5500 atomic force microscope
The 5500 atomic force microscope is a versatile instrument designed for high-resolution imaging and analysis of surface topography. It utilizes a sharp probe to scan and measure the surface of a sample, providing detailed information about its physical characteristics at the nanoscale level.
Lab products found in correlation
14 protocols using 5500 atomic force microscope
Atomic Force Microscopy of Chondrocyte-Derived Extracellular Vesicles
Comprehensive Characterization of Gold Nanoplates
Characterization of MoS2 Nanostructures
Characterization of Polysaccharide Nanoparticles
Nanoscale Biomechanical Characterization of Cells
Atomic Force Microscopy Surface Roughness Measurement
microscopy (AFM) measurements were performed with a 5500 Atomic Force
Microscope (Agilent Technologies) using an arrowshaped cantilever
(PointProbe Plus ZEISS Veritekt Microscopes - Contact Mode Low Force
Constant - Reflex Coating (PPP-ZEILR), Nanosensors, tip diameter <
10 nm). All images were recorded in the intermittent contact mode
with constant force. The experiments were performed in a glovebox
with argon flow to minimize contact to air. An area of 5 μm
× 5 μm was chosen for all measurements. For data processing,
the software MountainsSPIP (Digital Surf/Image Metrology) was utilized.
The calculation of the arithmetic mean deviation of the surface roughness
(called average surface roughness, Sa,
for simplicity) was done according to EUR 15178N. The maximal surface
roughness (Sm) is the difference between
the highest and the lowest point on the sample surface within the
region of interest.
Nanomaterial Surface Characterization
Characterizing Film Topography and Structure
Fabrication of Nanocrystal Thin Films
colloidal solutions are purified once more with ethanol, centrifugation,
and redissolving in chloroform. Filtered solutions are dropped on
clean substrates and spin coated to form a single monolayer (approx.
15 nm thickness). Films are soaked for 30 s with TBAI solution in
methanol (20 mg/mL) to remove surface ligands and subsequently spin-washed
three times with pure methanol. For thicker films, the deposition
cycle is repeated on top of a previous layer. The thickness is measured
with an Agilent 5500 Atomic force microscope in tapping mode.
Atomic Force Microscopy Characterization
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