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Sigma vp field emission scanning electron microscope fe sem

Manufactured by Zeiss
Sourced in Germany

The Sigma VP field emission scanning electron microscope (FE-SEM) is a high-performance imaging tool designed for advanced material analysis. It features a field emission electron source, providing high-resolution imaging capabilities. The Sigma VP FE-SEM is capable of examining a wide range of samples, including both conductive and non-conductive materials, without the need for extensive sample preparation.

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4 protocols using sigma vp field emission scanning electron microscope fe sem

1

Characterization of Catalysts by Advanced Techniques

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An Inel EQUINOX 3000 X-ray diffractometer with Cu Kα radiation at 40 kV and 100 mA was used to obtain XRD (X-ray diffraction) patterns in the 2θ = 7–60° range with a step size of 0.02°. A Zeiss Sigma VP field emission scanning electron microscope (FE-SEM) was used to acquire SEM (Scanning Electron Microscopy) images and EDX (Energy Dispersive X-ray analysis) maps. The N2 adsorption–desorption isotherms, surface areas and pore volumes were obtained at −196 °C using a Micromeritics instrument after evacuation for 7 h. NH3 temperature-programmed desorption (NH3-TPD) and H2 temperature-programmed reduction (H2-TPR) were carried out on a Micromeritics TPR/TPD 2900 chemisorption analyzer. Inductively coupled plasma-optical emission spectroscopy (ICP-OES) analysis was employed to determine the percentage of metals in the composite using a Varian VISTA-PRO analyzer. A Bruker Vertex80 spectrophotometer was used to record the FTIR (Fourier transform infrared) spectra of the synthesized catalysts in the 400–4000 cm−1 range. UV-Visible Diffuse Reflectance Spectra (UV-Vis DRS) analysis of synthesized sample was recorded on Shimadzu UV-2600i spectrophotometer at room temperature and ambient atmosphere. Since its wavelength range can easily be expanded to the near-infrared region of 1400 nm using the optional integrating sphere the wavelength was set in the absorption range of 190 to 1100.
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2

Nanoparticle and Microparticle Morphology Analysis

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The shape and surface morphology of the nCmP and MP were evaluated by SEM using a Zeiss SIGMA VP Field Emission-Scanning Electron Microscope (FE-SEM) (Germany). Particle samples were placed on aluminum SEM stubs (Ted Pella, Inc., Redding, CA) with double-sided adhesive carbon tabs. The samples were coated with a thin film of a gold/palladium alloy using a BIO-RAD sputter coating system at 20 µA for 60 seconds under argon gas. Images were captured at 8 kV at various magnifications. The geometric mean diameter and standard deviation of the MP were measured digitally from SEM images using ImageJ software (Rasband, 1997–2016 ). Representative micrographs (5000× magnification) for each sample were analyzed by measuring the diameter of at least 300 particles.
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3

Characterization of Cur NP/CO-HA Gel Composite

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Lyophilized Cur NP was transferred to a metal substrate with double-sided carbon tape. A thin film of Au was sputtered coated onto the NP for 30 s. The sample was then imaged using SIGMA VP Field Emission-scanning electron microscope (FE-SEM) (ZEISS, Oberkochen, Germany). Hydrogel samples were imaged via cryo-SEM. The blank CO–HA Gel sample was formed and frozen in liquid nitrogen and attached to the specimen holder of a cryo-transfer system. The sample was transferred onto a cryostage in the SEM system and cross-sectioned, and subsequently transferred to a SEM sample stage and examined via FE-SEM. The structure of Cur NP/CO–HA Gel composite was also examined using cryo-transmission electron microscopy (cryo-TEM). Small pieces of Cur NP/CO–HA Gel composite were transferred on a TEM copper grid. The grid was quickly immersed in liquid ethane. The frozen-hydrated specimens were mounted on a cryo-holder and observed using JEM-2100 TEM (JEOL USA, Inc, Peabody, MA, USA). The obtained images were analyzed by image J find edge process and threshold. The % of mesh area and mesh size were analyzed by area fraction and ferret’s diameter function, respectively. Mesh size diameters D90, D50, and D10 were obtained by excel percentile function. Diameter span was calculated using the following equation: Span=D90D10D50
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4

Characterization of Spray-Dried Microcapsules

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Morphology and size distribution of spray-dried MCs were evaluated by scanning electronic microscopy (SEM) with a ZEISS SIGMA VP Field Emission Scanning Electron Microscope (FE-SEM) (ZEISS, Germany), using an acceleration voltage of 5 kV. MCs were fixed in stubs containing a double-faced adhesive metallic tape and coated with gold in a CED 010 vacuum evaporator (Balzers Union, Liechtenstein).
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