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Supernova ccd diffractometerabsorption

Manufactured by Agilent Technologies

The SuperNova CCD diffractometer is a versatile instrument designed for single-crystal X-ray diffraction analysis. It features a high-performance CCD (Charge-Coupled Device) detector that captures diffraction patterns with high resolution and sensitivity. The core function of the SuperNova CCD diffractometer is to collect and analyze X-ray diffraction data from single-crystal samples, providing information about their crystal structure and atomic arrangements.

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Lab products found in correlation

4 protocols using supernova ccd diffractometerabsorption

1

Single Crystal Structure Determination

Check if the same lab product or an alternative is used in the 5 most similar protocols

Agilent SuperNova CCD diffractometer

Absorption correction: multi-scan (CrysAlis PRO; Agilent, 2011 ▸ ) Tmin = 0.884, Tmax = 1.000

26101 measured reflections

7291 independent reflections

7014 reflections with I > 2σ(I)

Rint = 0.087

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2

Single Crystal X-ray Diffraction Analysis

Check if the same lab product or an alternative is used in the 5 most similar protocols

Agilent SuperNova CCD diffractometer

Absorption correction: multi-scan (CrysAlis PRO; Agilent, 2011 ▸ ) Tmin = 0.882, Tmax = 1.000

6258 measured reflections

3358 independent reflections

3336 reflections with I > 2σ(I)

Rint = 0.011

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3

Single Crystal X-ray Diffraction Analysis

Check if the same lab product or an alternative is used in the 5 most similar protocols

Agilent SuperNova CCD diffractometer

Absorption correction: multi-scan (CrysAlis PRO; Agilent, 2011 ▸ ) Tmin = 0.809, Tmax = 1.000

9275 measured reflections

4252 independent reflections

3740 reflections with I > 2σ(I)

Rint = 0.026

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4

Single Crystal X-ray Diffraction Analysis

Check if the same lab product or an alternative is used in the 5 most similar protocols

Agilent SuperNova CCD diffractometer

Absorption correction: multi-scan (CrysAlis PRO; Agilent, 2011 ▸ ) Tmin = 0.759, Tmax = 1.000

6845 measured reflections

3869 independent reflections

3548 reflections with I > 2σ(I)

Rint = 0.040

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