Jem 6700f
The JEM-6700F is a high-resolution field emission scanning electron microscope (FE-SEM) designed for advanced materials analysis. It features a high-brightness field emission gun, high-resolution optics, and a range of advanced detectors to enable detailed imaging and characterization of a variety of samples.
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18 protocols using jem 6700f
Micro/Nano Characterization by SEM, TEM, and XRD
Comprehensive Material Characterization Protocol
Surface Morphology Analysis of 25-OCH3-PPD Complexes
Comprehensive Catalyst Characterization Techniques
Both the quantitative and qualitative analysis (MassHunter Workstation Software) of the oil samples were performed using a 5975C GC/MS (Agilent Technologies Inc) with a Triple Axis Detector and an HP-5 capillary column. Dilute oil samples were filtered through a 0.05 μm PCTE membrane filter. Sample injection volumes were 5 μL and the temperature program was set as follows: 50 °C to 300 °C (3 °C min−1). FAMEs and TG concentration were identified by the internal standard method and the NIST 98 mass spectrometry database. The acid value, HHVs and viscosity were determined via titration, bomb calorimetry and viscometry, respectively.
Structural and Luminescent Analysis of Phosphors
Anodization and Photoreduction of Titanium
Characterization of Biomaterials via SEM-EDS
Characterization of Biocatalyst Fibers
Characterization of CSP-A Morphology
Characterization of Ceramic Scaffold Porosity
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