1601pc uv vis spectrophotometer

Morphology of all the products was characterized by scanning electron microscope (SEM, Hitachi S4800) and transmission electron microscope (TEM, JEOL JEM-2200FS). Fourier transform infrared (FTIR) spectra were recorded on a Bruker Equinox 55 spectrometer in the range of 400–4000⁻¹ cm at room temperature. UV-vis spectra were measured on a Shimadzu 1601PC UV-vis spectrophotometer. X-ray diffraction (XRD) experiment was carried out on a Micscience M-18XHF (with CuKa radiation) instrument. X-ray photoelectron spectroscopy (XPS) analysis was carried out on an ESCALab220i-XL electron spectrometer from VG Scientific. Al-Kα radiation was used as the X-ray source and operated at 300W. Pore structure of the samples was characterized by physical adsorption of N₂ at 77 K (TriStar II 3020). The surface specific area was obtained by the Brunauer Emmett Teller method. Raman spectra were studied from a LabRAM HR800 with a 532 nm wavelength laser.

FESEM images were obtained
by a Hitachi S-4160 at an accelerating voltage of 20 kV. SEM analysis
was performed with a TESKAN-Vega 3. XRD patterns were obtained by
using a D8 ADVANCE type (BRUKER-Germany) with Cu-Kα radiation
(λ = 0.1542 nm). The XRD patterns were taken with an angular
step of 0.02°, with a sampling time of 1 s per step in the range
of 2Θ [5–50°]. The absorbance measurements were
performed using a Shimadzu 1601 PC UV–vis spectrophotometer.
FTIR spectra were obtained by tensor II (BRUKER-Germany). TGA was
performed by a TGA/DSC 1–Thermogravimetric Analyzer that was
made by Mettler-Toledo International Inc. under a nitrogen atmosphere
from room temperature to 800 °C with a heating rate of 5 °C
min^–1. BET analysis was performed using a Micromeritics
(USA), ASAP 2020 instrument. Absorbance of the solution for MTT assay
was recorded by plate reader Polar Star Omega, BMG LABTECH, Germany
instrument.