Fls980

¹H nuclear magnetic resonance (NMR) spectrum was recorded on a Bruker Advancell spectrometer with DMSO as the solvent. All samples were analyzed by FT-IR spectroscopy, which were measured by a Bruker VERTEX70 FT-IR spectrophotometer in the wave number range of 400–4000 cm⁻¹ using potassium bromide (KBr) pellets. The X-ray diffraction (XRD) analysis was recorded using a PANalytical Empyrean diffractometer, which equipped with Cu Kalpha1 radiation (1.5405 Å), the scanning rate was 15°/min in the 2θ range of 5–80° at room temperature. The morphology of the nanocomposites was characterized on Hitachi S-4800 scanning electron microscopy (SEM) at 20 kV and FEI Tecnai F20 transmission electron microscopy (TEM) at an acceleration voltage of 200 kV. Thermogravimetric analysis (TGA) was tested on a STA6000 thermogravimetric analyzer in air at a heating rate of 20 °C/min from room temperature to 950 °C. Luminescence spectra were tested at room temperature using a FLS-980 (Edinburgh Instruments, England) with a xenon lamp as the light source. Phosphorescence spectra were measured at 355 nm and 372 nm excitation on a FLS-980 spectrofluorometer at 77 K. X-ray photoelectron spectroscopy (XPS) spectra were recorded on Thermo ESCALAB 250Xi spectrometer (Thermo Fisher Scientific, Waltham, MA, USA).

Morphologies of the perovskite films were imaged with a scanning electron microscope (SEM, FEI Apreo LoVac). The crystal structure was characterized by Bruker D8 Advance X‐ray diffractometer (XRD) with Cu Kα radiation at 40 kV and 40 mA. PL lifetime was measured by the time‐correlated single photon counting method with an Edinburgh Instruments FLS980 fluorescence spectrometer. The excitation source used was a picosecond pulsed diode laser at 532 nm.
The current density‒voltage (J‒V) curves of PSCs were recorded using a Keithley 2400 source measurement unit and a Newport solar simulator (ORIEL‐SOI3A) with an AM1.5G spectrum. All of flexible photovoltaic devices were measured in the flatten state. The light intensity was adjusted to 100 mW cm⁻² using standard Si cell (91150V). Both forward and reverse scans were measured with the scanning speed of 0.15 V s⁻¹. The EQE spectra were measured in DC mode on a spectrum corresponding system (Enlitech QE‐R), calibrated by Si reference solar cell.
The EL spectrum and ERE of the perovskite LED were recorded simultaneously by a commercialized system (XPQY‐EQE‐350‐1100, Guangzhou Xi Pu Optoelectronics Technology Co., Ltd.) that is equipped with an integrated sphere (GPS‐4P‐SL, Labsphere) and a photodetector array (S7031‐1006, Hamamatsu Photonics).

The morphologies of samples were characterized by scanning electron microscopy (SEM, S4800, Hitachi), and transmission electron microscopy (TEM, JEOLJEM 2100). The crystalline structure and chemical structure of the samples were analyzed by X-ray diffraction (XRD) (Bruker D8 Discover diffractometer, using Cu Kα radiation (1.540598 Å)) and DXR Raman Microscope (ThermoFisher Scientific) with excitation of 532 nm laser. The X-ray photoelectron spectroscopy (XPS) was carried out to reveal hybridization of elements, collected by an Axis Ultra instrument (Kratos Analytical) under ultrahigh vacuum (<10⁻⁸ torr) and using a monochromatic Al Kα X-ray source, with binding energies referenced to the C 1s binding energy of 284.8 eV. The diffuse reflectance UV-vis adsorption spectra were recorded on a spectrophotometer (Shimadzu, UV 3600), with the reference of BaSO₄ powder. Photoluminescence (PL) emission spectra were measured using a photoluminescence spectrometer (FLS980, Edinburgh Instruments Ltd.) from 300 to 750 nm under an excitation wavelength of 260 nm. The electrochemical characterizations of electrochemical impedance spectra (EIS) and capacity were measured by a PGSTAT 302 N Autolab Potentiostat/Galvanostat (Metrohm) equipped with an excitation signal of 10 mV amplitude, and the Mott-Schottky measurement was performed at fixed frequency of 1 kHz.