D max2500v pc x ray diffractometer

All chemical reagents are commercially available without further purification. The IR spectra were taken using the Bruker AXS TENSOR-27 FT-IP spectrometer (Bruker, Karlsruhe, Germany) with pressed KBr pellets in the range of 400–4000 cm⁻¹ at room temperature. Elemental analyses of C, H and N were conducted on a PE 240C automatic analyzer (Perkin-Elmer, Waltham, USA) at the analysis center of Liaoning Normal University. The XRD experiments were carried out with a Rigaku D/max2500v/pc X-ray diffractometer (Cu K α radiation, λ = 1.5406 Å). The range of 2θ values was from 0° to 60°, and the scanning rate was 5° /min. The operating voltage and current were maintained at 40 kV and 150 mA, respectively. The simulated XRD powder patterns based on single crystal data were prepared using the Mercury software [16 ]. Thermogravimetric analysis (TG) was performed on a PerkinElmer Diamond TG/DTA under atmosphere from room temperature to 800°C with a heating rate of 10°C/min.

The crystal structures of the products were analyzed using a Rigaku D/max 2500V/PC X-ray diffractometer (XRD, Rigaku Corporation, Tokyo, Japan) using Cu Kα as rediation. The morphologies and nanostructures of the samples were researched using SU8010 field-emission scanning electron microscopy (FESEM, Hitachi, Ltd., Tokyo, Japan) and JEM-2100F transmission electron microscopy (TEM, JEOL Ltd., Tokyo, Japan). The Brunauer–Emmett–Teller (BET) special surface area of the sample was researched using the N₂ adsorption–desorption isotherms on a Micromeritics Autosorb-iQ apparatus (Quantachrome Inc., Florida, FL, USA). The X-ray photoelectron spectra (XPS, Thermo Fisher Scientific Inc., Massachusetts, MA, USA) were researched using a Thermo ESCALAB 250XI electron spectrometer.

The electrochemical characteristics of ITO, PCL@PPy/ITO, Cu/PCL@PPy/ITO, and CuO/PCL@PPy electrodes were examined by using cyclic voltammetry (CV), amperometric response (i-t), and electrochemical impedance spectra (EIS). Electrochemical experiments were performed with a CHI660C electrochemical workstation (Chen Hua Instruments Co., Shanghai, China). A platinum electrode and a saturated calomel electrode (SCE) were used as auxiliary and reference electrodes, respectively. The morphologies of the modified electrode surface were analyzed by field-emission scanning electron microscopy (FE-SEM, using a JSM-6700F system from JEOL, Tokyo, Japan) and transmission electron microscopy (TEM, JEOL JEM-2000 FX, Tokyo, Japan). The X-ray diffraction (XRD) patterns of CuO/PCL@PPy and PCL@PPy were recorded on a D/Max 2500V/PC X-ray diffractometer (Cu, 40 kV, 200 mA, Rigaku, Tokyo, Japan), at a scan rate of 0.05° s⁻¹ with 2 ranging from 10° to 80°.