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Vertex 70 interferometer

Manufactured by Bruker
Sourced in Germany

The Vertex 70 interferometer is a Fourier Transform Infrared (FTIR) spectrometer designed for high-performance infrared spectroscopic analysis. The core function of the Vertex 70 is to measure the absorption or transmission of infrared light by a sample, providing detailed information about its molecular composition and structure.

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3 protocols using vertex 70 interferometer

1

FTIR Spectroscopy of Antenna Arrays

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The Fourier transform infrared (FTIR) spectroscopy data were collected using a Bruker Vertex 70 interferometer coupled to a Bruker Hyperion 2000 microscope. The FTIR measurement parameters for the data from the Figures is as follows: 1000 scans with 16 cm−1 spectral resolution for Figs. 2, 3, and 5; 2000 scans with 32 cm−1 spectral resolution for Fig. 4. For the measurements from Figs. 3 and 4, ×15 Cassegrain objectives were used, for all the other measurements ×36 objectives. The area around the antenna arrays was excluded from the measurement with knife edge apertures and the polarization was along the long antenna axes in Figs. 2, 3, and 5e, and perpendicular to the grating bars and slits in Figs. 4 and 5b, respectively. For all measurements the free area on the sample next to the antenna arrays was used as a reference, except for those in Fig. 4, for which reflectance at an Au mirror was taken as reference.
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2

ATR-FTIR Characterization of DNA-Functionalized Hydrogel Nanoparticles

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ATR-FTIR measurements were performed using a Vertex70 interferometer (Bruker Optics, Ettlingen, Germany) equipped with a thermal source (Globar), an ATR crystal (Bruker-Germanium Multiple reflection crystal), and a deuterated triglycine sulfate (DTGS) detector. HNs, DNA–HNs, and DNA solutions were prepared according to the protocols reported in Section 2.1 and Section 2.2. A total of 10 µL was then dropped and measured after complete drying under gentle nitrogen flux. Measurements were acquired with an acquisition rate of 5 kHz in the range between 400 and 4000 cm 1 by averaging 256 scans. Spectra were corrected for atmospheric absorption, and a baseline was subtracted by using a Rubberband correction algorithm. Second-derivative analysis was performed, applying a 9-points smoothing filter [32 (link),33 (link)]. Data postprocessing was performed using OPUS PRO 7.5 software (Bruker).
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3

Synchrotron-Based Infrared Spectroscopy

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Infrared spectra of the samples were collected at the infrared beamline SISSI (Synchrotron Infrared Source for Spectroscopic and Imaging), Elettra Sincrotrone Trieste (Trieste, Italy) (36 ).
Attenuated total reflectance (ATR) spectra of the samples were collected using a MIRacle Single Reflection ATR box (PIKE Technologies, Fitchburg, WI) with a germanium (Ge) internal reflective element. Spectra were acquired using the Vertex 70 interferometer (Bruker Optik, Ettlingen, Germany) equipped with an MIR (Mid-InfraRed) DLaTGS detector and a KBr beam splitter. A 2 μL drop of each sample was deposited onto the internal reflective element, and the measurements were performed during drop dehydration at ambient temperature under a gentle nitrogen flux to prevent water vapor spectral interference. For the same purpose, the interferometric compartment and ATR accessory were also purged with nitrogen. For each spectrum, 15 × 128-scan interferograms were collected with a scanner velocity of 7 kHz and 4 cm−1 of resolution. The spectral region explored spanned a range within 5000–500 cm−1. A 256-scan interferogram of the background was collected under identical external conditions.
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