X pert pro mrd diffractometer

Manufactured by Malvern Panalytical

Sourced in United Kingdom

The X'Pert PRO MRD is a high-resolution X-ray diffractometer designed for materials research and development. It is capable of performing a range of X-ray diffraction (XRD) analyses, including phase identification, structural characterization, and thin-film analysis.

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Lab products found in correlation

Merlin, by Zeiss (1 mentions) Auriga, by Zeiss (1 mentions) X pert highscore plus software, by Malvern Panalytical (1 mentions) Ft ir 6000, by Jasco (1 mentions) X pert highscore plus, by Malvern Panalytical (1 mentions) Uv vis spectrometer, by Shimadzu (1 mentions) Av 400 spectrometer, by Bruker (1 mentions) Uv 1601, by Shimadzu (1 mentions) Dsc 822, by Mettler Toledo (1 mentions) X celerator detector, by Malvern Panalytical (1 mentions) Tecnai g2 f20 microscope, by Thermo Fisher Scientific (1 mentions) T64000 raman spectrometer, by Horiba (1 mentions) Su8010 fe sem, by Hitachi (1 mentions) Thermo nicolet 6700 spectrometer, by Thermo Fisher Scientific (1 mentions) Smart itr attenuated total reflectance sampling accessory, by Thermo Fisher Scientific (1 mentions) Invia reflex micro raman spectrometer, by Renishaw (1 mentions) Auriga crossbeam workstation, by Zeiss (1 mentions) Lambda 950 uv vis nir spectrophotometer, by PerkinElmer (1 mentions) Nvision 40, by Zeiss (1 mentions)

22 protocols using x pert pro mrd diffractometer

Characterization of ZnO Thin Films

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The morphology of the pristine alloy, the ZnO thin film and the ZnO nanosheets deposited on top was studied by scanning electron microscopy (SEM) on Zeiss Auriga and Merlin microscopes.
The composition of the samples was determined by energy-dispersive X-ray spectroscopy (EDS/EDX). EDX measurements of the base alloy were carried out at 15 kV, whereas those on the ZnO structures were obtained at lower voltages (2–5 kV) in order to restrict the penetration of the X-rays to the utmost ZnO. Grazing incidence X-ray diffraction (GIXRD) analyses were conducted on a Malvern-PANalytical X’Pert Pro MRD diffractometer using CuKα radiation for phase analysis of the samples in a 2θ range from 30° to 80°.

Careta O., Fornell J., Pellicer E., Ibañez E., Blanquer A., Esteve J., Sort J., Murillo G, & Nogués C. (2021). ZnO Nanosheet-Coated TiZrPdSiNb Alloy as a Piezoelectric Hybrid Material for Self-Stimulating Orthopedic Implants. Biomedicines, 9(4), 352.

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Crystalline Profiling of Freeze-Dried NLCs

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The crystalline profiles of freeze-dried NLCs were studied by X-ray diffraction (XRD), using a Malvern Panalytical X Pert PRO MRD diffractometer using Cu-Kα radiation (λ = 1.54056 Å) and operating at 45 kV and 40 mA. The patterns were collected at room temperature in a 2θ range from 5.0 • to 50 • being the step size of 0.02 • /s. The fine calibration offset for 2θ = -0.0372 • . Information was collected during s and the PANanalytical X'Pert HighScore Plus software was used to gather data and the analysis of peak diffractions.

Azevedo M.A., Cerqueira M.A., Fuciños P., Silva B.F.B., Teixeira J.A, & Pastrana L. (2021). Rhamnolipids-based nanostructured lipid carriers: Effect of lipid phase on physicochemical properties and stability. Food chemistry, 344.

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Characterizing Calcium Carbonate Polymorphs

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The phase composition of selected samples was determined through X-ray Diffraction (XRD) and FTIR. XRD patterns were acquired with an X’ Pert PRO MRD diffractometer, (Malvern Panalytical Ltd., Malvern, UK) equipped with a fast RTMS detector, using a CuK α radiation (40 kV and 40 mA). Data were recorded in the 20–60° 2θ range, with a virtual step-scan of 0.005° 2θ, and a counting time of 100 s. Phase identification was performed compared to the standard JCPDF diffraction patterns 00-005-0586 for CaCO₃ calcite and 00-033-0268 for CaCO₃ vaterite. The relative crystalline phase composition was estimated by comparing the areas of the 100% peaks (after background subtraction); the considered peaks were located at 29.4° for calcite and 32.5° for vaterite.
FTIR spectra were measured with FT/IR-6000 Jasco (Jasco Europe, Cremella, Italy) in transmission mode; the spectra were acquired on a disc made of approximately 2 mg of powder and 200 mg of KBr.

Persano F., Nobile C., Piccirillo C., Gigli G, & Leporatti S. (2022). Monodisperse and Nanometric-Sized Calcium Carbonate Particles Synthesis Optimization. Nanomaterials, 12(9), 1494.

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Crystalline Characterization of PHBV Films

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Crystalline characterization of PHBV/coating films and PHBV/ nanofiber films was done performing X-ray diffraction (XRD) analysis as described by Figueroa-Lopez et al. (2020) (link) with some modifications. Briefly, Malvern Panalytical X Pert PRO MRD diffractometer was used with Cu-Kα radiation (λ = 1.54056 Å) and conditions of 45 kV and 40 mA. Data were collected at room temperature in a 2θ range from 10.0 • to 60 • . Each sample analysis was carried 144.84 s with a step size of 0.0197 • , and the software used to analyze the data was PANanalytical X'Pert HighScore Plus.

Costa M.J., Pastrana L.M., Teixeira J.A., Sillankorva S.M, & Cerqueira M.A. (2021). Characterization of PHBV films loaded with FO1 bacteriophage using polyvinyl alcohol-based nanofibers and coatings: A comparative study. Innovative Food Science and Emerging Technologies., 69.

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Characterization of Quasi-Single Crystalline GST Films

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Samples were characterized by means of ex-situ X-ray diffraction (XRD), utilizing a PANalytical X’ Pert PRO MRD diffractometer with Ge (220) hybrid monochromator, employing a Cu Kα₁ radiation (λ = 1.540598 Å). XRD revealed that the crystalline GST films are quasi single crystalline13 26 with vacancies ordered into layers6 (link).

Bragaglia V., Holldack K., Boschker J.E., Arciprete F., Zallo E., Flissikowski T, & Calarco R. (2016). Far-Infrared and Raman Spectroscopy Investigation of Phonon Modes in Amorphous and Crystalline Epitaxial GeTe-Sb2Te3 Alloys. Scientific Reports, 6, 28560.

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High-Resolution X-Ray Diffraction Characterization

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High-resolution x-ray diffraction measurements were performed using a PANalytical X'Pert PRO MRD diffractometer: The system is equipped with a hybrid mirror and a two-bounce asymmetric Ge monochromator for a high-intensity Cu K_α1 beam. The beam size in this configuration is 2 mm × 20 mm. Reciprocal space maps were taken around the (004) and (224) Bragg reflections. The average Ge content and strain are obtained from the position of the 0th-order peak in the reciprocal space. The period of the superlattices is calculated from the satellite peaks period. Composition and thickness of QW and barrier layers are extracted by the intensity profile of the satellites along the out-of-plane component of the scattering vector Q_z.

Giorgioni A., Paleari S., Cecchi S., Vitiello E., Grilli E., Isella G., Jantsch W., Fanciulli M, & Pezzoli F. (2016). Strong confinement-induced engineering of the g factor and lifetime of conduction electron spins in Ge quantum wells. Nature Communications, 7, 13886.

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Plasma-Assisted MBE Growth of GaN Nanowires

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Self-induced GaN NWs were grown by plasma-assisted molecular beam epitaxy (MBE) on a Si(111) substrate at approximately 760°C under highly nitrogen-rich conditions. Before the growth started, the substrate was exposed to a nitrogen flux for 30 min at the nitridation temperature of approximately 150°C. The procedure of plasma-assisted MBE growth of GaN NWs on Si(111) is described in [10 (link),11 (link)]. The high-resolution X-ray diffraction measurements were performed by using PANalytical X'Pert Pro MRD diffractometer (PANalytical, Almelo, the Netherlands) equipped with a 1.6 kW X-ray tube (vertical line focus) with CuKα₁ radiation (λ = 1.540598 Å), a symmetric 4 × Ge(220) monochromator and a channel-cut Ge(220) analyzer.

Stanchu H., Kladko V., Kuchuk A.V., Safriuk N., Belyaev A., Wierzbicka A., Sobanska M., Klosek K, & Zytkiewicz Z.R. (2015). High-resolution X-ray diffraction analysis of strain distribution in GaN nanowires on Si(111) substrate. Nanoscale Research Letters, 10, 51.

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X-Ray Diffraction Characterization

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After the growth, the sample was characterized by the PANalytical X’Pert PRO MRD diffractometer with Cu Kα radiation. The generator voltage and current of the setup were set to be 45 kV and 40 mA, respectively. The scanning range was 10°–90° with a step size of 0.03° and a time of 20 s/step.

Wang H., Lu H., Guo Z., Li A., Wu P., Li J., Xie W., Sun Z., Li P., Damas H., Friedel A.M., Migot S., Ghanbaja J., Moreau L., Fagot-Revurat Y., Petit-Watelot S., Hauet T., Robertson J., Mangin S., Zhao W, & Nie T. (2023). Interfacial engineering of ferromagnetism in wafer-scale van der Waals Fe4GeTe2 far above room temperature. Nature Communications, 14, 2483.

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Characterization of Optoelectronic Devices

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TEM images were recorded using a JEOL JEM-2010
scanning Image Observation microscope operating at 200 kV. XRD was
measured using a PANalytical X’Pert Pro MRD diffractometer.
EDS was measured using a JEOL JSM-7800F Prime Schottky field emission
scanning electron microscope operating at 15 kV. Optical absorption
spectra were recorded using a Hitachi 2800A spectrophotometer. EIS
was measured using a Solartron SI 1260 impedance/gain-phase analyzer.
Current–voltage (I–V) curves were recorded using a Keithley 2400 source meter with a
150 W Oriel Xe lamp coupled with an Oriel AM 1.5 simulating filter
under 100 mW/cm² light intensity. A metal mask placed above
the solar cell defined the active area to be 3 mm × 3 mm. The
incident sun intensity was varied from 1 to 0.1 sun by inserting metal
meshes in the light path. EQE spectra were measured using an Acton
monochromator with a 250 W tungsten–halogen lamp (without white
light biasing).

Boon-on P., Singh D.J., Shi J.B, & Lee M.W. (2019). Bandgap Tunable Ternary CdxSb2–yS3−δ Nanocrystals for Solar Cell Applications. ACS Omega, 5(1), 113-121.

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Crystallinity and Nanostructure Analysis of Sedge Fibers

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The crystallinity index (I_c) and the crystallite size (CS) of the sedge fibers were calculated from the diffractogram obtained by X-ray diffraction (XRD). To calculate the fiber I_c, the proposed method by Segal et al. [39 (link)] was used, in which the crystallinity is given by the difference of the peak relative to the (0 0 2) plane and the peak of the amorphous halo in the diffractogram:

I_{c} = \frac{I_{002} - I_{101}}{I_{002}} \times 100

A PANalytical X’pert Pro MRD diffractometer, with a cobalt anode (0.1789 nm), was used with the following parameters to obtain the diffractogram: a scan rate of 0.05 (2θ/s), scanning from 5° to 75°, a current of 40 mA, and a voltage of 40 kV. For the calculation of the CS, the method used was established by Scherer’s relations as expressed by the equation below [40 (link)]:

CS = \frac{K λ}{β \cos θ}

where K is the constant (0.89); λ corresponds to the intensity of radiation; β denotes the full-width at half-maximum (FWHM); and θ is the Bragg’s angle.

Neuba L.D., Junio R.F., Souza A.T., Chaves Y.S., Tavares S., Palmeira A.A., Monteiro S.N, & Pereira A.C. (2023). Alkaline Treatment Investigation for Sedge Fibers (Cyperus malaccensis): A Promising Enhancement. Polymers, 15(9), 2153.

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