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Fc 72 fluorinert

Manufactured by 3M
Sourced in Sao Tome and Principe

FC-72 Fluorinert is a clear, colorless, and odorless liquid that is commonly used as a coolant and heat transfer medium in various laboratory applications. It has a high thermal and chemical stability, a low viscosity, and a low surface tension, making it suitable for applications where efficient heat transfer and low reactivity are required.

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9 protocols using fc 72 fluorinert

1

Photothermal Deflection Spectroscopy for Highly Sensitive Surface Absorption Measurements

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Photothermal deflection spectroscopy (PDS) is a highly sensitive surface averaged absorption measurement technique. For the measurements, a monochromatic pump light beam produced by a combination of a Light Support MKII 100W Xenon arc source and a CVI DK240 monochromator, is shined on the sample (film on Quartz substrate), inclined perpendicular to the plane of the sample, which on absorption produces a thermal gradient near the sample surface via non-radiative relaxation induced heating. This results in a refractive index gradient in the area surrounding the sample surface. This refractive index gradient is further enhanced by immersing the sample in a deflection medium comprising of an inert liquid FC-72 Fluorinert (3M Company) that has a high refractive index change per unit change in temperature. A fixed wavelength CW transverse laser probe beam, produced using a Qioptiq 670 nm fiber-coupled diode laser with temperature stabilizer for reduced beam pointing noise, was passed through the thermal gradient in front of the sample producing a deflection proportional to the absorbed light at that particular wavelength, which is detected by a differentially amplified quadrant photodiode and a Stanford Research SR830 lock-in amplifier combination. Scanning through different wavelengths gives us the complete absorption spectra.
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2

Comprehensive Optical Characterization of Perovskite Films

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Absorption spectra were recorded with a PerkinElmer LAMBDA 1050 spectrophotometer equipped with an integrating sphere to account for reflected and transmitted light. PDS measurements were acquired on a custom-built setup by monitoring the deflection of a fixed wavelength (670 nm) laser probe beam following absorption of each monochromatic pump wavelength by a thin film immersed in an inert liquid FC-72 Fluorinert (3M Company). PL quantum yield measurements were taken by mounting perovskite films or encapsulated device stacks in an integrating sphere and photoexciting with a 532-nm continuous-wave laser. The laser and the emission signals were measured and quantified using a calibrated Andor iDus DU490A InGaAs detector for the determination of PLQE.
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3

Photothermal Deflection Spectroscopy Setup

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Our home-built PDS setup uses a monochromatic pump beam which is directed on the sample (film on Spectrosil substrate). Absorption produces a thermal gradient near the sample surface via non-radiative relaxation induced heating. This results in a refractive index gradient in the area surrounding the sample surface. This refractive index gradient is further enhanced by immersing the sample in an inert liquid FC-72 Fluorinert (3M Company) which has a high refractive index change per unit change in temperature. A fixed wavelength CW laser probe beam is passed through this refractive index gradient producing a deflection proportional to the absorbed light at that particular wavelength, which is detected by a photo-diode and lock-in amplifier. Scanning through different pump wavelengths builds up the absorption spectra.
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4

Optical Absorption Spectroscopy Techniques

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Reflection-corrected ultraviolet–visible absorption spectra were recorded using a PerkinElmer Lambda 750 spectrophotometer. For the photothermal deflection spectroscopy, a monochromatic pump beam was shined on to the sample (film on Quartz substrate), which on absorption produces a thermal gradient near the sample surface via non-radiative relaxation-induced heating. This results in a refractive index gradient in the area surrounding the front of the sample surface. This refractive index gradient is further enhanced by immersing the sample in an inert liquid FC-72 Fluorinert (3M Company), which has a high refractive index change per unit change in temperature. A fixed wavelength CW probe laser beam is passed through this refractive index gradient producing a deflection, which is proportional to the light absorbed in the sample at that particular wavelength, which is further detected by a photodiode and lock-in amplifier combination.
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5

Photothermal Deflection Spectroscopy

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For PDS measurements, a monochromatic pump light beam is shined on the sample [film on quartz substrate immersed in an inert liquid FC-72 Fluorinert (3M Company)], which, on absorption, produces a thermal gradient near the sample surface via nonradiative relaxation and induces heating. A fixed-wavelength continuous-wave laser probe beam is passed through this refractive index gradient, producing a deflection proportional to the absorbed light at that particular wavelength, which is detected by a photodiode and lock-in amplifier combination. Scanning through different wavelengths produces a complete absorption spectrum.
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6

Photothermal Deflection Spectroscopy: Ultrasensitive Absorption Analysis

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Photothermal deflection
spectroscopy (PDS) is an ultrasensitive absorption measurement technique
that detects heating of the sample due to the nonradiative relaxation
of absorbed light and is insensitive to reflection and scattering.
PDS enables the detection of absorbance signals with 5–6 orders
of magnitude weaker than the band edge absorption.36 (link) For the measurements, the sample (film on quartz substrate)
was illuminated with a monochromatic pump beam. Light absorption leads
to a thermal gradient near the sample surface via non-radiative relaxation
induced heating. This results in a refractive index gradient in the
area surrounding the sample surface. This refractive index gradient
is further enhanced by immersing the sample in an inert liquid FC-72
Fluorinert (3M Company), which has a high refractive index change
per unit change in temperature. A fixed wavelength cw laser probe
beam was passed through this refractive index gradient, producing
a deflection proportional to the absorbed light at that particular
wavelength, which is detected by a photodiode and lock-in amplifier
combination. Scanning through different wavelengths gives us the complete
absorption spectra. Because this technique makes use of the non-radiative
relaxation processes in the sample, it is immune to optical effects
like interference and scattering.
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7

SEM Imaging of Calu-3 and S. aureus

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Scanning electron microscopy (SEM) of Calu-3 – S. aureus co-cultures were performed as previously described (Starner et al., 2006 (link)). Briefly, samples were fixed in 1% osmium tetroxide (EMS) dissolved in perfluorocarbon (Fluorinert FC-72; 3M, St. Paul, MN) for 2 hours at room temperature, then dehydrated by three washes with 100% ethanol for 15 minutes each. Samples were next washed in hexamethyldislazane (Ted Pella, Inc.; Redding, CA) twice for 15 minutes each, dried overnight and mounted on stubs before coating with argon, and imaged with a Hitachi S-4000 scanning electron microscope. Calu-3 cells are known to produce a thick mucus layer, which was visible in the SEM and obstructed viewing of the bacteria. Fields of view were selected on the edges where S. aureus cells were visible.
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8

Perovskite Thin Film Optical Characterization

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Samples were prepared in an identical fashion as used for the device fabrication on spectrosil quartz slides (which were cleaned with deionized water, acetone, and isopropanol followed by 10 min of oxygen plasma etch). The samples were kept in an airtight-sealed quartz cuvette filled with an inert liquid, Fluorinert FC-72 from 3M Corporation, which acts as the deflection medium with a large temperature-dependent refractive index. The perovskite thin films were excited with a modulated monochromatic light beam perpendicular to the plane of the sample obtained by a combination of a Light Support MKII 100W Xenon arc source and a CVI DK240 monochromator. The transverse probe beam was produced with a Qioptiq 670-nm fiber-coupled diode laser and passed as close as possible to the perovskite film surface. Beam deflection was measured using a differentially amplified quadrant photodiode and a Stanford Research SR830 lock-in amplifier, which is proportional to the absorption in the sample.
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9

Perovskite Thin-Film Photothermal Deflection

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For this particular measurement, we made use of quartz rather than the FTO-coated glass to minimize light absorption due to the substrate. During the measurement we kept the samples in a hermetically sealed quartz cuvette filled with an inert liquid, Fluorinert FC-72 from 3M Corporation, which acts as deflection medium with high-temperature-dependent refractive index. We excited the perovskite films from the quartz side with a modulated monochromated light beam perpendicular to the plane of the sample. Modulated monochromated light beam was produced by a combination of a Light Support MKII 100 W Xenon arc source and a CVI DK240 monochromator. The transverse probe beam was produced with Qioptiq 670-nm fibre-coupled diode laser and passed as close as possible to the perovskite-film surface. Beam deflection was measured using a differentially amplified quadrant photodiode and a Stanford Research SR830 lock-in amplifier.
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