Scanning electron microscopy (SEM) (Hitachi S 5200) is performed to characterize the morphology of the multi-functionalized nanostructures. The samples are loaded onto aluminum stands and gold coated for SEM. Energy-dispersive X-ray spectroscopy (EDX) is carried out to determine the elemental composition of irradiated silicon. Micro-raman spectroscopy as well as X-Ray photon spectroscopy (Thermo scientific K-alpha) is used further to study surface composition quantitatively and qualitatively. X-ray diffraction(Siemens D5000 conventional theta/2theta diffractometer) is used as a secondary tool to confirm elemental composition.
D5000 conventional theta 2theta diffractometer
Manufactured by Siemens
The D5000 conventional theta/2theta diffractometer is a laboratory instrument designed for X-ray diffraction analysis. It is capable of performing basic powder diffraction measurements to determine the crystal structure and phase composition of solid materials.
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Lab products found in correlation
2 protocols using d5000 conventional theta 2theta diffractometer
1
Multi-Technique Characterization of Functionalized Nanostructures
2
Comprehensive Surface Analysis of Phase-Functionalized Silicon
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Scanning electron microscopy (SEM) (Hitachi S 5200) is performed to characterize the morphology of the phase-functionalized silicon surfaces. The samples are loaded onto aluminum stands and gold coated for SEM. Following SEM, Energy-dispersive X-ray spectroscopy (EDX) is carried out to determine the elemental composition of irradiated silicon. Micro-raman spectroscopy as well as X-Ray photon spectroscopy (Thermo scientific K-alpha) is used further to study surface composition quantitatively and qualitatively. X-ray diffraction (Siemens D5000 conventional theta/2theta diffractometer) is used as a secondary tool to confirm elemental composition.
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