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Vertex80 spectrophotometer

Manufactured by Bruker

The Vertex80 spectrophotometer is a high-performance instrument designed for a wide range of analytical applications. It features advanced optical components and a robust design to ensure reliable and accurate measurements. The Vertex80 is capable of performing various spectroscopic techniques, including absorption, transmission, and reflectance, across a wide wavelength range.

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3 protocols using vertex80 spectrophotometer

1

Characterization of Catalysts by Advanced Techniques

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An Inel EQUINOX 3000 X-ray diffractometer with Cu Kα radiation at 40 kV and 100 mA was used to obtain XRD (X-ray diffraction) patterns in the 2θ = 7–60° range with a step size of 0.02°. A Zeiss Sigma VP field emission scanning electron microscope (FE-SEM) was used to acquire SEM (Scanning Electron Microscopy) images and EDX (Energy Dispersive X-ray analysis) maps. The N2 adsorption–desorption isotherms, surface areas and pore volumes were obtained at −196 °C using a Micromeritics instrument after evacuation for 7 h. NH3 temperature-programmed desorption (NH3-TPD) and H2 temperature-programmed reduction (H2-TPR) were carried out on a Micromeritics TPR/TPD 2900 chemisorption analyzer. Inductively coupled plasma-optical emission spectroscopy (ICP-OES) analysis was employed to determine the percentage of metals in the composite using a Varian VISTA-PRO analyzer. A Bruker Vertex80 spectrophotometer was used to record the FTIR (Fourier transform infrared) spectra of the synthesized catalysts in the 400–4000 cm−1 range. UV-Visible Diffuse Reflectance Spectra (UV-Vis DRS) analysis of synthesized sample was recorded on Shimadzu UV-2600i spectrophotometer at room temperature and ambient atmosphere. Since its wavelength range can easily be expanded to the near-infrared region of 1400 nm using the optional integrating sphere the wavelength was set in the absorption range of 190 to 1100.
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2

Structural and Optical Analysis of Samples

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The structural analysis of the samples was studied using the Rigaku Mini Flex 600 X-ray diffractometer (λ = 1.5406 Å) using Ni-filtered Cu Kα radiation. Fourier Transform Infrared (FT-IR) spectra were recorded on a Bruker-vertex80 spectrophotometer in KBr pellets. The optical properties of the samples were investigated using a PerkinElmer Lambda 2S UV–Vis Spectrophotometer in the wavelength range of 190–1100 nm. The morphology of the samples was studied by JEM 1400 (JEOL, Japan).
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3

Characterization of Synthesized Nanoparticles

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The synthesized nanoparticles were analysed using Fourier transform infrared (FTIR) spectroscopy using a Bruker Vertex80 spectrophotometer in the wavenumber range 400 and 4000 cm−1. Samples were prepared in the form of pellets using KBr, maintaining the KBr : sample mass ratio at 1 : 10. Scanning electron microscopy (SEM) images and surface elemental analysis of AMNPs and AuPd@AMNPs was conducted using a Hitachi SU6600 FE-SEM. X-ray diffraction analysis of the synthesized AMNPs and AuPd@AMNPs was performed using a Bruker D8 Focus X-ray powder diffractometer using Cu Kα radiation (=0.154 nm) over the 2θ range of 5°–80°, with a step size of 0.02° and a step time of 1 s. Elemental analysis of AMNPs and AuPd@AMNPs was done using inductively coupled plasma mass spectrometry (ICPMS) using the Agilent 7000 ICPMS System. Samples: 25.0 mg were digested in H2O2 followed by dissolution in a mixture of HCl and HNO3, the final volume was made up to 10.0 ml. The products of catalytic reactions were characterized by GC–MS using Agilent 5977A Series GC/MSD System having a 30 m × 250 µm × 0.25 µm HP-5 ms column. The temperature programme was 40–250°C at 30°C min−1 with a final temperature isothermal hold for 12 min. The MS mass limit was set between 50 and 450 Da.
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