Evo 50 ep scanning electron microscope
The EVO-50-EP is a scanning electron microscope (SEM) manufactured by Zeiss. It is designed for high-resolution imaging of samples at the nanoscale level. The EVO-50-EP utilizes an electron beam to scan the surface of a sample, generating detailed images that reveal the topography and composition of the material being analyzed.
7 protocols using evo 50 ep scanning electron microscope
Formaldehyde Fixation for SEM Imaging of Yeast
Scanning Electron Microscopy of Bacteriocin-Treated Cells
SEM Analysis of Amoeba-Gill Cell Interaction
The fixed monolayers were transported to the Animal and Plant Health Agency, Wadebridge, UK for SEM following standard protocols. Briefly, membranes were washed thoroughly in 0.1 M sodium cacodylate buffer and dehydrated in an ascending ethanol series (50–100%), 10 min in each solution. The samples were dehydrated in a BAL-TEC Critical Point-Dryer (CPD 030, Germany), and coated with a thin conductive layer of gold/palladium using a Polaron Sputter Coater (SC7640, UK). The coated samples were mounted on brass stubs, examined and photographed with a Zeiss EVO-50-EP scanning electron microscope in an accelerating voltage of 20 kV in the secondary emission mode.
Scanning Electron Microscopy of Algae
Multimodal Materials Characterization Protocol
(OM) was carried out using a Leica DM LM microscope. Scanning electron
microscopy (SEM) and energy-dispersive spectroscopy (EDS) were performed
using an EVO 50 EP scanning electron microscope (by Zeiss) and an
Inca Energy 200 EDS module (from Oxford Instruments). X-ray diffraction
(XRD) was performed by means of an Xpert MPD setup (by Philips, in
thin film mode and with Cu Kα =
1.5406 Å). Magnetic characterization was carried out using a
MicroMag 3900 (from Princeton Measurement Corp.) vibrating sample
magnetometer (VSM). XRF measurements were performed by means of an
X-RAY XAN apparatus (by Fischerscope). The instrument used to get
atomic force microscopy (AFM) topographical data was a Solver Pro
(by NT-MDT). A CM 10 setup was employed to acquire transmission electron
microscopy (TEM) images.
Fixation and Preparation of Samples for TEM and SEM
Samples for SEM were, after washing with PBS, dehydrated with EtOH, essentially in the same manner as for sample preparations for TEM (69 (link)). The samples were subjected to critical point drying by exchanging the EtOH with CO2. The samples were then coated with a conductive layer of Au-Pd before being analyzed in a Zeiss EVO50 EP Scanning electron microscope. Images were analyzed and prepared using Fiji (71 (link)).
Scanning Electron Microscopy of Bacteriocin-Treated Cells
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