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Spectrum one ft ir spectrophotometer

Manufactured by PerkinElmer
Sourced in United States

The Spectrum One FT-IR spectrophotometer is a laboratory instrument designed for infrared spectroscopy analysis. It utilizes Fourier Transform Infrared (FT-IR) technology to measure the absorption and transmission of infrared light by a sample, providing information about its molecular composition and structure.

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34 protocols using spectrum one ft ir spectrophotometer

1

FTIR Spectroscopy of Samples

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A Spectrum One FTIR spectrophotometer (64 scans at a resolution of 4 cm−1) (Perkin Elmer, Wellesley, MA, USA) equipped with a single reflection MIRacleTM ATR accessory (Pike Technologies, Madison, WI, USA) was used for Fourier transform infrared (FTIR) mid-IR spectroscopy (650–4000 cm−1). The samples were pressed on an ATR crystal of ZnSe for the collection of the spectrum in transmittance mode, at least in triplicate.
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2

Physicochemical Characterization of Materials

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All chemicals and solvents were commercially available and used as received. The FT-IR spectra were recorded on a PerkinElmer Spectrum One FT-IR spectrophotometer in the range of 4000–380 cm−1 using KBr disks. A PerkinElmer 2400 Series II CHNS/O analyzer was used for elemental analyses (C, H, and N). Thermogravimetric analyses (TGA) were performed in the range of 35–750 °C under a nitrogen atmosphere at a heating rate of 10 °C min−1 using a PerkinElmer Pyris Diamond thermogravimetric/differential thermal analyzer. The powder X-ray diffraction (PXRD) patterns were obtained in the range from 5 to 50° with 0.026 per step in 2θ angles on a PANalytical EMPYREAN with monochromatic CuKα radiation. The UV-vis diffuse reflectance spectra were recorded on a PerkinElmer Lambda2S spectrophotometer (400–1100 nm). Desktop scanning electron microscopes SNE-4500M with an acceleration voltage of 20 kV were used to obtain scanning electron microscopy (SEM) images. The SEM samples were prepared by placing a sample on a carbon conductive tape and then the samples were coated with a thin film of gold before being measured.
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3

ATR-FTIR Analysis of Material Samples

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ATR-FTIR spectra with 4 cm-1 resolution were obtained using Perkin Elmer Spectrum One FT-IR Spectrophotometer at room temperature. Transmittance was recorded from 650 to 4000 cm-1 wavenumbers with an accumulation of 32 scans.
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4

Spectroscopic Analysis of Organic Compounds

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Melting points were detected by a Sanyo Gallenkamp melting point apparatus. A JASCO P-1020 digital polarimeter was used to determine optical rotations. The UV spectra were obtained using an Agilent 8453 UV-visible spectrophotometer. A PerkinElmer Spectrum One FT-IR spectrophotometer was used to acquire the IR spectra. A Varian Mercury Plus spectrometer (400 MHz) was used to measure the NMR spectra. HRESIMS was performed on a Micromass Q-TOF 2 hybrid quadrupole time-of-flight (Q-TOF) mass spectrometer. Flash column chromatography (FCC) was performed by using silica gel less than 0.063 mm. Analytical thin-layer chromatography (TLC) was accomplished on Merck Si gel 60 F254 plates.
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5

Cellulose Acetate Functionalization Protocol

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Cellulose acetate (medium Mn ∼ 30.000, 39.3–40.3 wt % acetyl)
was obtained from Sigma Aldrich, and the other starting materials
were purchased from Alfa Aesar (acryloyl chloride, 1-eicosanethiol,
1-hexadecanethiol), Fluka (1-octadecanethiol), Sigma Aldrich (butyl
3-mercaptopropionate, 1-dodecanethiol), and TCI (ethyl thioglycolate).
CAA was prepared according to a literature procedure.17 (link) Infrared (IR) spectra: Perkin-Elmer Spectrum One FT-IR
spectrophotometer with an ATR-sampling unit. Nuclear magnetic resonance
(NMR) spectra: Bruker Avance 300 spectrometer, chemical shifts are
given in parts per million (δ) downfield from tetramethylsilane
as the internal standard.
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6

Comprehensive Physico-Chemical Characterization of Composite Materials

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Powder X-ray diffractometry (XRD) patterns were obtained using a D8 Advance X-ray diffractometer (Bruker Company, Germany). Fourier Transform Infra-Red (FT-IR) spectra were obtained using a Spectrum One FT-IR spectrophotometer (Perkin-Elmer, USA) at room temperature. Scanning electron microscope (SEM) images were obtained using a JSM6510LV scanning electron microscope (JEOL, Japan), and elemental analysis was performed using Energy Dispersive X-ray Spectroscopy (EDS) (JEOL, Japan). The thermal stability of the composites was investigated using a Thermo Gravimetric Analyzer (TGA) (TGA2, METTLER TOLEDO). N2 adsorption–desorption analysis was performed on an Accelerated Surface Area and Porosimetry System ASAP2020 (Micromeritics, USA). The surface area was estimated using the BET equation, and the pore size distribution was determined using the BJH model. Heavy metal ion concentrations were determined using inductively coupled plasma atomic emission spectroscopy (ICP-AES) (Optima 8000, Perkin-Elmer, USA).
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7

Comprehensive Material Characterization Protocol

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Powder X-ray diffraction (XRD) patterns were obtained using a D8 Advance X-ray diffractometer (Bruker Company, Germany). Fourier transform infrared (FT-IR) spectra were obtained using a Spectrum One FT-IR spectrophotometer (PerkinElmer, USA) at room temperature. Transmission electron microscopy (TEM) images were obtained on a Tecnai G20 microscope (FEI, America). Morphologies of the samples were observed by scanning electron microscopy (SEM) on a JSM6510LV scanning electron microscope (JEOL, Japan). The fluorescence measurements were recorded on an LS55 fluorescence spectrometer (PerkinElmer, America).
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8

Spectroscopic Characterization of Solid Complexes

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Infrared spectra of the solid samples were recorded on a PerkinElmer Spectrum-One FT-IR spectrophotometer by making KBr pellets. Powder X-ray diffraction patterns were recorded using a Bruker powder X-ray diffractometer D2 phaser. 1H-NMR spectra of complexes were recorded on a BRUKER Ascend-600 MHz NMR spectrometer using TMS as the internal standard. A PerkinElmer Lamda-750 spectrometer was used to record the solid-state UV-visible spectra by diffuse reflectance. Fluorescence emissions were measured in a Horiba Jobin Yvon Fluoromax-4 spectrofluorometer by taking definite amounts of solutions or definite amounts of solid samples and exciting at the required wavelength. Quantum yields were measured by taking definite amounts of solids and solutions and exciting at the required wavelength in a Horiba Jobin Yvon Fluoromax-4 spectrofluorometer by Petite integrating sphere method. The fluorescence emission (Ec) and the scatter (Lc) for the sample and blank (La and Ea) were recorded. From these spectral measurements (sample and blank), the quantum yields were calculated by using the equation φ = [(EcEa)/(LaLc)].
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9

Characterization of AvoSE-Capped Gold Nanoparticles

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The spectra of AvoSE–AuNPs were determined
using a POLARstar
Omega microplate reader (BMG Labtech, Offenburg, Germany) at a wavelength
range of 400–800 nm. The hydrodynamic diameter, poly-dispersity
index (PDI), and zeta potential (ζ-potential) of AuNPs were
determined using a Nano-ZS90 Zetasizer instrument (Malvern Instruments
Ltd., Malvern, UK) at a scattering angle of 90° at 25 °C.
The morphology and size of the AvoSE–AuNPs were determined
using a FEI Tecnai G2 20 field-emission gun HRTEM (Hillsboro,
OR, USA) operated in bright field mode at an accelerating voltage
of 200 kV. Fourier transform infrared (FTIR) analysis was performed
to determine the functional groups in AvoSE and AvoSE–AuNPs
using the PerkinElmer Spectrum One FTIR spectrophotometer (Waltham,
MA, USA). The AvoSE and AvoSE–AuNP dried samples were mixed
with KBR and scanned on FTIR over the range of 4000–400 cm–1 at 2 cm–1 resolution.
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10

Comprehensive Characterization of Nanomaterials

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Powder XRD patterns were recorded on a Bruker D8A25 diffractometer with Cu Kα radiation (λ = 1.54184 Å) operating at 30 kV and 25 mA. UV-vis spectra were collected on a Shimadzu UV-visible UV-2550 spectrometer. FTIR spectra of the framework vibrations were recorded on a Perkin Elmer Spectrum One FTIR spectrophotometer. The morphology and size of the crystals were imaged on a JEOL JSM-6510A scanning electron microscope (SEM). TEM images were obtained using a FEI Tecnai G20 at an accelerating voltage of 200 kV. HRTEM images were obtained using a FEI Titan G2 60-300 at an accelerating voltage of 200 kV. N2 adsorption/desorption isotherms were determined by a QuantachromeiQ-MP gas adsorption analyzer at 77.35 K. Before the nitrogen adsorption, the samples were degassed at 523 K for 3 h. The BET surface area was calculated based on the Brunauer–Emmett–Teller (BET) equation, and the pore distribution and total pore volume (at a relative pressure of P/P0 = 0.98) were calculated by the Barrett–Joyner–Halenda (BJH) method. Inductively coupled plasma (ICP) analysis was performed on a Perkin-Elmer Optima 3300Dv spectrometer. Elemental analyses (C, H, and N) were conducted on a Vario Micro elemental analyzer. Thermogravimetric analysis (TGA) was performed on a TASDTQ600 analyzer with a temperature-programmed rate of 10 K min–1 in air.
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