Ft ir 470 plus

The morphology of samples was observed by scanning electron microscopy (SEM, Hitachi TM3000, Tokyo, Japan) and high-resolution transmission electron microscopy (HRTEM, FEI Talos F200X, Hillsboro, OR, USA). The operating voltage of SEM is 15 kV and that of HRTEM is 200 kV. The element composition of the composite particle was characterized by the HRTEM equipped with energy dispersive X-ray spectroscopy (EDS, FEI Talos F200X’s own, Hillsboro, OR, USA). The chemical groups of particles, which were mixed with KBr and pressed into platelets, were detected by the Fourier transform infrared spectrum (FT-IR, JASCO FT/IR-470 Plus, Tokyo, Japan). The absorption spectrum was measured by using Ultraviolet and visible spectrophotometer (UV-vis, Hitachi U-4100, Tokyo, Japan).

The morphology of samples was observed by scanning electron microscope (SEM, Hitachi TM-3000). The functional groups of samples were analyzed by a Fourier transform infrared spectrometer (FT-IR, JASCO FT/IR-470Plus). The surface chemistry of samples was detected by an X-ray photoelectron spectrometer (XPS, K-Alpha). The thermal properties of samples were analyzed by a thermogravity analyzer (TGA, Netzsch STA449F3). The ER effect of ERFs was measured by a stress-controlled rheometer (Thermal Haake RS600) under DC power supply (WYZ-010 HVDC). The dielectric spectra of ERFs were measured by an LCR analyzer (HP 4284A).