D8 focus x ray

Fe ${}_3$ O ${}_4$ NPs (99.7%, 15–20 nm, US Research Nanomaterials Inc., Houston, TX, USA) were characterized by Transmission Electron Microscopy (TEM, Philips CM10, Philips Electron Optics, Eindhoven, The Netherlands), X-ray Diffractomatry (XRD, D8 FOCUS X-ray, Bruker AXS GmbH, Karlsruhe, Germany) at a power of 45 kV × 40 mA and UV-vis spectroscopy (GENESYS 10S UV-vis, Thermo Fisher Scientific, Madison WI, USA) for crystal structure morphology and their absorption at wavelength, $\lambda =810$ nm, respectively. The microstructure and the functional groups of the SNCs were studied using Scanning Electron Microscopy (SEM, FEI, Hillsboro OR, USA) and FTIR spectroscopy (Tensor 27, Bruker Inc., Madison, WI, USA) over the wavelength range of 0.6–3 $\mathsf{\mu }$ m ${}^{-1}$ , respectively. The SEM photographs were obtained at a magnification of 2k and an operating voltage of 10 kV.

PXRD patterns of all synthesized samples were recorded using a Bruker D8 Focus X-ray powder diffractometer using Cu K radiation (=0.154 nm) over a 2θ range of 3–65° with a step size of 0.02° and a step time of 1s. The nature of chemical bonding of the synthesized samples was determined using a Bruker Vertex 80 FTIR spectrometer, by spanning the range from 600 to 4000 cm⁻¹ using the attenuated total reflectance technique. The thermal behavior of the synthesized samples was studied by performing TGA (TA Instruments SDTQ600). The samples (10–15 mg) were heated from ambient temperature to 100 °C (ramp 10 °C/min) in a nitrogen environment (100 cm³/min N₂ flow rate). The particle size and the morphology of the synthesized samples were studied using a HITACHI SU6600 SEM and Philips CM30 TEM and energy dispersive X-ray analysis (EDAX).

TEM images were taken by a FEI TECNAI G2 F20-TWIN TEM. Raman spectra were recorded on inVia Raman microscope. XPS and UPS measurements were conducted using an ESCALAB 250Xi (Thermo) system. X-ray diffraction (XRD) patterns of the MoS₂ was carried out on a Bruker D8 Focus X-ray diffractometer operating at 30 kV and 20 mA with a copper target (λ= 1.54 Å) and at a scanning rate of 1°/min.