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Inca detector

Manufactured by Oxford Instruments
Sourced in United Kingdom

The INCA detector is a high-performance X-ray detector developed by Oxford Instruments. It is designed to provide accurate and reliable analysis of materials using energy-dispersive X-ray spectroscopy (EDS) techniques. The INCA detector features advanced silicon drift detector (SDD) technology, delivering high-resolution X-ray analysis with excellent sensitivity and speed.

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4 protocols using inca detector

1

Characterization of Y2Si2O7 Ceramic Pellets

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After polishing, the phase compositions of the pellets were characterized using X-ray diffraction (XRD) by a Panalytical X'Pert Pro system (Westborough, MA, USA) with a copper target (Kα = 0.15406 nm) and a step size of 0.013° 2θ. The bulk densities of the pellets were measured using the Archimedes technique with an Adam analytical scale with a hanging system (Danbury, NY, USA) where distilled water was used as the immersing medium. Except for the amorphous sample with a theoretical density of 83%, the measured densities of all the pellets were >95% of their reported theoretical densities. Phase stability of the Y2Si2O7 powder was determined by thermogravimetric analysis (TGA) using a TGA-Q50 system (TA instruments, New Castle, DE). Approximately 30 mg of the powders were weighed and placed in an alumina crucible then heated in an argon atmosphere at a rate of 10 °C min−1 from room temperature to 1200 °C. Microstructural analyses of the sintered pellets were carried out before and after the leaching experiment via scanning electron microscopy (SEM) using the FEI Versa (USA) and energy-dispersive spectroscopy (EDS), conducted with an Oxford Instruments INCA detector (Abingdon, UK). Raman spectra of the pellet surfaces before and after the leaching experiment were collected using a Raman spectrometer with a 514 nm laser, a 10 s exposure time, and an operating power of 20 mW.
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2

Silver Nanoparticle Interactions with Polystyrene

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To analyze the potential interactions between silver and PSNPs, after AgNPs/PSNPs, or AgNO3/PSNPs treatments the samples were visualized by TEM. For this purpose, AgNPs or AgNO3 were incubated with PSNPs in a distilled water dilution at a final concentration of 5 µg/mL AgNPs or AgNO3, and 10 or 100 µg/mL PSNPs for 3 h at room temperature. Then, carbon-coated TEM grids were dipped into the samples and visualized on a JEOL JEM-1400 instrument (JEOL LTD, Tokyo, Japan). To demonstrate that silver materials were on the polystyrene surface, both AgNPs/PSNPs and AgNO3/PSNPs samples were analyzed by transmission electron microscopy coupled with energy-dispersive X-ray spectroscopy (TEM-EDX) with a TEM JEOL-2011 (200 kV) instrument (JEOL LTD, Tokyo, Japan) combined with an INCA detector (Oxford Instruments, United Kingdom).
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3

Characterization of CsPbI3 Perovskite Materials

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The phase composition of the CsPbI3 pellet and synthesized powders were confirmed via X-ray diffraction (XRD) using a Panalytical X'Pert Pro system (Westborough, MA, USA) with a copper target (Kα = 0.15406 nm) and a step size of 0.013°. The physical density of the pellet was measured via the Archimedes technique using an Adam analytical scale (Danbury, NY, USA). The microstructures of the pellet samples were examined before and after the leaching experiments via digital photography, and scanning electron microscopy (SEM) using a FEI Versa (USA) with an energy-dispersive spectroscopy (EDS) system, conducted with an additional Oxford Instruments INCA detector (Abingdon, UK). Thermogravimetric analysis (TGA) was used to analyze the thermal stability of CsPbI3 using a TGA-Q50 system (TA instruments, New Castle, DE). ∼20 mg of CsPbI3 powders were weighed and placed in an alumina crucible, after which the sample was heated at a rate of 20 °C min−1 in a steady flow of argon gas at 50 mL min−1 until the temperature reached 1100 °C and then cooled at the same rate to 50 °C. A measurement of the Raman shift at the pellet surface was performed before and after the leaching experiment, using a Raman spectrometer with a 514 nm laser, an exposure time of 10 s, and an operating power of 20 mW.
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4

Arsenic Interaction with Polysaccharide Nanoparticles

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The interaction between AsIII and PSNPLs was assessed by TEM. With this aim, the highest doses of both treatments were used. Concisely, a dilution in distilled water with a final concentration of 20 µM AsIII and 100 µg/mL PSNPLs was incubated for 3 h at room temperature. TEM grids were dipped into the sample and analyzed by transmission electron microscopy coupled with energy-dispersive X-ray spectroscopy (TEM-EDX). A TEM JEOL-2011 (200 kV) instrument (JEOL LTD, Tokyo, Japan) was used to visualize the sample and take images, while an INCA detector (Oxford Instruments, Abingdon, UK) was used to determine the elementary composition of the sample to detect arsenic on PSNPLs surface.
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