Samples were prepared for AFM at various time points. pH of assembly solution was recorded and then 15 μL of solution deposited on freshly cleaved muscovite mica (Electron Microscopy Science, Hatfield, PA) or glass coverslip (Fisher Scientific). The substrate was incubated with the sample in a wet cell at 37 °C for 30 min. Remaining moisture was wicked away using a Kimwipe (Kimtech Science) and rinsed with 30 μL of distilled water, followed by wicking and air drying. AFM was performed on a Bruker Multimode 8 with Nanoscope V controller (Bruker, Santa Barbara, CA) in air using silicon cantilevers (Bruker ScanAsyst Air-HR or Peakforce-HIRS-F-A) in Quantitative Nanomechanical Mapping Mode. Micrographs were flattened and dimensions analyzed using Nanoscope Analysis v1.8 and ImageJ.
Muscovite mica
Manufactured by Electron Microscopy Sciences
Muscovite mica is a natural mineral that is widely used as a versatile laboratory material. It is a silicate mineral with a distinctive layered structure that allows it to be easily cleaved into thin, transparent sheets. Muscovite mica is known for its high dielectric strength, thermal stability, and insulating properties, making it a valuable component in various scientific and industrial applications.
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Lab products found in correlation
Glass coverslip, by Thermo Fisher Scientific (1 mentions)
Scanasyst air hr, by Bruker (1 mentions)
Peakforce hirs f a, by Bruker (1 mentions)
Multimode 8, by Bruker (1 mentions)
Nanoscope 5 controller, by Bruker (1 mentions)
Jem 2010 transmission electron microscope, by JEOL (1 mentions)
Msc 794 ccd camera, by Ametek (1 mentions)
Multimode scanning probe microscope, by Veeco (1 mentions)
2 protocols using muscovite mica
1
Atomic Force Microscopy Imaging of Biomolecules
2
Characterization of AuNP Assemblies
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The assembled structures were deposited on freshly cleaned muscovite mica (Electron Microscopy Sciences) for five minutes, then rinsed with MQ-pure water and dried under nitrogen gas. AFM imaging was performed in air in ScanAsyst mode on a Veeco Multimode Scanning Probe Microscope with silicon Scanasyst-air probes (resonant frequency 50–90 kHz, spring constant 0.4 N m−1, and a tip radius of 2 nm).
For TEM imaging, a JEM 2010 transmission electron microscope (JEOL) operated at 200 kV was used. The images were analyzed using a GATAN MSC 794 CCD Camera and GATAN Digital Microscopy software. Five μL AuNP assemblies were transferred to SPI® Supplies Holey carbon coated grids onto 400 mesh copper, incubated for three minutes, washed with 50 μL of MQ-pure water, and dried under nitrogen gas. Samples were then dried completely for at least 15 hours under ambient conditions in a vacuum desiccator.
For TEM imaging, a JEM 2010 transmission electron microscope (JEOL) operated at 200 kV was used. The images were analyzed using a GATAN MSC 794 CCD Camera and GATAN Digital Microscopy software. Five μL AuNP assemblies were transferred to SPI® Supplies Holey carbon coated grids onto 400 mesh copper, incubated for three minutes, washed with 50 μL of MQ-pure water, and dried under nitrogen gas. Samples were then dried completely for at least 15 hours under ambient conditions in a vacuum desiccator.
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