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Afm 5500

Manufactured by Agilent Technologies
Sourced in United States

The AFM 5500 is an atomic force microscope (AFM) designed for high-resolution imaging and analysis of surface topography and properties. It utilizes a sharp cantilever tip to scan the sample surface, providing nanometer-scale resolution. The AFM 5500 is capable of operating in various imaging modes to capture detailed information about the sample.

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20 protocols using afm 5500

1

Characterization of TOLED Device Performance

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The current
density–voltage-luminance characteristics and EL spectra of
the TOLEDs were simultaneously characterized by a computer-controlled
programmable Keithley model 2400 power source and a Photo Research
PR655 luminance meter/spectrometer in ambient environment. Surface
morphologies were characterized by an atomic force microscope (AFM)
(Agilent, AFM 5500) operating in tapping mode. Optical transmittance
and absorption spectra of C60 and CuPc were recorded by
a HITACHI U-3900 UV–vis scanning spectrophotometer. Ultraviolet
photoemission spectroscopy (UPS) measurement was conducted to characterize
the highest occupied molecular orbital (HOMO) level of organic semiconductors
by a Thermo Scientific Escalab 250Xi ultra-high-vacuum system. The
UPS measurements were performed with an unfiltered He I (hv = 21.22 eV) gas discharge lamp and a total instrumental energy resolution
of 100 meV.
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2

Morphological Characterization of Organic Photovoltaic Devices

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The morphology of PBDTTT-E:PC71BM and PTB7:PC71BM active layers was characterized by atomic force microscopy (AFM-5500, Agilent) using the tapping mode. The current density–voltage (J–V) curve of the device was tested by using an electrochemical workstation (Chenhua, CHI760E) with a linear sweep voltammetry (LSV) method. A light source with an intensity of 100 mW/cm2 was corrected by a standard silicon solar cell before testing. The external quantum efficiency (EQE) test of the device was conducted according to the literature (Hu et al., 2021a (link)). Space charge-limited current measurement (SCLC) of PSC devices was performed using previous methods (Shang et al., 2020 (link)). All measurements were carried out at room temperature.
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3

Probing Nanomaterial Adhesion with AFM

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AFM 5500 (Agilent Technologies,
Chandler, AZ) was used to acquire the force tracing curves. Before
performing the force tracing test, the Au NCs attached to the AFM
tip were slowly moved to the contact point using a proportional-integral
(PI) control system with P = 0.001 and I = 0.001 (the error signal between the set point and the deviation
of the cantilever is 2.0 V). The feedback system was then turned off,
and the movement of the AFM tip was stopped. A small offset of the
cantilever deflection signal was collected by a 16-bit DA/AD card
(PCI-6361e, National Instruments). In this report, a 20 kHz data acquisition
sampling rate was applied and the high-frequency electronic noise
was filtered through a 100 low-pass filter. The sensitivity and the
spring constant of the AFM tip are determined based on previous report.31 (link) The force tracing tests were carried out in
2 mL of serum-free DMEM at 37 °C.
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4

Atomic Force Microscopy of Capsule Mechanics

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The mechanical curves and compressive modulus of a single capsule were tested using atomic force microscopy (Agilent AFM5500). The compressive modulus was calculated using the Sneddon model (Fig. 10) from the force–displacement curve. As for the Sneddon model, the relationship between F (force) and δ (deflection) is where α is the cone half-angle of the tip (the value was 18° in this experiment) and E* is the equivalent elastic modulus. Also, where E1 and E2 are the elastic moduli and v1 and v2 are the Poisson ratios of the tip and of the sample, respectively. In this system, EtipEsample; therefore, 26 (link) Because the Poisson ratios of the samples were unknown, the rule of mixture of composites was used in the calculations.
The Poisson ratio of the capsule was calculated by the Poisson ratios of the shell materials, bulk polyurethane (vf = 0.42) and silica nanoparticles (vm = 0.17). The rule of mixture of composites is where vf is the Poisson ratio of the matrix, vm is the Poisson ratio of the enhanced phase, and Vf is the matrix volume content, which can be calculated by the content and density of bulk polyurethane (ρf = 1.02 g m−3) and silica nanoparticles (ρm = 2.20 g m−3).
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5

Organic Semiconductor OFET Sensor for NO2 Detection

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The electrical characteristics of all the devices were measured with a Keithley 4200 sourcemeter (Tektronix, Shanghai, China) under ambient conditions at room temperature.
The morphologies of the organic semiconductor were characterized with atomic force microscopy (AFM) (Agilent, AFM 5500) in a tapping mode. The OFET sensor was stored in an airtight test chamber (approximately 0.02 L). Dry air and 100 ppm standard NO2 gases (anhydrous) were purchased from Sichuan Tianyi Science and Technology Co., Chengdu, China, and a mixture with the appropriate concentration was introduced into the test chamber by a mass flow controller (S48 300/HMT, Beijing Boriba Metron Instruments Co., Beijing, China). NO2 gas response characteristics of the OFET sensors were measured with a variation of drain-source current, which acted as a function of time. Also, the transfer curves in various concentrations of NO2 were systematically characterized.
The field-effect mobility of device was extracted in the saturation regime from the highest slope of |IDS|1/2 vs. VG plots by using Equation (1):
IDS=(WCi2L)μ(VGVT)2
where L and W are the channel length and width, respectively. Ci is the capacitance (per unit area) of the dielectric, VG is the gate voltage, and IDS is the drain-source current.
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6

Nanomaterial Characterization Techniques

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TEM analyses of BPNS and BP@SDF1-α were performed with an H-7500 transmission electron microscope (Hitachi Scientific Instruments, Japan). AFM images were taken via an AFM 5500 instrument in the contact mode (Agilent Technologies, Inc., USA) at the concentration of 50 µg/mL in ddH2O. Raman spectra were recorded by using an InVia Raman microscope (Renishaw, UK). Zeta potential and hydrodynamic diameter measurements of BPNS materials in ddH2O at the concentration of 20 µg/mL were assayed with a Zeta-sizer (Malvern Nano series, Malvern, U.K.).
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7

Atomic Force Microscopy of Chromatin Arrays

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For atomic force microscopic experiments, an Agilent AFM 5500 instrument and silicon nitride cantilevers were used (force constant 25–75 N/m, resonant frequency 332 kHz). Imaging was done in air using the acoustic AC mode with an amplitude of ~10 nm and a set-point reduction of about 10%, scanning at 1 line per second. Immobilization of chromatin arrays on mica surface was done as follows. First, 1 μL of Sir3 protein solution (39 ng/μL) was added to the phosphate or Tris buffer (7 μL) followed by addition of 1 μL of chromatin array (10 ng/μL) and mixed gently, maintaining a ratio of 4 Sir3 molecules/nucleosome. For Sir3 BAH D205N experiments, BAH was added at 4 (data not shown) and 10 monomers per nucleosome as above. After 30 minutes, 0.5% glutaraldehyde solution (1 μL) was added to this mixture for crosslinking and incubated for 10 minutes. APTES was deposited on freshly cleaved mica substrate using vapor deposition. The crosslinked chromatin solution was diluted to 1 ng/μL and 3 μL was added to this APTES modified mica surface and after 5 minutes the surface was cleaned three times using 400 μL of buffer solution, dried carefully using argon gas and immediately used for imaging. To image only chromatin arrays, the first mixing step with Sir3 was omitted.
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8

Erythrocyte Membrane Characterization by AFM

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The AFM imaging and force spectroscopy of isolated erythrocytes and erythrocyte membranes were performed with AFM 5500 (Agilent Technologies, USA). All the images (512 × 512 pixels) were obtained at room temperature in PBS solution. Erythrocyte sizes and membrane heights were measured with PicoScan 5.3.3 software (Agilent Technologies, USA).
In force spectroscopy measurements, the AFM tips were functionalized with glutaraldehyde as described (Wang et al., 2010 (link)). For statistical analysis, thousands of force curves were recorded in different positions of the inner and outer leaflet of erythrocyte membranes. The force curves were processed with MathLab 7.9 (Math Works Inc.).
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9

Comprehensive Characterization of Perovskite Films

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Morphological investigation was done with a scanning electron microscope (Hitachi S-4800, Tokyo, Japan) and an atomic force microscope (Aglient Keysight AFM-5500, Santa Clara, CA, USA). Using an X-ray diffractometer (Bruker D8 Advance, Cu-Kα radiation of λ = 0.15406 nm), the crystallinity of the perovskite was investigated. The absorption spectrum was measured using a UV–Vis spectrophotometer (UV-2600). Using Edinburg PLS 980, the steady PL spectra of the produced perovskite films were examined. The TRPL decay of the perovskite films was measured using a transient-state spectrophotometer (Edinburg Ins. F900, Edinburg, UK) under a 485 nm laser. Under AM 1.5 G illumination with a power intensity of 100 mW cm−2, the J–V characteristic curves were measured with a source meter (Keithley 2400, Cleveland, OH, USA) using forward (−0.1 to 1.2 V) or reverse (1.2 to −0.1 V) scans from a solar simulator (XES-301S + EL-100). The delay duration was set to 10 ms, and the step voltage was set to 12 mV. The EQE was calculated using the QE-R system (Enli Tech., Atlanta GA, USA). The EIS measurement was carried out using an electrochemical workstation (Zahner Zennium, Kansas City, MI, USA).
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10

Characterization of MOF Nanoparticles

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A dynamic light scattering (DLS) instrument (Nano ZS90 Malvern Instruments, Worcestershire, UK) was used to determine the PDI, the size, and the zeta-potential. The samples for DLS were dispersed in water and evaluated in triplicate on DLS at 25 °C with a scattering angle of 90°. An atomic force microscope (AFM, 5500, Agilent, Santa Clara, CA, USA) was used to examine the morphology of the synthesized MOFs. The diluted samples were put onto a mica slide, allowed to dry at room temperature, and then examined under a microscope.
To analyze the possible interaction of VCM and MNS with MOFs, FT-IR analysis was performed. The minimum sample was ground with KBr to form an amorphous mixture, which was subsequently transformed into a translucent pallet using 200 psi pressure. The samples were analyzed in the range of 400–4000 cm−1.
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