The data, recorded using an image plate, were collected by the IP Reader software with a PerkinElmer storage phosphor system. All data were normalized, and the background intensity and smeared intensity were removed using the SAXSquant 3.0 software for further analysis.
Pw3830 x ray generator
The PW3830 X-ray generator is a high-performance device designed for laboratory use. It produces X-rays for various analytical techniques. The generator provides a stable and reliable source of X-rays to support scientific research and industrial applications.
9 protocols using pw3830 x ray generator
SAXS Analysis of Starch Samples
The data, recorded using an image plate, were collected by the IP Reader software with a PerkinElmer storage phosphor system. All data were normalized, and the background intensity and smeared intensity were removed using the SAXSquant 3.0 software for further analysis.
X-Ray Diffraction Analysis of Crystalline Samples
in reflection using a Philips-Norelco wide-range goniometer and scintillation
counter, equipped with an Advanced Materials Research graphite focusing
monochromator. Cu Kα radiation (λ = 0.15418 nm) was produced
via a PANalytical PW3830 X-ray generator with a long-fine-focus Cu
tube. Angular calibrations were performed using a quartz reference
standard. Samples were deposited as a loose powder (∼0.5 mm
deep) onto carbon tape, supported on a glass microscope slide. Sample
crystallinity was assessed by the presence or absence of strong Bragg
reflections.35
Phase Transformation of SPTS Explored
The dynamic phase transformation process of SPTSs upon contacting with distilled water or PBS was observed with PLM at 37 ± 0.5 °C by observing the birefringence texture. SPTS@hard capsules of DOXY and MLX were withdrawn from distilled water and PBS respectively at different time intervals. The photographs were taken using a MD50 digital camera.
The crystalline structures of the SPTSs were characterized by the SAXS at 37 ± 0.5 °C. Samples were measured at 50 mA and 40 kV using a PW3830 X-ray generator (PANalytical) with the X-ray source of Cu Kα radiation (λ = 0.1542 nm). The intensity versus scattering factor (q) was recorded.
SAXS Analysis of Gel Structure
The relationship between q and θ was determined according to the following equation [30 (link)]:
where θ means the scattering angle.
Structural Analysis by SAXS
SAXS Analysis of Nanocomposite Films
λ is the wavelength and 2θ is the scattering angle. Each measurement was collected for 5 min. All I(q) data were normalized to have the uniform primary intensity at q = 0 for transmission calibration. Desmearing was necessary because of the line collimation.
SAXS Analysis of Lyotropic Liquid Crystals
Small-Angle X-ray Scattering of Starch Gels
SAXS Measurements of Hydrated Samples
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