The Scanning electron microscope (SEM) and Transmission electron microscope (TEM) studies were carried out in a Zeiss Sigma 300 and a FEI TF20, respectively. The nitrogen adsorption-desorption isotherm (BET) was measured on the ASAP 2460 surface area and porosity analyzer. Thermal gravimetric analyses (TGA) was performed on a TGA 5500 thermoanalyzer, the sample was heated in a continuous-flow of N2 from 25 up to 800 °C with 10 °C/min. X-ray diffraction (XRD) analysis was performed by Bruker D8A X-ray diffractometer using Cu-Kα radiation (tube voltage: 40 kV; current: 40 mA; scan angle 2θ range: 10–80°; scan rate: 5°/min. Fourier transform infrared spectroscopy (FT-IR) was performed on a Thermo Scientific Nicolet 6700 Fourier transform infrared spectrometer, and the scanning range was 4000 cm−1–400 cm−1.
D8a x ray diffractometer
Manufactured by Bruker
Sourced in Germany
The D8A X-ray diffractometer is a versatile laboratory instrument designed for the analysis of crystalline materials. It utilizes X-ray diffraction techniques to provide information about the structure, composition, and properties of various solid-state samples. The core function of the D8A is to collect and analyze diffraction patterns generated when a sample is exposed to a focused X-ray beam, enabling the identification and characterization of the materials under investigation.
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Lab products found in correlation
4 protocols using d8a x ray diffractometer
1
Comprehensive Characterization of Material Samples
2
Microstructural Analysis of Ti-Zr-Ta-Si-Co-Sn BMG Foams
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The microstructure of Ti42Zr35Ta3Si5Co12.5Sn2.5 BMG foams was examined through X-ray diffraction (XRD) analysis by using the Bruker D8A X-ray diffractometer (Bruker, Bremen, Germany) with monochromatic Cu K𝛼 radiation. In addition, Ti42Zr35Ta3Si5Co12.5Sn2.5 BMG foams with 10% porosity were analyzed using a transmission electron microscope (TEM; JEOL JEM2100, Tokyo, Japan). The thin-foil specimen required for TEM analysis was prepared using a focused ion beam system (Versa 3D Dual Beam, FEI, Hillsboro, OR, USA).
3
Comprehensive Characterization of Material via TGA, FT-IR, XRD, and SEM
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Perform thermogravimetric analysis (TGA) on a TGA55 thermal analyzer, and heat the sample in a continuous-flow of nitrogen (flow rate is 80 mL/min) at a rate of 10 °C/min from 25 to 800 °C. Fourier transform infrared spectroscopy (FT-IR) was performed on a Thermo Scientific Nicolet 6700 Fourier transform infrared spectrometer, and the scanning range was 4000 cm− 1-400 cm− 1. X-ray diffraction (XRD) analysis was performed by Bruker D8A X-ray diffractometer using Cu-Kα radiation (tube voltage: 40 KV; current: 40 mA; scan angle 2θ range: 5 to 80°; scan rate: 5 °/min; wavelength: 0.15406 nm). The nitrogen adsorption-desorption isotherm (BET) was measured on the TriStar II 3flex surface area and porosity analyzer. And the Scanning electron microscope (SEM) studies were carried out in a Zeiss Merlin Compact.
4
Comprehensive Material Characterization
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Perform thermogravimetric analysis (TGA) on a TGA55 thermal analyzer, and heat the sample in a continuous-flow of nitrogen (flow rate is 80 mL/min) at a rate of 10 ℃/min from 25 to 800 ℃. Fourier transform infrared spectroscopy (FT-IR) was performed on a Thermo Scientific Nicolet 6700 Fourier transform infrared spectrometer, and the scanning range was 4000 cm -1 -400 cm -1 . X-ray diffraction (XRD)
analysis was performed by Bruker D8A X-ray diffractometer using Cu-Kα radiation (tube voltage: 40 KV; current: 40 mA; scan angle 2θ range: 5 to 80°; scan rate: 5 °/min; wavelength: 0.15406 nm). The nitrogen adsorption-desorption isotherm (BET) was measured on the TriStar II 3flex surface area and porosity analyzer. And the Scanning electron microscope (SEM) studies were carried out in a Zeiss Merlin Compact.
analysis was performed by Bruker D8A X-ray diffractometer using Cu-Kα radiation (tube voltage: 40 KV; current: 40 mA; scan angle 2θ range: 5 to 80°; scan rate: 5 °/min; wavelength: 0.15406 nm). The nitrogen adsorption-desorption isotherm (BET) was measured on the TriStar II 3flex surface area and porosity analyzer. And the Scanning electron microscope (SEM) studies were carried out in a Zeiss Merlin Compact.
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