The DOPE-modified PEI nanocarriers were characterized by AFM as a supplementary tool for the polymer structure visualization. Briefly, AFM images were obtained on an Agilent 5500 AFM/SPM microscope (Agilent Technologies, Santa Clara, CA) under acoustic AC mode using Si probes operating at a resonant frequency of 154 kHz. All measurements were carried out at room temperature and acquired images had a resolution of 512 × 512 pixels collected at a speed of 1 line/minute. Freshly cleaved mica surface was used as the substrate for imaging. To acquire images, about 10-50 μl of the prepared sample was pipetted on to the mica surface and allowed to interact with the surface for 1-5 min. Following this, excess solution was dried under a gentle stream of air. Post image processing of AFM images was done using Pico Image software provided with the instrument.
Agilent 5500 afm spm microscope
Manufactured by Agilent Technologies
The Agilent 5500 AFM/SPM microscope is a high-performance scanning probe microscope that provides nanoscale surface imaging and analysis. It utilizes atomic force microscopy (AFM) and scanning probe microscopy (SPM) techniques to capture detailed topographical and material property data of sample surfaces.
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3 protocols using agilent 5500 afm spm microscope
1
Characterization of DOPE-modified PEI Nanocarriers
2
Structural and Thermal Analysis of Biomaterials
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The BC/CSM and IP-BC/CS-NFM were tested by Fourier transform infrared spectroscopy (FT-IR). The spectra with a wave number ranging from 4000 to 400 cm−1 were recorded on a Fourier Transform Infrared spectrometer (Thermo Nicolet 380) by the KBr-disk method.
The surface and cross-sectional morphology of BC/CSM and IP-BC/CS-NFM were investigated with an FEI Nova NanoSEM450 field emission scanning electron microscope (FE-SEM). Atomic force microscopy(AFM) imaging of membranes with noncontact mode was performed with an Agilent 5500 AFM/SPM microscope (Agilent Technologies). The samples were freeze-fractured in liquid nitrogen, followed by sputtering with gold in a sputtering device.
The material mass loss relationship with change of temperature was determined with a thermal gravimetric analysis (TGA) instrument (Netzsch STA 449 F3) at the heating rate of 10 °C min−1 under nitrogen with a flow rate of 20 mL min−1. Each sample weighed about 2 to 3 mg as a standard and was heated from 30 to 600 °C.
The surface and cross-sectional morphology of BC/CSM and IP-BC/CS-NFM were investigated with an FEI Nova NanoSEM450 field emission scanning electron microscope (FE-SEM). Atomic force microscopy(AFM) imaging of membranes with noncontact mode was performed with an Agilent 5500 AFM/SPM microscope (Agilent Technologies). The samples were freeze-fractured in liquid nitrogen, followed by sputtering with gold in a sputtering device.
The material mass loss relationship with change of temperature was determined with a thermal gravimetric analysis (TGA) instrument (Netzsch STA 449 F3) at the heating rate of 10 °C min−1 under nitrogen with a flow rate of 20 mL min−1. Each sample weighed about 2 to 3 mg as a standard and was heated from 30 to 600 °C.
3
Characterization of DOPE-modified PEI Nanocarriers
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The DOPE-modified PEI nanocarriers were characterized by AFM as a supplementary tool for the polymer structure visualization. Briefly, AFM images were obtained on an Agilent 5500 AFM/SPM microscope (Agilent Technologies, Santa Clara, CA) under acoustic AC mode using Si probes operating at a resonant frequency of 154 kHz. All measurements were carried out at room temperature and acquired images had a resolution of 512 × 512 pixels collected at a speed of 1 line/minute. Freshly cleaved mica surface was used as the substrate for imaging. To acquire images, about 10-50 μl of the prepared sample was pipetted on to the mica surface and allowed to interact with the surface for 1-5 min. Following this, excess solution was dried under a gentle stream of air. Post image processing of AFM images was done using Pico Image software provided with the instrument.
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