Fe sem supra 35 vp electron microscope

The morphology of electrospun nanofibers before and after crosslinking was analysed by Field Emission Scanning Electron Microscopy (FESEM), by using a Carl Zeiss FE-SEM SUPRA 35 VP electron microscope. The images were recorded with an acceleration voltage of 1 keV at approximately 4.5 mm working distance. Electrospun samples were fixed on a conductive carbon tape attached to a metal microscope holder and sputtered with a thin layer of palladium using a Benchtop Turbo sputtering device (Denton Vacuum, USA). The average diameter of cross-linked and non cross-linked nanofibers was measured directly from selected SEM images using ImageJ software and is given as an average value for each sample calculated from at least 20 measurements.

The morphology of lyophilized scaffolds was analyzed
by field emission
scanning electron microscopy (FESEM). Prior to imaging, all samples
were pressed onto a double-sided carbon adhesive tape (SPI 116 Supplies).
No sputtering was performed on the sample surfaces (nonconductive).
A Carl Zeiss FE-SEM SUPRA 35 VP electron microscope was used. The
images were recorded with an acceleration voltage of 1 kV at room
temperature, which is sufficient to obtain SEM images with good resolution.
The sample pore sizes (PS) were measured by analyzing the SEM images
with the Image J1.47 software.^{36 (link)}

Microstructure characterization of N-rGO and N-rGONRs and N-pEAO was performed by a scanning field emission electron microscope, Zeiss ULTRA plus SEM – Jena, Germany. Samples were adhered to the conductive carbon tape placed on an aluminum SEM holder. SEM images were taken at 2 kV using an SE2 detector at WD 5.5 mm. Further, elemental analysis of the samples was done inside SEM using EDS analysis with an Oxford X-Max SDD detector - High – Wycombe, UK, with working surface area of 50 mm², processed with INCA software - Wycombe. EDS analysis was done at 20 kV.
For visualization of membranes’ microstructure, the field emission (FE)-SEM analysis was performed using a Carl Zeiss FE-SEM SUPRA 35 VP electron microscope. Imaging was performed at 1 kV accelerating voltage at an approximately 4.5 mm working distance. The membranes were attached to aluminum sample holders via conductive carbon adhesive tape. Prior to analysis, a layer of palladium was sputtered on the surface of membrane samples.