microscopy (FE‐SEM) images were collected on a Hitachi S‐4800 scanning electron microscope. A 60‐SXBFTIR spectrometer was used to collect Fourier transform infrared (FTIR) spectra in the range of 400–4000 cm–1 with a resolution of 4 cm–1. A NETZSCH‐STA449C/G instrument was used to conduct thermal analysis in air at room temperature to 1000 °C and heating rate of 10 °C min–1. The reflectance spectra were all obtained by using a fiber optic spectrometer USB 2000+. All the dark‐field microscope images were captured by dispersing nanochains in DMSO solution and then recorded by an optical microscope (Zeiss Axio Observer 5M, Germany).
4
Visualizing Protein Microstructures via TEM
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Proteins (0.03 -0.1 mg/mL) were fixed on Formvar/Carbon 400 Mesh, Cu grids using conventional procedures and staining with uranyl formate. Imaging was performed at room temperature with JEOL 1500 electron microscope equipped with tungsten filament, XR401 high sensitivity CMOS camera and operated at 90 keV. Samples for scanning transmission electron microscopy were prepared similarly. Images were acquired using a JEOL JEM-2100F transmission electron microscope (TEM) with a CEOS probe corrector. Microscopy was performed at 200 keV in scanning transmission microscopy (STEM) mode with the lens setting corrected by the Cs-corrector to produce a sub-Angstrom beam size. Both high-angle annular dark-field and bright-field images were acquired simultaneously. To better display the internal microstructures of the virus, fast Fourier transform image filtering was performed for bright field images.
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