S 4800
The S-4800 is a high-resolution scanning electron microscope (SEM) manufactured by Zeiss. It is designed to provide detailed, high-quality images of a wide range of materials and samples. The S-4800 features a field emission electron gun and advanced imaging capabilities, enabling users to capture precise, high-resolution images at the nanoscale level.
Lab products found in correlation
8 protocols using s 4800
Characterization of Nanoparticles by Advanced Microscopy and Spectroscopy
Surface Wettability and Durability Evaluation
Comprehensive Characterization of Prepared Sample
of the prepared sample
was analyzed by field-emission scanning electron microscopy (FESEM,
Hitachi S-4800 and Zeiss Merlin compact) and field-emission transmission
electronic microscopy (FETEM) (JEOL-2100F, JEOL Ltd., Japan). Elemental
distribution maps were collected by energy-dispersive spectrometry
(EDS, Bruker Xflash 6100) using an accelerating voltage of 15 kV.
Powder X-ray diffraction (PXRD) was performed using an X-Pert3 powder
(PANalytical, the Netherlands) diffractometer with Cu Kα1 (λ
= 1.5406 Å) radiation. X-ray photoelectron spectroscopy (XPS,
Al Kα radiation, and hν = 1486.6 eV)
was performed to reveal the chemical compositions and valence state
using the C 1s peak of the C–C and C–H bonds located
at 284.8 eV as reference. The CasaXPS software was adapted to conduct
the peak fitting. Thermogravimetric–mass spectrometric (TG-MS)
analysis was carried out using an STA449C/Qms 403C. The Raman spectra
of the prepared catalysts were collected with Jobin Yvon-Horiba LabRam
ARAMIS systems with 532 nm excitation lasers. A Micromeritics ASAP2020
device (at 77 K) was employed to perform the N2 adsorption–desorption
test. Infrared (IR) spectra were collected using a Fourier transform
infrared spectrometer (Nicolet is50, ThermoFisher Co.).
Microparticle Characterization by SEM and TEM
3D Imaging and Quantification of Single Cells and GSCs
Comprehensive Characterization of Graphene Aerogels
The compressive tests were performed on a microcomputer control electronic universal testing machine (RGWT-4000-20, REGER). The Instron Legend 2344 machine is used for tensile, tear, and peel tests. Shear tests were taken on the HAAKE RS6000 machine. The change of electrical properties of GA sensors was evaluated by the combination of mechanical testing systems and the Keithley 2400 Source Meter.
Microparticle Characterization by SEM and TEM
Comprehensive Characterization of Synthesized Products
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