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Spectrum 100 series ftir spectrometer

Manufactured by PerkinElmer
Sourced in France, United States

The Spectrum 100 Series FTIR spectrometer is a high-performance Fourier-transform infrared spectrometer designed for a wide range of analytical applications. It features a compact and robust design, providing reliable and accurate measurements across various sample types and industries.

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5 protocols using spectrum 100 series ftir spectrometer

1

Nanomaterial Characterization via Spectroscopy

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Attenuated total reflection (ATR) Fourier transform infrared (FT-IR) spectroscopy was performed using a Perkin-Elmer Spectrum 100 series FT-IR spectrometer equipped with a universal ATR sampling accessory. Ultraviolet–visible (UV-vis) studies were performed on a Varian Cary 4000 UV-vis spectrophotometer. TEM characterisation was carried out by a FEI Philips Tecnai 20 TEM under an accelerating voltage of 200 kV. Samples were prepared by applying one drop of the dispersion onto a holey R carbon-coated copper TEM grid (400 mesh) drying overnight. DLS and ZP measurements were performed on a Malvern Zeta-sizer NS90 instrument.
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2

Comprehensive Analytical Characterization of Composite Films

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FTIR spectra (from 450 to 4000 cm -1 ) were recorded on a Spectrum 100 Series FTIR spectrometer (Perkin Elmer, MA) at resolution of 2 cm -1 by the KBr method. Each spectrum was an average of 64 individual spectra. X-ray diffraction (XRD) measurements were taken on a Rigaku MiniFlex II diffractometer utilizing the Ni filtered Cu Kα radiation (1.54059 Å). The voltage and current of the X-ray tube were 30 kV and 15mA respectively. The samples were measured within the 2θ angle range from 2.0 to 40.00. The scan rate was 5° per minute. Data processing procedures were performed with the Jade 8 program package. 12, 13, 14, 15, 16, 17, 18, 19, 20 X-ray photoelectron (XPS) spectra were taken on a HP 5950 A ESCA spectrometer with Al monochromatic source and a flood gun used for charge suppression. The surface and cross-sectional morphologies of the composite films were examined under vacuum with a JEOL JSM-6510LV/LGS Scanning Electron Microscope with standard secondary electron (SEI) and backscatter electron (BEI) detectors. Prior to SEM examination, the film specimens were made conductive by applying a 20 nm gold-palladium-coating onto their surfaces using an Emitech K575x Peltier Cooled Sputter Coater (Emitech Products, TX).
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3

Synthetic Procedures for Organic Compounds

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All reagents were purchased from commercial suppliers and used without further purification. All reactions were monitored by thin-layer chromatography with aluminum plates (0.25 mm) precoated with silica gel 60 F254 (Merck KGaA, Darmstadt, Germany). Visualization was performed with UV light at a wavelength of 254 nm. Purifications were conducted with a flash column chromatography system (PuriFlash, Interchim, Montluçon, France) using stepwise gradients of petroleum ether (also called light petroleum) (PE) and dichloromethane (DCM) as the eluent. Melting points were measured with an SMP3 Melting Point instrument (STUART, Bibby Scientific Ltd., Roissy, France) with a precision of 1.5 °C. IR spectra were recorded with a Spectrum 100 Series FTIR spectrometer (PerkinElmer, Villebon S/Yvette, France). Liquids and solids were investigated with a single-reflection attenuated total reflectance (ATR) accessory; the absorption bands are given in cm−1. NMR spectra (1H, 13C and 19F) were acquired at 295 K using an AVANCE 300 MHz spectrometer (Bruker, Wissembourg, France) at 300, 75 and 282 MHz. Coupling constant J was in Hz and chemical shifts were given in ppm. Mass (ESI, EI and field desorption (FD) were recorded with an LCP 1er XR spectrometer (WATERS, Guyancourt, France). Mass spectrometry was performed by the Mass Spectrometry Laboratory of the University of Rouen.
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4

General Experimental Procedures for Organic Synthesis

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All reactions were conducted under an inert atmosphere of dry nitrogen. Dry solvents were purchased from Sigma-Aldrich and used without further purification. Unless otherwise stated, reagents were commercially available and used as purchased. Chemicals were obtained from Sigma-Aldrich, Acros, Alfa-Aesar, TCI and solvents were purchased from Fisher Scientific. TLC was performed with Merck TLC Silicagel60 F254 plates with detection under UV light at 254 nm. Silica gel (230–400 mesh, Silicycle) was used for flash chromatography. The 1H NMR and 13C{1H} NMR spectra were obtained using a Brüker AM-500 Fourier-transform NMR spectrometer at 500 and 125 MHz, respectively. Chemical shifts are reported in units of parts per million (ppm) downfield from tetramethylsilane (TMS, δ 0.00 ppm) for 1H NMR and CDCl3 (δ 77.16 ppm) for 13C{1H} NMR. All coupling constants are reported in hertz. The infrared spectra were obtained with KBr plates using a Perkin-Elmer Spectrum 100 Series FTIR spectrometer. High resolution mass spectrometry (HRMS) data were obtained on a Waters LC-TOF mass spectrometer (model LCT-XE Premier) using chemical ionization (CI) or electrospray ionization (ESI) in positive or negative mode, depending on the analyte.
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5

Structural Analysis of Polymeric Materials

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Molecular structural changes in the polymer backbone may alter the inherent chain stability and therefore affect the physicochemical and physicomechanical properties of the selected polymer type for the intended purpose. The molecular structure of native polymers (CHT, PVP, PNIPAAm) the non-cross-linked, and cross-linked C–P–N hydrogel, blank micelles, and drug-loaded micelles were analyzed using FTIR spectroscopy to elucidate any variations in vibrational frequencies and subsequent polymeric structure resulting from drug-co-polymer interaction during nanostructure and hydrogel formation. Samples were analyzed in triplicate at high resolution with scans ranging from 4000 to 400 cm−1 on a PerkinElmer Spectrum 100 Series FTIR spectrometer coupled with Spectrum FTIR research grade software (Perkin Elmer Life and Analytical Sciences Inc., Hopkinton, MA, USA).
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