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Pda s 3100 uv vis spectrophotometer

Manufactured by Scinco

The PDA S-3100 UV/vis spectrophotometer is a laboratory instrument designed for the analysis of the absorbance or transmittance of light in the ultraviolet and visible light spectrum. It measures the amount of light that a sample absorbs or transmits at different wavelengths.

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5 protocols using pda s 3100 uv vis spectrophotometer

1

Comprehensive Optical Characterization Protocol

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The absorption spectra were measured using a Scinco PDA S-3100 UV/vis spectrophotometer. The emission spectra were obtained using an Ocean Optics fluorescence spectrometer. Transmission electron microscopy (TEM) images were recorded using a Super-Twin transmission electron microscope operating at 300 kV. X-ray diffraction (XRD) patterns were obtained using a Rigaku Ultima III diffractometer equipped with a rotating anode and a Cu Kα radiation source (λ = 0.15418 nm). Thermogravimetric analysis/Simultaneous Thermal Analyser-Mass Spectrometer spectrum measured using a NETZSCH STA 409 PC + QMS 403C. The absolute PL QY measured using a quantum efficiency measurement system with integrated sphere (QE 2000B, Osuka).
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2

Multimodal Characterization of Nanomaterials

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Absorption spectra were measured by using a Scinco PDA S-3100 UV/vis spectrophotometer. Emission spectra were obtained using an ocean optics fluorescence spectrometer. TEM images were taken on a Super-Twin transmission electron microscope operating at 300 kV. XRD patterns were obtained using a Rigaku Ultima III diffractometer equipped with a rotating anode and a Cu Kα radiation source (λ = 0.15418 nm). Inductively coupled plasma-optical emission spectrometry was performed using an OPTIMA 5300DV, PerkinElmer.
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3

Characterization of Nanoparticles via Spectroscopy

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Absorption spectra were measured using a SCINCO PDA S‐3100 UV‐vis spectrophotometer. Emission spectra were measured using a JASCO FP‐6500 fluorescence spectrometer. The nanoparticles were dispersed in hexane and spread on a copper grid and silicon wafer for these measurements. TEM images were collected using an FEI Tecnai TITAN 80–300TM transmission electron microscope with an acceleration voltage of 150 kV. High‐resolution TEM images were obtained on an FEI Titan microscope operated at 300 kV. SEM images and X‐ray mapping data were obtained using a JSM‐6700F field emission scanning electron microscope equipped with an INCA energy dispersive X‐ray spectrometer at an operating voltage of 30 kV.
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4

Quantifying Chlorophylls and Carotenoids in Lemna minor

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Chlorophyll a and b (Chl a and b) and carotenoids were extracted from approximately five L. minor plants in 1 mL methanol (CH3OH; ≥99.9%; CAS No. 67-56-1; Sigma-Aldrich, Co., St. Louis, MO, USA) for 24 h in the dark at 4 °C. The absorption of the supernatant of the methanolic extract was measured using a Scinco S-3100 PDA UV-Vis spectrophotometer at 666 nm (Chl a), 653 nm (Chl b), and 470 nm (carotenoids). Chl a, Chl b, and carotenoid contents were estimated using the equations described in Lichtenthaler [38 (link)]
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5

Comprehensive Analytical Characterization of Nano-Materials

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The 1H NMR spectra were recorded on an AVANCE III HD (9.4 T) 400 spectrometer (Bruker, USA), and liquid chromatography mass spectrometry (LC–MS) was recorded on an Ultimate-3000 ISQ EC (Thermo Fisher, USA). Ultraviolet-visible (UV-Vis) absorption spectra were collected using an S-3100 PDA UV-Vis Spectrophotometer (SCINCO, Korea). The fluorescence spectra were measured with a Cytation 5 Cell Imaging Multi-Mode Reader (BioTek, USA). Scanning electron microscopy (SEM) images were captured on a TESCAN CLARA (TESCAN, Czechi a). Dynamic light scattering (DLS) particle size and zeta potential was measured on a Zetasizer nano ZS instrument (Malvern, English). Fluorescence quantum yields were determined using a Fluorolog®− 3 with TCSPC (HORIBA Scientific, Japan). Fourier transform infrared (FT-IR) spectra were collected using an Alpha-P (Bruker Optics, USA). The confocal microscopy images were captured on an LSM 510-META confocal laser scanning microscope (CARL ZEISS, Germany).
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