density–voltage-luminance characteristics and EL spectra of
the TOLEDs were simultaneously characterized by a computer-controlled
programmable Keithley model 2400 power source and a Photo Research
PR655 luminance meter/spectrometer in ambient environment. Surface
morphologies were characterized by an atomic force microscope (AFM)
(Agilent, AFM 5500) operating in tapping mode. Optical transmittance
and absorption spectra of C60 and CuPc were recorded by
a HITACHI U-3900 UV–vis scanning spectrophotometer. Ultraviolet
photoemission spectroscopy (UPS) measurement was conducted to characterize
the highest occupied molecular orbital (HOMO) level of organic semiconductors
by a Thermo Scientific Escalab 250Xi ultra-high-vacuum system. The
UPS measurements were performed with an unfiltered He I (hv = 21.22 eV) gas discharge lamp and a total instrumental energy resolution
of 100 meV.