Copper TEM grids with a formvar-carbon support film (GSCU300CC-50, ProSciTech, Qld, Australia) were glow discharged for 60 s in an Emitech k950x with k350 attachment. GS-1 was diluted in water to 0.01 mM, 0.1 mM, 0.8 mM, and 1 mM. Four microlitre drops of GS-1 suspension was pipetted onto each grid, allowed to adsorb for at least 30 s and blotted with filter paper. Two drops of 2% uranyl acetate were used to negatively stain the particles blotting after 10 s each. Grids were then allowed to dry before imaging. Grids were imaged using a Joel JEM-2100 (JEOL (Australasia) Pty Ltd., Brookvale, Australia) transmission electron microscope equipped with a Gatan Orius SC 200 CCD camera (Scitek Australia).
Joel jem 2100
Manufactured by JEOL
Sourced in Australia, Japan
The JEOL JEM-2100 is a high-performance transmission electron microscope (TEM) designed for advanced materials research and analysis. It features a LaB6 electron source and a high-resolution objective lens, providing excellent image quality and resolution. The JEM-2100 is capable of operating at accelerating voltages up to 200 kV, enabling the examination of a wide range of specimen types.
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5 protocols using joel jem 2100
1
Characterization of GS-1 Nanoparticles by TEM
2
Negative Staining of Extracellular Vesicles
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Copper TEM grids with a formvar-carbon support film (GSCU300CC-50, ProSciTech, Qld, Australia) were glow discharged for 60 seconds in an Emitech k950x with k350 attachment. Two 5 µl drops of EV suspension were pipetted onto each grid, allowed to adsorb for at least 30 seconds and then blotted with filter paper. Two drops of 2% uranyl acetate were used to negatively stain the particle blottings after 10 seconds each time. Grids were then allowed to dry before imaging. Grids were imaged using a Joel JEM-2100 (JEOL Australasia Pty Ltd) transmission electron microscope equipped with a Gatan Orius SC 200 CCD camera (Scitek Australia).
3
Negative Staining of Nanoparticles for TEM
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Copper TEM grids with a formvar-carbon support film (GSCU300CC-50, ProSciTech, Qld, Australia) were glow discharged for 60 s in an Emitech k950x with k350 attachment. Then, 5 µL drops of sample suspension were pipetted onto each grid, allowed to adsorb for at least 30 s and blotted with filter paper. Two drops of 2% uranyl acetate were used to negatively stain the particles with excess negative stain removed by blotting with filter paper after 10 s each. Grids were then allowed to dry before imaging. Grids were imaged using a Joel JEM-2100 (JEOL (Australasia) Pty Ltd) transmission electron microscope equipped with a Gatan Orius SC 200 CCD camera (Scitek Australia).
4
Characterization of Ag NPs and Au NCs
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A Joel JEM-2100 (Japan Electron Optics Laboratory Co., Ltd., Japan) transmission electron microscope (TEM) was employed to obtain TEM images of Ag NPs and Au NCs. The TEM instrument was operated at 100 kV and 200 kV. Before being analyzed by the TEM, the Ag NP colloid was dripped onto a carbon-coated copper grid and air-dried at room temperature. All UV-Vis extinction spectra were recorded at 25 °C on a Hitachi U-5100 spectrophotometer (Hitachi Science & Technology, Japan) or a high-speed UV-Vis spectrometer (Flame, Ocean Optics, FL, USA), connected with the light source (DH-2000-BAL, Ocean Optics, FL, USA), using a quartz cuvette with an optical path of 1.0 cm.
5
Silver Nanoparticle Characterization Techniques
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A Joel JEM-2100 (Japan Electron Optics Laboratory Co., Ltd., Tokyo, Japan) transmission electron microscope (TEM) was employed to obtain TEM images of each sample. The TEM instrument was operated at 100 KV or 200 KV. Before analysis by TEM, 1 mL aliquots of silver colloids were added to 10 μL of 10−3 M 16-MHDA to prevent further shape transformation, then dripped onto a carbon-coated copper grid, and air-dried at room temperature. All UV–vis extinction spectra were recorded at 25 °C on a Hitachi U-2800 spectrophotometer (Hitachi Science & Technology, Tokyo, Japan) using a quartz cuvette with an optical path of 10 mm. Powder X-ray diffraction (XRD) was performed on a Bruker D8 Discover X-ray diffractometer with a Cu K radiation source, and the sample was deposited onto a glass slide.
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