Samdri 795 critical point dryer
The Samdri-795 is a critical point dryer designed for sample preparation in electron microscopy. It is used to transition samples from a liquid state to a dry state without the formation of surface tension artifacts.
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16 protocols using samdri 795 critical point dryer
Ultrastructural Characterization of Engineered NK Cells
Scaffold Characterization by Electron Microscopy
Scanning Electron Microscopy Preparation
SEM Imaging of Electrostimulated BV-2 Cells
Preparation of CHO Cells for SEM Imaging
Nanoparticle Characterization by SEM
Ultrastructural Analysis of Ischemic Intestine
Correlative Light and Electron Microscopy
Zebrafish Caudal Fin Morphology Analysis
Visualizing Vasculature in Decellularized Flaps
Scanning electron microscopy was performed for decellularized flaps at the Schepens Eye Institute core facility, supported by the NIH National Eye Institute Core Grant #P30EY003790. Briefly, the samples were dehydrated in graded ethanol solutions and dried at the critical point using a Samdri 795 critical point dryer (Tousimis, Rockville, MD, USA), then mounted on aluminum pedestals and chromed using a Gatan high-resolution ion beam coater (Gatan Inc., Pleasanton, CA, USA). Different surfaces of the samples were imaged using a JEOL JSM-7401F field emission scanning electron microscope (JEOL Inc., Peabody, MA, USA), allowing a qualitative assessment of the scaffold architecture.
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