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D max 2500

Manufactured by Malvern Panalytical

The D/Max‐2500 is an X-ray diffractometer produced by Malvern Panalytical. It is designed for the analysis of solid and powder samples. The instrument uses X-ray diffraction technology to provide information about the crystal structure and composition of materials.

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2 protocols using d max 2500

1

Characterization of TiO2-NH3+ Nanocrystals

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Transmission electron microscopy (TEM; HitachiH7650, Hitachi) was used to record high resolution images at 200 keV. X‐ray diffraction (XRD) patterns were obtained with either a Rigaku D/Max‐2500 or an X′Pert PRO by PANalytical BV diffractometer using Cu Kα radiation (λ=1.5418 Å) at a scanning rate of 4.00° min−1. Zeta potential measurements were carried out using a Malvern Instruments nanocomposite size analyzer (NanoZS, Worcestershire, UK). Fourier‐transform infrared (FT‐IR) spectra were obtained using a Thermo Scientific Nicolet iS50 FTIR spectrometer in ATR mode. UV‐vis spectroscopy was carried out using a Varian Cary 50 UV‐Vis spectrophotometer. Thermal gravimetry (TG) analysis (TG8120, Rigaku) was performed to estimate the quantity of the modifiers or molecules that attached on the surfaces of the TiO2‐NH3+ nanocrystals. 2.03 mg of the TiO2‐NH3+ nanocrystals were loaded for TG analysis. Temperature was maintained at 150 °C for 2 h for dehydration and then raised to 800 °C at the rate of 20 °C min−1.
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2

Crystallographic Analysis of Nanoparticles

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Crystallographic
analysis of NPs was carried out using a Panalytical D/Max-2500 powder
diffractometer with monochromatic Cu Kα radiation (λ =
1.5406 Å) over 2θ range of 5°–90° at the
scan rate of 2° min–1. The operational voltage
and current were 40 kV and 30 mA, respectively. The size of NPs was
calculated using the Debye Scherrer equation.
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