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Vertex 80 80 v ftir spectrometer

Manufactured by Bruker
Sourced in Germany, United States

The VERTEX 80/80 v FTIR spectrometer is a Fourier Transform Infrared (FTIR) spectrometer manufactured by Bruker. It is designed to perform infrared spectroscopy analysis. The instrument uses an interferometer to generate and detect infrared radiation, which is then used to analyze the composition and structure of various materials.

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4 protocols using vertex 80 80 v ftir spectrometer

1

Multimodal Analysis of Wood Microstructure

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The cross section was flattened with a sliding slicer (consistent with the section position) and lyophilized. It was photographed and observed with the environmental scanning electron microscope FEI Quanta200 after metal spraying. In the meantime, the chemical composition of the micro area was analyzed by EDS. A 100 μm wood slice that had the same position as the slice was prepared, lyophilized and tested by a Bruker VERTEX 80/80 v FTIR spectrometer. The spectrometer was adjusted to mid-infrared reflection mode (ATR). The spectral resolution was set to 4 cm−1. It was scanned 16 times. Then, 4 mm × 4 mm × 1 mm (radial direction × tangential direction × longitudinal direction) wood chips were made with the remaining wood after slicing, and they were dried by lyophilizer. A wide-scan was performed on each slice with an AXIS UltraDLD photoelectron spectrometer equipped with an Al/Ag monochromatic dual-anode X-ray source at 600 W. A narrow scan was conducted after confirming the presence of C, Si, O, K and Ca, and the energy spectrum data were recorded. All the data were analyzed by Excel 2016 and plotted by Origin 2016.
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2

FTIR Analysis of Nanofiber Encapsulation

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Fourier transform infrared (FTIR) spectroscopy of samples in the range of 500–4000 cm−1 was conducted by using a Bruker Optics VERTEX 80/80v FTIR spectrometer (Ettlingen, Germany) with a resolution of 0.06 cm−1. The appearance of related characteristic functional groups observed by FTIR proved that the healing agent was successfully encapsulated into the nanofibers.
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3

Characterization of Carbonate-Substituted Hydroxyapatite

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The morphology and microstructure of CHAP were analyzed by Transmission Electron Microscope (TEM) on the instrument of Hitachi H-7650. The images were recorded at 200 kV in the bright field mode along with the corresponding diffraction patterns. The material composition and structure were studied by X-ray diffraction (XRD) on a Philips Analytical X-Ray B.V. with the use of Ni-filtered Cu Kα source In addition, typical apatites (PDF: 72–1243) was used as standard for comparison and inspection. The location of CO32- was analyzed by Fourier Transform infrared spectroscopy (FTIR), and the FTIR spectra in the range of 4000–400 cm-1 was recorded as KBr pellets with a VERTEX 80/80v FT/IR Spectrometer (Bruker).The CO32- doping state in the CHAP lattice was investigated by X-ray photo electron spectroscopy (XPS) of Thermo escalab 250XI electron spectrometer fitted with an Al Kα source (soft X-ray source at 1486.6 eV, which is non-monochromatic). The anode was operated at 150 W. The binding energy shifts due to surface charging which were corrected with using the C 1s level at 284.8 eV, as an internal standard.
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4

Structural Characterization of PCL Scaffolds

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Structural characterization of the porous PCL scaffold, the drug-coated porous PCL scaffold, and the drug-released porous PCL scaffold were carried out by Fourier Transform Infrared Spectroscopy (FT-IR) using a Bruker (VERTEX 80 & 80v) FT-IR spectrometer equipped with a vacuum (Billerica, MA USA). The spectra were recorded at ambient temperature between 400 and 4000 cm−1.
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