The largest database of trusted experimental protocols

8 protocols using s 4800

1

Characterization of Nanoparticles by Advanced Microscopy and Spectroscopy

Check if the same lab product or an alternative is used in the 5 most similar protocols
Transmission electron microscopy (TEM), high-resolution transmission electron microscopy (HRTEM), and high-angle annular dark-field images in the scanning TEM (HAADF-STEM) measurements were taken on JEM-2100F microscope (JEOL, Japan) operated at 200 kV. Field-emission scanning electron microscopy (FESEM) images were conducted on a Hitachi Model S-4800 and Gemini Ultra55 (Zeiss). Samples for TEM and FESEM tests were prepared by drying the nanoparticles on amorphous carbon-coated copper grids. Tridium). Nitrogen adsorption-desorption measurements were conducted to obtain information on the porosity. The measurements were conducted at 77 K with ASAP 2420 and Micromeritcs Tristar 3020 analyzer (USA). Dynamic light scattering (DLS) analysis was conducted on a Malvern ZS90 with a He, Ne laser (633 nm, 4 mW). Confocal fluorescence images were obtained by an LSM 710 confocal laser scanning microscope (Carl Zeiss SMT Inc., USA). Flow cytometry analysis was performed by an Accuri C6 flow cytometer (BD Biosciences, USA).
+ Open protocol
+ Expand
2

Surface Wettability and Durability Evaluation

Check if the same lab product or an alternative is used in the 5 most similar protocols
The contact angles of the samples were tested at room temperature using a contact angle meter (DSA100, KruSS, Hamburg, Germany), which in turn allowed observation of the micro-nanostructure on the surface of the specimens, using an S-4800 cold field emission scanning electron microscope (SEM; Zeiss SIGMA HD, Jena, Germany) to observe the micro-nanostructure on the specimens, using a medium of deionized water with a droplet volume of 2 uL. Five different locations were selected and averaged. Next, the hardness of the specimens was measured using a microhardness tester (Wilson Hardness 401MVD, Wilson, Chicago, IL, USA) to measure the microhardness of the specimen at five different locations and the average value was taken as the hardness value of the specimen. Finally, the WCA and SA of the specimens were measured by applying pressure to the specimens with a 200 g weight and moving them over a 1000-mesh sandpaper with a 15 cm cycle, for a total of 10 cycles, to reflect the strength of their durability properties by the change in WCA and SA.
+ Open protocol
+ Expand
3

Comprehensive Characterization of Prepared Sample

Check if the same lab product or an alternative is used in the 5 most similar protocols
The morphology
of the prepared sample
was analyzed by field-emission scanning electron microscopy (FESEM,
Hitachi S-4800 and Zeiss Merlin compact) and field-emission transmission
electronic microscopy (FETEM) (JEOL-2100F, JEOL Ltd., Japan). Elemental
distribution maps were collected by energy-dispersive spectrometry
(EDS, Bruker Xflash 6100) using an accelerating voltage of 15 kV.
Powder X-ray diffraction (PXRD) was performed using an X-Pert3 powder
(PANalytical, the Netherlands) diffractometer with Cu Kα1 (λ
= 1.5406 Å) radiation. X-ray photoelectron spectroscopy (XPS,
Al Kα radiation, and hν = 1486.6 eV)
was performed to reveal the chemical compositions and valence state
using the C 1s peak of the C–C and C–H bonds located
at 284.8 eV as reference. The CasaXPS software was adapted to conduct
the peak fitting. Thermogravimetric–mass spectrometric (TG-MS)
analysis was carried out using an STA449C/Qms 403C. The Raman spectra
of the prepared catalysts were collected with Jobin Yvon-Horiba LabRam
ARAMIS systems with 532 nm excitation lasers. A Micromeritics ASAP2020
device (at 77 K) was employed to perform the N2 adsorption–desorption
test. Infrared (IR) spectra were collected using a Fourier transform
infrared spectrometer (Nicolet is50, ThermoFisher Co.).
+ Open protocol
+ Expand
4

Microparticle Characterization by SEM and TEM

Check if the same lab product or an alternative is used in the 5 most similar protocols
10 μl of laser particle suspensions in water were added and air-dried on silicon wafer chips for scanning electron microscopy (SEM), and formvar-carbon coated nickel mesh grids (Electron Microscopy Sciences) for transmission electron microscopy (TEM). TEM images were obtained using a JEOL JEM 1011 transmission electron microscope at 80 kV. SEM characterization was performed on a Hitachi S-4800 and a Zeiss Ultra Plus Field-Emission microscopes at 2 keV. For cross-sectional viewing, coated microdisks were first milled with a focused Ga+ beam using a dual-beam SEM/FIB tool (Helios Nanolab, FEI Company). Energy-dispersive X-ray spectroscopy and mapping was performed on a Zeiss Supra55VP Field Emission microscope at 8 keV.
+ Open protocol
+ Expand
5

3D Imaging and Quantification of Single Cells and GSCs

Check if the same lab product or an alternative is used in the 5 most similar protocols
Image capturing and Z-stack acquisition were performed using Confocal 2 Zeiss LSM 5 Live DUO for the single cells (Figs. 3a and 5a) and Widefield 1 – Zeiss Axioimager Z1/ Zen (with an apotome) microscopes for GSCs NS left to migrate for 5 days (Figs. 2a,b and 4e). Imaris × 64 8.1.2 software has been used for 3D image reconstitution. Quantifications were done using ZEN software. SEM images were performed using Hitachi S4800, Zeiss EVO HD15 (Fig. 1c).
+ Open protocol
+ Expand
6

Comprehensive Characterization of Graphene Aerogels

Check if the same lab product or an alternative is used in the 5 most similar protocols
The structure and morphology were investigated by optical microscopy, SEM, HR-SEM, HR-TEM, and atomic force microscopy on ZEISS Axio Scope, Hitachi S4800, ZEISS Utral 55, JEM-2100, and VEECO Multimode systems, respectively. To determine the accurate wall thickness by HR-TEM, the GAs were embedded with epoxy resin and then sliced ultrathin for further observation. The homemade stage with manual step length was used to observe the structure of GAs during compression and bending. In situ SEM observation of GAs during compression and bending was manipulated by scanning at different strain states with a retractable sample holder.
The compressive tests were performed on a microcomputer control electronic universal testing machine (RGWT-4000-20, REGER). The Instron Legend 2344 machine is used for tensile, tear, and peel tests. Shear tests were taken on the HAAKE RS6000 machine. The change of electrical properties of GA sensors was evaluated by the combination of mechanical testing systems and the Keithley 2400 Source Meter.
+ Open protocol
+ Expand
7

Microparticle Characterization by SEM and TEM

Check if the same lab product or an alternative is used in the 5 most similar protocols
10 μl of laser particle suspensions in water were added and air-dried on silicon wafer chips for scanning electron microscopy (SEM), and formvar-carbon coated nickel mesh grids (Electron Microscopy Sciences) for transmission electron microscopy (TEM). TEM images were obtained using a JEOL JEM 1011 transmission electron microscope at 80 kV. SEM characterization was performed on a Hitachi S-4800 and a Zeiss Ultra Plus Field-Emission microscopes at 2 keV. For cross-sectional viewing, coated microdisks were first milled with a focused Ga+ beam using a dual-beam SEM/FIB tool (Helios Nanolab, FEI Company). Energy-dispersive X-ray spectroscopy and mapping was performed on a Zeiss Supra55VP Field Emission microscope at 8 keV.
+ Open protocol
+ Expand
8

Comprehensive Characterization of Synthesized Products

Check if the same lab product or an alternative is used in the 5 most similar protocols
The crystal structure, morphologies, chemical compositions, and chemical state of the as-synthesized products were studied via X-ray diffraction (XRD, X'Pert Pro MPD system, Cu Kα, λ = 0.154 nm), X-ray photoemission spectroscopy (XPS, ESCALAB MK II, Al Kα photon source, C 1s 284.8 eV), field-emission scanning electron microscopy (FESEM, HITACHI, S4800 and Carl Zeiss Supra 55 Ultra SEM), and transmission electron microscopy (TEM, JEOL 2200F with a field emission gun and an accelerating voltage of 200 kV). The specimen for the TEM study was prepared by dispersing a drop of alcohol solution containing the as-synthesized product onto a porous carbon film supported on a copper grid, and it was dried in a vacuum drying oven. Thermogravimetric and differential scanning calorimetry analyses were performed using a thermal analysis instrument (NETZSCH STA 449F3). The specific surface areas of the products were determined via N 2 adsorption-desorption isotherm measurements at 77 K (Micrometrics, ASAP 2020).
+ Open protocol
+ Expand

About PubCompare

Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.

We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.

However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.

Ready to get started?

Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required

Sign up now

Revolutionizing how scientists
search and build protocols!