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Jsm 6700f system

Manufactured by JEOL
Sourced in Japan

The JSM-6700F is a field emission scanning electron microscope (FE-SEM) system designed for high-resolution imaging and analysis of a wide range of samples. It features a Schottky-type field emission electron gun, providing a high-brightness electron beam for enhanced resolution and analytical capabilities. The JSM-6700F is capable of delivering detailed, high-quality images of samples at magnifications up to 800,000x, making it a versatile tool for various applications in materials science, nanotechnology, and other research fields.

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4 protocols using jsm 6700f system

1

Electrochemical Characterization of Modified ITO Electrodes

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The electrochemical characteristics of ITO, PCL@PPy/ITO, Cu/PCL@PPy/ITO, and CuO/PCL@PPy electrodes were examined by using cyclic voltammetry (CV), amperometric response (i-t), and electrochemical impedance spectra (EIS). Electrochemical experiments were performed with a CHI660C electrochemical workstation (Chen Hua Instruments Co., Shanghai, China). A platinum electrode and a saturated calomel electrode (SCE) were used as auxiliary and reference electrodes, respectively. The morphologies of the modified electrode surface were analyzed by field-emission scanning electron microscopy (FE-SEM, using a JSM-6700F system from JEOL, Tokyo, Japan) and transmission electron microscopy (TEM, JEOL JEM-2000 FX, Tokyo, Japan). The X-ray diffraction (XRD) patterns of CuO/PCL@PPy and PCL@PPy were recorded on a D/Max 2500V/PC X-ray diffractometer (Cu, 40 kV, 200 mA, Rigaku, Tokyo, Japan), at a scan rate of 0.05° s−1 with 2 ranging from 10° to 80°.
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2

Broccoli Structural and Chemical Analysis

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The scanning electronic microscopy (SEM) observation of broccoli samples was obtained using a JEOL JSM-6700F system (JEOL, Japan) to get SEM images. Before the measurement, samples were frozen in liquid nitrogen and dried in a vacuum freeze-dryer. Then they were coated with a thin layer of gold using a sputter-coater (Hitachi Science Systems, Japan).
The identified chemical composition, including water extracts, ethanol extracts, cellulose, hemicellulose, ASL, AIL, acetic acid, and ash of raw and SE samples, were determined according to the Laboratory Analytical Procedures of the National Renewable Energy Laboratory (NREL).
The FTIR spectroscopy study of raw and SE samples were measured by IS50 FTIR spectroscopy (Thermo Fisher, Massa, WA, USA). Each sample was prepared according to the potassium bromide technique. The region between 4000 and 500 cm−1 was recorded with a resolution of 4 cm−1 and 40 scans.
The thermogravimetric analysis (TGA) was performed with a TA instrument (Waters, LLC, New Castle, DE, USA) under a nitrogen flow. About 3 mg sample was placed in an aluminum crucible and heated from 30 °C to 600 °C at a speed of 10 °C/min.
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3

Nanoparticle Surface Morphology Analysis

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Samples were dropped onto double-sided sticky tape on the stub. The particles were then coated with a platinum layer using a JFC-1300 automatic fine platinum coater (JEOL, Tokyo, Japan) for 30 seconds in a vacuum. The surface morphologies of the NPs were observed by a field emission scanning electron microscope (JSM-6700F system; JEOL).
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4

Nanomaterial Surface Morphology Analysis

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The surface morphology of NPs was examined by field-emission scanning electron microscopy (FESEM) using a JEOL JSM-6700F system operated at a 5.0 kV accelerating voltage. To prepare samples for FESEM, the particles were fixed on the stub by a double-sided sticky tape and then coated with platinum layer by JFC-1300 automatic fine platinum coater (JEOL, Tokyo, Japan) for 60 seconds.
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