Nicolet 6700 fourier transform infrared spectrometer

The electrochemical corrosion rate of aluminum in deionized water was slow. To more quickly obtain the corrosion surface and corrosion products of aluminum, the samples for scanning electron microscopy (SEM), energy dispersive spectroscopy (EDS), Fourier transform infrared (FTIR) and powder X-ray diffraction (XRD) were subjected to accelerated corrosion by potentiostatic anodic oxidation at 0.5 V (vs. Pt) for 0.5 h [17 (link),18 (link)]. Large area platinum electrodes were used as the cathodes, 1 cm × 1 cm aluminum foils after polishing and washing were used as the anode, and the flowing deionized water with 3 m s^-1 was used as the electrolyte at 10, 20, 30, 40, and 50 °C.
The corrosion product compositions were determined using a D8-Focus X-ray powder diffraction instrument with a Cu target (Bruker, Karlsruhe, Germany). The scanning angle range was from 5 to 80 degrees, and the scan rate was 8° min⁻¹. The chemical bonds of the corrosion products were characterized using a Nicolet 6700 Fourier transform infrared spectrometer (Thermo Fisher, Waltham, USA). SEM images were obtained using an SU8010 ultrahigh-resolution field emission scanning electron microscope capable of high-performance X-ray energy dispersive spectroscopy (Hitachi, Tokyo, Japan).

Asphaltenes were separated according to ASTM D6560-2000 [40 ]. The elemental composition of the asphaltene, including carbon, hydrogen, sulfur, and nitrogen, was determined using a Vario Micro Cube Elemental Analyzer (Elementar Company, Langenselbold, Germany). The oxygen content was obtained using the subtractive difference method. X-ray photoelectron spectroscopy of the asphaltene was performed using an ESCALAB 250Xi spectrometer (Thermo Fischer Scientific, Waltham, MA, USA). The mean molecular weight and distribution of the asphaltenes were determined using tetrahydrofuran (THF) as the mobile phase on a Waters 1515 gel permeation chromatograph (WATERS, Milford, MA, USA). The ¹H NMR and ¹³C NMR spectra of the asphaltenes were obtained using an Ascend 400MHz nuclear magnetic resonance (NMR) spectrometer (BRUKER, Berlin, Germany). Deuterated chloroform (CDCl3) was used as the solvent, and tetramethylsilane (TMS) served as the internal standard. Fourier-transform infrared spectroscopy (FT-IR) analysis of the asphaltene was performed using a Nicolet 6700 Fourier transform infrared spectrometer (Thermo Fisher Scientific, Waltham, MA, USA).

FT-IR analysis was performed by using a ThermoScientific Nicolet 6700 Fourier Transform Infrared Spectrometer (Thermo Fisher Scientific Inc., Waltham, MA, USA).

In order to investigate the changes in chemical groups of polysaccharides after gamma irradiation, FTIR spectra of APP were analyzed using a Nicolet 6700 Fourier-transform infrared Spectrometer (Thermo, Waltham, MA, USA). Here, 2 mg samples of native and irradiated polysaccharides were mixed with potassium bromide (KBr) and compacted into pellets for spectrometric measurement. The infrared spectra were collected at wavelengths ranging from 4000 cm⁻¹ to 650 cm⁻¹.

Focused ion beam and scanning electron microscopy (FIB/SEM) experiments were carried out on a FEI Q3D dual beam FIB/SEM system, with 30 kV/3 nA initial voltage/current followed by 8 kV/25 pA final polishing voltage/current for ion beam mode, and 5 kV/24 pA for scanning electron microscopy mode. Transmission electron microscopy images were acquired using a JEOL2010F HRTEM, and Ti-mapping was acquired using the same TEM with a Gatan EELS system. GISAXS was performed using a Bruker Nanostar on samples prepared on Anodisc substrates fabricated as indicated above or on Si substrates prepared as described for Fourier-transform infrared analysis (vide infra). Quartz crystal microbalance analyses were performed using a QCM200-5MHz QCM manufactured by Stanford Research Systems. A home-built, air-tight environmental chamber equipped with gas flow controllers to perform the H₂O isotherms. Fourier-transform infrared spectroscopy was performed using a Thermo Scientific Nicolet 6700 Fourier-transform infrared spectrometer. A P123-templated silica film was deposited onto intrinsic, IR transparent single crystal Si substrates (400-µm-thick, double-polished) by spin-coating; this film was then processed in an identical manner as the Anodisc supported P123-templated film described above and loaded with CA.